Assembly and charge transfer mechanism of nanostructures on insulator surfaces using atomic force microscopy

2015 Fiscal Year Final Research Report

• Project/Area Number: 25246027
• Research Category: Grant-in-Aid for Scientific Research (A)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Osaka University
• Principal Investigator: SUGAWARA YASUHIRO 大阪大学, 工学(系)研究科(研究院), 教授 (40206404)
• Co-Investigator(Kenkyū-buntansha): LI Yanjun 大阪大学, 大学院工学研究科, 准教授 (50379137) ; NAITOH Yoshitaka 大阪大学, 大学院工学研究科, 助教 (90362665)
• Project Period (FY): 2013-04-01 – 2016-03-31
• Keywords: 走査プローブ顕微鏡

Outline of Final Research Achievements

The electronic structure of nanostructures grown on insulator surfaces would be strongly influenced by charge transfers to or from the surface defects, dramatically changing the physical and chemical properties of the nanostructures. Therefore, in order for us to be able to design and realize nanostructures with the desired novel functionality, e.g., a certain catalytic property, it is critical that we have a detailed understanding of the interaction between nanostructures and surface defects.In this research project, we clarified the charge transfer phenomena between defects and nanostructures on insulator surfaces and investigated the relationship between the structure and the charge state of the nanostructures.

Free Research Field

薄膜・表面界面