Research on Built-in Self-Test to Enhance LSI Reliability through its Lifecycle

2015 Fiscal Year Final Research Report

• Project/Area Number: 25280015
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Partial Multi-year Fund
• Section: 一般
• Research Field: Computer system
• Research Institution: Nara Institute of Science and Technology
• Principal Investigator: Inoue Michiko 奈良先端科学技術大学院大学, 情報科学研究科, 教授 (30273840)
• Co-Investigator(Kenkyū-buntansha): YONEDA Tomokazu 奈良先端科学技術大学院大学, 情報科学研究科, 助教 (20359871) ; YAMATO Yuta 奈良先端科学技術大学院大学, 情報科学研究科, 助教 (20707244)
• Project Period (FY): 2013-04-01 – 2016-03-31
• Keywords: LSI信頼性 / 組み込み自己テスト / IRドロップ / 組み込みメモリ

Outline of Final Research Achievements

We have conducted a research on LSI reliability through its lifecycle. Our achievement includes 1) reduction of test data volume and test application time of LSI Built-in Self-Test (BIST) so that LSI BIST can be applicable in field as well as at manufacturing test, 2) analysis of IR-drop and delay defects to improve test quality, and 3) embedded memory architecture to enhance reliability in field with combination of ECC and self-test and repair techniques.

Free Research Field

ディペンダブルコンピューティング