The development of non-destructive multi-probe conductivity measurement system for monolayers

2014 Fiscal Year Final Research Report

• Project/Area Number: 25600094
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Multi-year Fund
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: The University of Tokyo
• Principal Investigator: YOSHINOBU Jun 東京大学, 物性研究所, 教授 (50202403)
• Co-Investigator(Renkei-kenkyūsha): YOSHIMOTO Shinya 東京大学, 物性研究所, 助教 (90507831)
• Project Period (FY): 2013-04-01 – 2015-03-31
• Keywords: 薄膜 / 電気伝導 / 局所プローブ / 有機分子 / 非破壊

Outline of Final Research Achievements

We have developed a novel non-destructive liquid-metal coated four-probe surface conductivity measurement system. Electrochemically etched Au wires (0.25 mm diameter) are used as the probes whose surfaces are coated with Hg.The present experimental results show that the thickness of a liquid metal layer on the probe is at least ~3 μm. This non-destructive four-probe surface conductivity measurement system is suitable for the investigation of local conductivity of organic monolayers and organic semiconductor thin films.

Free Research Field

表面科学