A study on X-ray aided non-contact atomic force microscopy (XANAM) in terms of quantum interference

2015 Fiscal Year Final Research Report

• Project/Area Number: 25390079
• Research Category: Grant-in-Aid for Scientific Research (C)
• Allocation Type: Multi-year Fund
• Section: 一般
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Nagoya University
• Principal Investigator: Shushi Suzuki 名古屋大学, 工学(系)研究科(研究院), 准教授 (30322853)
• Project Period (FY): 2013-04-01 – 2016-03-31
• Keywords: 走査プローブ顕微鏡（SPM） / 非接触原子間力顕微鏡（NC-AFM） / 量子ビーム / 放射光X線 / 表面元素分析 / 力場解析

Outline of Final Research Achievements

Development of chemically sensitive atomic force microscopy (AFM) is one of the challenging issue for surface science at the nanoscale. In this study, X-ray Aided Noncontact Atomic force microscopy (XANAM) was developed for nano-scale elemental surface analysis in combination with the Synchrotron radiation X-ray techniques. X-ray can excite inner core shell electrons of an atom on a sample with tuning its energy into specific absorption energy to the atom. A proposed mechanisms of XANAM, utilizing the tip-surface interaction change which induced by X-ray absorption core level electron excitation, was proved experimentally with theoretical analysis. A preliminary data was obtained for the elemental mapping.

Free Research Field

表面物理化学