Development of a charged-droplet beam source for secondary ion mass spectrometry using ionic liquids

2015 Fiscal Year Final Research Report

• Project/Area Number: 25410163
• Research Category: Grant-in-Aid for Scientific Research (C)
• Allocation Type: Multi-year Fund
• Section: 一般
• Research Field: Analytical chemistry
• Research Institution: National Institute of Advanced Industrial Science and Technology
• Principal Investigator: Fujiwara Yukio 国立研究開発法人産業技術総合研究所, 分析計測標準研究部門, 主任研究員 (60415742)
• Project Period (FY): 2013-04-01 – 2016-03-31
• Keywords: 二次イオン / SIMS / イオン源 / イオンビーム / イオン液体 / エレクトロスプレー / クラスター / 帯電液滴

Outline of Final Research Achievements

To develop an ion source capable of producing a charged-droplet beam for secondary ion mass spectrometry (SIMS), vacuum electrospray of ionic liquids was investigated. A time-of-flight (TOF) SIMS system was then developed using a vacuum-electrospay primary beam source that is capable of producing a continuous ion beam of an ionic liquid. A primary ion beam of an imidazolium ionic liquid was irradiated to analyze organic samples using the TOF-SIMS system. Obtained secondary ion mass spectra demonstrated that the vacuum electrospray of the ionic liquid was applicable to a primary ion beam source for SIMS.

Free Research Field

二次イオン質量分析