格子画像の位相情報に基づく大型構造物の高精度高速全視野変位・ひずみ計測法の開発

Products Report

• Project/Area Number: 24760095
• Research Category: Grant-in-Aid for Young Scientists (B)
• Allocation Type: Multi-year Fund
• Research Field: Materials/Mechanics of materials
• Research Institution: National Institute of Advanced Industrial Science and Technology
• Principal Investigator: RI Shien 独立行政法人産業技術総合研究所, 計測フロンティア研究部門, 主任研究員 (70509710)
• Project Period (FY): 2012-04-01 – 2014-03-31

Research Products

• [Patent(Industrial Property Rights)] (英語)METHOD AND DEVICE FOR MEASURING DISPLACE MENT DISTRIBUTION USING REGULAR PATTERN, AND PROGRAM FOR SUCH METHOD AND DEVICE (韓国)규칙성모양에의한변이분포에대한측정방법, 장치및프로그램 (和訳)規則性模様による変位分布のための測定方法、装置およびそのプログラム (2016)
  • Inventor(s): 李 志遠, 津田 浩
  • Industrial Property Rights Holder: 産業技術総合研究所
  • Industrial Property Rights Type: 特許
  • Industrial Property Number: 10-2016-7000473
  • Filing Date: 2016-01-08
  • Acquisition Date: 2017-11-03
  • Overseas
• [Patent(Industrial Property Rights)] 規則性模様による変位分布のための測定方法、装置およびそのプログラム (2016)
  • Inventor(s): 李 志遠, 津田 浩
  • Industrial Property Rights Holder: 産業技術総合研究所
  • Industrial Property Rights Type: 特許
  • Industrial Property Number: 特願2015-527141
  • Filing Date: 2016-01-14
  • Acquisition Date: 2017-04-07
• [Patent(Industrial Property Rights)] METHOD AND DEVICE FOR MEASURING DISPLACEMENT DISTRIBUTION OF AN OBJECT USING REPEATED RATTERN, AND PROGRAM FOR THE SAME (2016)
  • Inventor(s): SHIEN RI, HIROSHI TSUDA
  • Industrial Property Rights Holder: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
  • Industrial Property Rights Type: KOREAN
  • Industrial Property Number: PAT10-2016-7000473
  • Filing Date: 2016-01-08
  • Overseas
• [Patent(Industrial Property Rights)] METHOD AND DEVICE FOR MEASURING DISPLACEMENT DISTRIBUTION OF AN OBJECT USING REPEATED RATTERN, AND PROGRAM FOR THE SAME (2016)
  • Inventor(s): SHIEN RI, HIROSHI TSUDA
  • Industrial Property Rights Holder: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
  • Industrial Property Rights Type: US出願
  • Industrial Property Number: 14904890
  • Filing Date: 2016-01-13
  • Overseas
• [Patent(Industrial Property Rights)] 規則性模様による変位分布のための測定方法、装置およびそのプログラム (2013)
  • Inventor(s): 李 志遠, 津田 浩
  • Industrial Property Rights Holder: 独立行政法人産業技術総合研究所
  • Industrial Property Rights Type: 特許
  • Industrial Property Number: 2013-149340
  • Filing Date: 2013-07-18
• [Patent(Industrial Property Rights)] 規則性模様による変位分布のための測定方法、装置およびそのプログラム (2013)
  • Inventor(s): 李 志遠, 津田 浩
  • Industrial Property Rights Holder: 独立行政法人産業技術総合研究所
  • Industrial Property Rights Type: 特許
  • Industrial Property Number: PCT/JP2013/082701
  • Filing Date: 2013-12-05
  • Overseas