High Sensitive and High Resolution Imaging of Magnetic Exchange Force Microscopy Using Ferromagnetic Resonance

2013 Fiscal Year Final Research Report

• Project/Area Number: 24656035
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Single-year Grants
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Osaka University
• Principal Investigator: SUGAWARA YASUHIRO 大阪大学, 工学(系)研究科(研究院), 教授 (40206404)
• Project Period (FY): 2012-04-01 – 2014-03-31
• Keywords: 磁気交換力顕微鏡 / 磁気交換力 / 強磁性共鳴 / スピン

Research Abstract

In the magnetic exchange force microscopy, separate measurement of the structural information and the magnetic one on the surface has not been realized. In the present study, we have proposed a new magnetic exchange force microscopy using the ferromagnetic resonance, which can measure the structural information and the magnetic one on the surface separately. We have improved the performance of various technical elements used in the magnetic exchange force microscopy.

Research Products

• [Journal Article] The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes (2013)
  • Author(s): Z. Ma, L. Kou, Y. Naitoh, Y. J. Li and Y. Sugawara
  • Journal Title: Nanotechnol Volume: 24 Pages: 225701(1-8)
  • DOI: 10.1088/0957-4484/24/22/225701.
  • Peer Reviewed
• [Journal Article] Complex Design of Dissipation Signals in Non-Contact Atomic Force Microscopy (2012)
  • Author(s): J. Bamidele, Y. J. Li, S. Jarvis, Y. Naitoh, Y. Sugawara, and L. Kantorovich
  • Journal Title: Phys. Chem. Chem. Phys Volume: 14 Pages: 16250-16257
  • DOI: 10.1039/c2cp43121.
  • Peer Reviewed
• [Journal Article] Quantification of atomic-scale elasticity on Ge(001)-c(4×2) surfaces via noncontact atomic force microscopy with a tungsten-coated tip (2012)
  • Author(s): Naitoh, T. Kamijo, Y. J. Li and Y. Sugawara
  • Journal Title: Phys. Rev. Lett Volume: 109 Pages: 215501(1-5)
  • DOI: 10.1103/PhysRevLett.109.215501.
  • Peer Reviewed
• [Journal Article] Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110 (2012)
  • Author(s): J. Bamidele, Y. Kinoshita, R. Turanský, S. H. Lee, Naitoh, Y. J. Li, Y. Sugawara, I.Štich, and L. Kantorovich
  • Journal Title: Phys. Rev. B Volume: 109 Pages: 155422(1-8)
  • DOI: 10.1103/PhysRevB.86.155422.
  • Peer Reviewed
• [Journal Article] High potential sensitivity in heterodyne amplitude modulation Kelvin probe force microscopy (2012)
  • Author(s): Y. Sugawara, L. Kou, Z. Ma, T. Kamijo, Y. Naitoh, and Y. J. Li
  • Journal Title: Appl. Phys. Lett Volume: 100 Pages: 223104(1-4)
  • DOI: 10.1063/1.4723697.
  • Peer Reviewed
• [Journal Article] Force Mapping on NaCl(100)/Cu(111 (2012)
  • Author(s): Surface by Atomic Force Microscopy at 78 K
  • Journal Title: J. Li, K. Tenjin, Y. Kinoshita, Z. Ma, L. Kou, Y. Naitoh, M. Kageshima and Y. Sugawara, Jpn. J. Appl. Phys Volume: 51 Pages: 035201(1-5)
  • DOI: 10.1143/JJAP.51.035201.
  • Peer Reviewed
• [Journal Article] ケルビンプローブフォース顕微鏡とその薄膜成長評価への応用 (2012)
  • Author(s): 菅原康弘, 野村光, 内藤賀公, 李艶君, 顕微鏡
  • Journal Title: 顕微鏡 Volume: 41 Pages: 18-21
  • Peer Reviewed
• [Presentation] Magnetic Force Microscopy Using Ferromagnetic Resonance (2013)
  • Author(s): Y. Sugawara
  • Organizer: 7th International Conference on Materials Engineering for Resources
  • Place of Presentation: Akita, Japan
  • Year and Date: 20131120-22
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low Temperature FM-AFM (2013)
  • Author(s): Y. Sugawara, Y. Kinoshita, S. H. Lee, Y. Naitoh and Y. J. Li
  • Organizer: 4^<th> European1 Nanomanipulation Workshop
  • Place of Presentation: Kraków, Poland
  • Year and Date: 20130612-14
• [Presentation] 走査型プローブ顕微鏡(SPM) (2013)
  • Author(s): 菅原康弘
  • Organizer: 第56回表面科学基礎講座表面・界面分析の基礎と応用
  • Place of Presentation: 大阪大学
  • Year and Date: 2013-10-16
• [Presentation] 光誘起物質間力による単原子分解能顕微鏡 (2013)
  • Author(s): 菅原康弘, 徳山貴士, 李艶君
  • Organizer: 日本物理学会第67回年次大会, 領域5シンポジウム輻射力によるミクロ-マクロ転写の学理と応用への展開
  • Place of Presentation: 徳島大学
  • Year and Date: 2013-09-25
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low-Temperature AFM (2012)
  • Author(s): Y. Sugawara and Y. J. Li
  • Organizer: Annual Meeting of The Chinese Vacuum Society (CVS-2012)
  • Place of Presentation: Lanzhou, China
  • Year and Date: 20120921-24
• [Presentation] Investigation of TiO_2 Surface by Using Atomic Force Microscopy/Spectroscopy (2012)
  • Author(s): Y. Sugawara
  • Organizer: The 3rd Annual World Congress of Catalytic Asymmetric Synthesis (WCCAS-2012)
  • Place of Presentation: Beijing, China
  • Year and Date: 20120512-14
• [Presentation] 走査型プローブ顕微鏡(SPM) (2012)
  • Author(s): 菅原康弘
  • Organizer: 第54回表面科学基礎講座表面・界面分析の基礎と応用
  • Place of Presentation: 大阪大学
  • Year and Date: 2012-10-16
• [Remarks]
  • URL: http://nanophysics.ap.eng.osaka-u.ac.jp/