2015 Fiscal Year Final Research Report
Research on high-resolutiion magnetic force microscopy and magnetization nanostructure analysis of magnetic materials
| Project/Area Number |
25420294
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Electronic materials/Electric materials
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| Research Institution | Chuo University |
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Principal Investigator |
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| Project Period (FY) |
2013-04-01 – 2016-03-31
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| Keywords | 磁気力顕微鏡 / 電気・電子材料 |
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| Outline of Final Research Achievements |
Magnetic tip technology that enables high-resolution magnetic force microscopy has been developed. The technology includes tip structures, (a) for achieving special resolution of 6 nm level, (b) for increasing the magnetic switching field to 6 kOe, and (c) for achieving both the high-resolution (<10 nm) and the high-switching field (>1 kOe). By applying very thin protective layers to magnetic tips, it is demonstrated that chemical stability and mechanical strength can be greatly improved to be more than 5 and 3 times in comparison with those of tips with no protection layers, respectively. The technologies developed in the present study are useful for the investigation of inter-relationships between nanostructure and magnetization structure of various magnetic materials.
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| Free Research Field |
工学
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