Nanoscale analysis of enamel-adhesive interface with using FIB-TEM.

2014 Fiscal Year Final Research Report

• Project/Area Number: 24792016
• Research Category: Grant-in-Aid for Young Scientists (B)
• Allocation Type: Multi-year Fund
• Research Field: Conservative dentistry
• Research Institution: Tokyo Medical and Dental University
• Principal Investigator: TAKAGAKI Tomohiro 東京医科歯科大学, 医歯(薬)学総合研究科, 助教 (60516300)
• Project Period (FY): 2012-04-01 – 2015-03-31
• Keywords: ＦＩＢ－ＴＥＭ

Outline of Final Research Achievements

An FIB (Focused ion beam) micro-sampling technique has been used for specimen preparation for TEM microscopy of semiconductor devices and other electronic materials as it allows direct and site-specific specimen preparation from a bulky sample. This technique is also useful for hard-tissue specimens since they are often deformed by mechanical forces applied during the initial cutout in the preparation. We have applied this technique for preparation of enamel-adhesive interface specimen for TEM observation. The purpose of this study was to analyze enamel-adhesive interface with using FIB-TEM technique. Micro-sampling method with FIB is practical and reliable method of TEM cross-section specimen preparation of biomaterial-hard tissue interfaces.

Free Research Field

保存修復学