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2015 Fiscal Year Final Research Report

Depth-resolved analysis of electronic state and structure at the ferroelectric/ferromagnetic interface and the control of magnetism

Research Project

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Project/Area Number 25287078
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypePartial Multi-year Fund
Section一般
Research Field Condensed matter physics I
Research InstitutionHigh Energy Accelerator Research Organization

Principal Investigator

AMEMIYA Kenta  大学共同利用機関法人高エネルギー加速器研究機構, 物質構造科学研究所, 教授 (80313196)

Co-Investigator(Kenkyū-buntansha) SAKAMAKI Masako  高エネルギー加速器研究機構, 物質構造科学研究所, 助教 (90598880)
Project Period (FY) 2013-04-01 – 2016-03-31
Keywordsferromagnetic material / ferroelectric material / depth-resolved analysis / interface / magnetic thin film
Outline of Final Research Achievements

Fluorescence-yield depth-resolved X-ray absorption spectroscopy (XAS) technique has been developed, in which a series of XAS data with different probing depths is obtained by collecting the fluorescent X ray at different angles, which is emitted after absorption of soft X ray, in order to observe depth-resolved information on the electronic state and structure at the ferroelectric/ferromagnetic interface.
By adopting the developed technique for the interface between ferroelectric BaTiO3 and ferromagnetic Fe, it has been revealed that Fe oxides exist at the interface, and that new electric-field effect is induced by intentionally inserting Fe oxides at the interface.

Free Research Field

Magnetic thin film

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Published: 2017-05-10  

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