Transmission electron microscopy evaluation on easily e-beam damaged MOF materials

2015 Fiscal Year Final Research Report

• Project/Area Number: 25390023
• Research Category: Grant-in-Aid for Scientific Research (C)
• Allocation Type: Multi-year Fund
• Section: 一般
• Research Field: Nanomaterials chemistry
• Research Institution: National Institute of Advanced Industrial Science and Technology
• Principal Investigator: Liu Zheng 国立研究開発法人産業技術総合研究所, 無機機能材料研究部門, 主任研究員 (80333904)
• Project Period (FY): 2013-04-01 – 2016-03-31
• Keywords: ナノマイクロ構造解析 / 金属有機構造体 / 電子顕微鏡

Outline of Final Research Achievements

This study develops a method for structural analyses of metal organic framework (MOF) materials by using transmission/scanning transmission electron microscopy (TEM/STEM). The results will contribute significantly to the development and application of MOF materials.
In order to carry out a structural analyses of MOF materials by using TEM, it is necessary to establish the optimum TEM observation conditions since MOF materials are easily electron beam damaged. In 2013 fiscal year (FY), such optimum TEM conditions for observing MOF with reduced electron beam damage and the required spatial resolution have been revealed. FY 2014, based on the obtained optimum conditions, newly synthesized MOF materials have been determined. FY 2015, the structural analyses for covalent organic framework (COF) materials have been performed and composite structures of MOF materials containing a variety of molecules, such as metal clusters in their pores have been clarified.

Free Research Field

総合理工