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2013 Fiscal Year Final Research Report

Surface treatment process using photoemission-assisted plasma for achievement of atomic scale flattened surface

Research Project

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Project/Area Number 24656092
Research Category

Grant-in-Aid for Challenging Exploratory Research

Allocation TypeSingle-year Grants
Research Field Production engineering/Processing studies
Research InstitutionTohoku University

Principal Investigator

YUJI Takakuwa  東北大学, 多元物質科学研究所, 教授 (20154768)

Co-Investigator(Renkei-kenkyūsha) OGAWA Shuichi  東北大学, 多元物質科学研究所, 助教 (00579203)
Project Period (FY) 2012-04-01 – 2014-03-31
Keywords光電子制御プラズマ / ラングミュアプローブ / 表面平坦化 / ドライ研磨
Research Abstract

Photoemission-assisted plasma (PAP) ion source has been developed for flattening surface morphology of metal substrates down to an atomic-scale roughness. In this study, ion kinetic energy (Ek) of impinging on surface was estimated by Langmuir probe measurement, resulting in Ek of PAP with 0.1-30 eV. PAP irradiations to Cu-deposited Si substrates with Ra(0) of ~13 nm were conducted in low energy (< 30 eV) and changing ion fluence (< 1018 cm-2) regime. From the surface analysis by atomic force microscopy, surface roughness were reduced down to 15~70% compared of Ra(0). However, protrusions formed on the surfaces due to high ion fluence irradiation, which caused increase of surface roughness. The experiment conditions that control the surface morphology changes are revealed from the aspect from ion energy and ion fluence. Based on the observations, it is considered that surface migration enhancement of surface atoms induced by low Ek of PAP plays a vital role for the morphology changes.

  • Research Products

    (2 results)

All 2013

All Presentation (2 results)

  • [Presentation] Protrusion Formations on Cu and Si Surfaces by Irradiation of Photoemission- Assisted Ar Plasma2013

    • Author(s)
      S. Ajia, Y. Ohtomo, S. Ogawa, and Y. Takakuwa
    • Organizer
      12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
    • Place of Presentation
      つくば市、つくば国際会議場
    • Year and Date
      2013-11-08
  • [Presentation] Langmuir-probe analysis of photoemission-assisted Ar plasma for planarization process2013

    • Author(s)
      S. Ajia, Y. Ohtomo, S. Ogawa and Y. Takakuwa
    • Place of Presentation
      パリ、フランス
    • Year and Date
      2013-09-12

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Published: 2015-06-25  

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