2015 Fiscal Year Final Research Report
Study on test and diagnosis for defects on vias in 3D-LSIs
| Project/Area Number |
25330062
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Computer system
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| Research Institution | Ehime University |
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Principal Investigator |
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| Co-Investigator(Kenkyū-buntansha) |
TAKAHASHI HIROSHI 愛媛大学, 大学院理工学研究科, 教授 (80226878)
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| Project Period (FY) |
2013-04-01 – 2016-03-31
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| Keywords | LSI / 故障診断 / 遅延故障 |
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| Outline of Final Research Achievements |
When physical defects occur at vias in 3D-LSIs, propagation of signals will delay. In this research we develop diagnosis methods for delay faults. Targets are delay faults on gate signal lines and clock lines which have various amounts of delay. Also we consider hazard signals which change values temporarily. The effectiveness of the developed methods has been confirmed in the experiments for benchmark circuits.
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| Free Research Field |
計算機工学
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