Development of near-field magnetic force microscopy for measuring absolute value of magnetic field and its application to high-resolution magnetic imaging of high performance permanent magnets

2014 Fiscal Year Final Research Report

• Project/Area Number: 25600092
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Multi-year Fund
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Akita University
• Principal Investigator: SAITO Hitoshi 秋田大学, 工学(系)研究科(研究院), 教授 (00270843)
• Co-Investigator(Renkei-kenkyūsha): YOSHIMURA Satoru 秋田大学, 工学資源学研究科, 准教授 (40419429) ; KINOSHITA Yukinori 秋田大学, ベンチャービジネスラボラトリー, 特任助教 (10635501)
• Project Period (FY): 2013-04-01 – 2015-03-31
• Keywords: 磁気力顕微鏡 / 磁場計測 / 磁区観察 / 永久磁石

Outline of Final Research Achievements

Magnetic force microscopy (MFM) has been widely used to observe magnetic domain structure with high-spatial resolution for various magnetic materials. However quantitative interpretation of MFM image is still difficult, because MFM technique measures magnetic field derivative, but not magnetic field. In this study, we proposed novel magnetic force microscopy which enables to measure the absolute value of magnetic field, which is useful for quantitative analysis of domain structure, by combining our previously developed near-field magnetic force microscopy with a paramagnetic or a superparamagnetic tips. We have demonstrated the possibility of measuring the absolute value of magnetic field for thick films of FePt permanent magnet by using the present microscopy with developed high-sensitivity superparamagnetic tips.

Free Research Field

磁気工学、磁気計測