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2017 Fiscal Year Annual Research Report

Practical application of uncertainty estimation method in three dimensional measurement for high precision of next generation three dimensional shape

Research Project

Project/Area Number 26249006
Research InstitutionThe University of Tokyo

Principal Investigator

高増 潔  東京大学, 大学院工学系研究科(工学部), 教授 (70154896)

Co-Investigator(Kenkyū-buntansha) 高橋 哲  東京大学, 先端科学技術研究センター, 教授 (30283724)
Project Period (FY) 2014-04-01 – 2019-03-31
Keywords座標計測 / ナノメートル計測 / 光計測 / 三次元形状測定 / 不確かさ推定
Outline of Annual Research Achievements

1.不確かさ推定理論の体系化とシミュレーションソフトウェアの提供の実証実験
昨年度までのシミュレーションソフトウェアの検証作業に基づいて,三次元計測における不確かさ推定理論の体系化を行った.開発したソフトウェアを利用して,ステップゲージを三次元測定機で測定する場合の不確かさが推定を行った.実際の三次元測定機によるステップゲージの測定結果とシミュレーションソフトの結果を比較して,有効性を確認した.さらに,透過型電子顕微鏡(TEM)による半導体の寸法測定に対しても,シミュレーションソフトウェアの適用を行った.サブナノメートルの不確かさに対しても,有効性が確認できた.これらのシステムの不確かさシミュレーション結果は,実際の不確かさとよく一致した.
2.光学的三次元形状測定の応用実験の実施と不確かさ評価の実施
角度測定による三次元測定システムを適用対象として,より高精度な測定と,その不確かさの評価手法の実用化を行った.回転するステージとオートコリメータを組み合わせることで,高精度化とステージの誤差の分離,オートコリメータの自律校正を可能にするシステムが構築し,その不確かさを評価できた.このシステムを三次元計測の実施例として開発し,理論的な不確かさ推定と合わせて,システム全体の不確かさ評価を検証できた.さらに,他の研究機関等が開発している角度測定による非球面形状測定機への適応を行った.不確かさ推定手法の評価により,高精度化が行えた.また,角度測定機の系統誤差を自律校正する手法を開発し,実用的な適用を行った.この手法により,不確かさの小さい形状測定を実施できた.

Current Status of Research Progress
Current Status of Research Progress

2: Research has progressed on the whole more than it was originally planned.

Reason

まず,不確かさ推定理論の体系化とシミュレーションソフトウェアの実証実験に関しては,三次元計測における不確かさ推定理論の体系化に対して,ステップゲージの測定を通して有効性を確認できた.この実証実験では,標準を利用した測定機の校正作業により,測定機の運動学パラメータの不確かさが推定のためのソフトウェアの開発および実証実験を行うことができた.さらに,半導体の寸法測定にも適用し,サブナノメートルオーダの寸法測定においても,構築したシステムの実用性が確認できた.
つぎに,光学的三次元形状測定の応用実験に関しては,角度測定による三次元測定システムを適用対象として,より高精度な測定と,その不確かさの評価手法の実用化が実現できた.さらに,自律校正の手法の開発が行え,その不確かさ評価が実証できた.この結果として,サブナノメートルの不確かさで大型非鏡面を計測できた.

Strategy for Future Research Activity

2つの大きなテーマについて,以下の方針で最終的なシステム構築を推進する.
まず,不確かさ推定理論の体系化とシミュレーションソフトウェアの実証では,実際の測定への適用を引き続き行う.理論体系を実際の三次元計測に適用した結果を解析し,構築した体系に対応するシミュレーションソフトウェアを利用者が自由に使えるシステムを提供する.今年度の実証結果をより広い範囲へ適用するために,不確かさシミュレーションソフトウェアの開発指針を再チェックし,不確かさを推定するだけでなく,不確かさを小さくするための方法をソフトウェア上でテストできるプラットホームの実証実験を行う.システムを適用する対象をさらに増やすと同時に,適用結果の分析を行い,システム性能の評価を行う.
次に,光学的三次元形状測定の応用実験では,開発した角度測定による三次元測定システムに対して,引き続きより高精度な測定と,提案した自律校正手法およびその不確かさの評価手法のシステムをまとめる.また,絶対精度評価を他の機関と協力して実施した結果から,不確かさ評価を整理して,新しい光学的三次元形状測定手法の開発と,精度評価および校正方法の検討を行う.システム全体の不確かさ評価を理論的および実験的に検証する.

  • Research Products

    (28 results)

All 2018 2017 Other

All Journal Article (8 results) (of which Int'l Joint Research: 1 results,  Peer Reviewed: 8 results) Presentation (19 results) (of which Int'l Joint Research: 19 results,  Invited: 2 results) Remarks (1 results)

  • [Journal Article] Surface Imaging Technique by an Optically Trapped Microsphere in Air Condition2018

    • Author(s)
      Michihata Masaki、Kim Jonggang、Takahashi Satoru、Takamasu Kiyoshi、Mizutani Yasuhiro、Takaya Yasuhiro
    • Journal Title

      Nanomanufacturing and Metrology

      Volume: 1 Pages: 32~38

    • DOI

      10.1007/s41871-018-0004-0

    • Peer Reviewed
  • [Journal Article] 温度環境を考慮した三次元測定機の高度化2018

    • Author(s)
      大西 徹、高増 潔
    • Journal Title

      設計工学

      Volume: 53 Pages: 313~322

    • DOI

      10.14953/jjsde.2017.2749

    • Peer Reviewed
  • [Journal Article] Diameter Measurement of a Microsphere Based on Whispering Gallery Mode Resonance2018

    • Author(s)
      MICHIHATA Masaki、CHU Bohuai、ZHAO Zheng、HAYASHI Kohei、TAKAMASU Kiyoshi、TAKAHASHI Satoru
    • Journal Title

      Journal of the Japan Society for Precision Engineering

      Volume: 84 Pages: 77~84

    • DOI

      10.2493/jjspe.84.77

    • Peer Reviewed
  • [Journal Article] Noncontact method of point-to-point absolute distance measurement using tandem low-coherence interferometry2018

    • Author(s)
      Winarno Agustinus、Masuda Shusei、Takahashi Satoru、Matsumoto Hirokazu、Takamasu Kiyoshi
    • Journal Title

      Measurement Science and Technology

      Volume: 29 Pages: 025006~025006

    • DOI

      10.1088/1361-6501/aaa16e

    • Peer Reviewed
  • [Journal Article] Scanning dimensional measurement using laser-trapped microsphere with optical standing-wave scale2017

    • Author(s)
      Michihata Masaki、Ueda Shin-ichi、Takahashi Satoru、Takamasu Kiyoshi、Takaya Yasuhiro
    • Journal Title

      Optical Engineering

      Volume: 56 Pages: 064103~064103

    • DOI

      10.1117/1.OE.56.6.064103

    • Peer Reviewed
  • [Journal Article] Theoretical analyses of in-process depth measurements of fine microgrooves based on near-field optical response2017

    • Author(s)
      Takahashi S.、Jin C.、Ye S.、Michihata M.、Takamasu K.
    • Journal Title

      CIRP Annals

      Volume: 66 Pages: 503~506

    • DOI

      10.1016/j.cirp.2017.04.064

    • Peer Reviewed
  • [Journal Article] High-Precision Aspheric Surface Measurement Using Scanning Deflectometry: Three-Dimensional Error Analysis and Experiments2017

    • Author(s)
      Hu Tingzhi、Xiao Muzheng、Wang Xicheng、Wang Chao、Zhang Zhijing、Takamasu Kiyoshi
    • Journal Title

      International Journal of Automation Technology

      Volume: 11 Pages: 728~735

    • DOI

      10.20965/ijat.2017.p0728

    • Peer Reviewed / Int'l Joint Research
  • [Journal Article] A Simulation Study of Plasmonic Substrate for In-Process Measurement of Refractive Index in Nano-Stereolithography2017

    • Author(s)
      Michihata Masaki、Kong Deqing、Takamasu Kiyoshi、Takahashi Satoru
    • Journal Title

      International Journal of Automation Technology

      Volume: 11 Pages: 772~780

    • DOI

      10.20965/ijat.2017.p0772

    • Peer Reviewed
  • [Presentation] Line Width Roughness of Advanced Semiconductor Features by Using FIB and Planar-TEM as Reference Metrology2018

    • Author(s)
      Kiyoshi Takamasu, Satoru Takahashi, Hiroki Kawada, Masami Ikota
    • Organizer
      SPIE Advanced Lithography, San Jose, USA
    • Int'l Joint Research
  • [Presentation] Highly Sensitive Back-Focal-Plane Interferometry for Tracking Nanoparticle Position2017

    • Author(s)
      Shuzo Masui, Masaki Michihata, Kiyoshi Takamasu, Satoru Takahashi
    • Organizer
      CLEO2017, San Jose, USA
    • Int'l Joint Research
  • [Presentation] Accuracy Improvement in Diameter Measurement of Microsphere Based on Whispering Gallery Mode2017

    • Author(s)
      Masaki Michihata, Bohuai Chu, Zhao Zheng, Kohei Hayashi, Kiyoshi Takamasu, Satoru Takahashi
    • Organizer
      59th Ilmenau Scientific Colloquium, Ilmenau, Germany
    • Int'l Joint Research
  • [Presentation] Evaluation Strategy of Spheroidal Distortion for Micro-Sphere Based on Whispering Gallery Mode Resonance2017

    • Author(s)
      K.Hayashi, B. Chu, Z. Zhao, M. Michihata, K. Takamasu, S. Takahashi
    • Organizer
      59th Ilmenau Scientific Colloquium, Ilmenau, Germany
    • Int'l Joint Research
  • [Presentation] Experimental verification of a novel in-process depth measurements of diffraction limited micro-groove based on near-field optical response2017

    • Author(s)
      Shiwei Ye, Chengshuo Jin, Masaki Michihata, Kiyoshi Takamasu, Satoru Takahashi
    • Organizer
      ISMTII 2017, 13th International Symposium on Measurement Technology and Intelligent Instruments, Xi'an, China
    • Int'l Joint Research
  • [Presentation] Development of nanoparticle detection method based on a new principle combining volatile liquid and optical observation method: Study of highly sensitive optical detection system2017

    • Author(s)
      Kazuki Tachibana, Shohei Asai, Masaki Michihata, Kiyoshi Takamasu, Satoru Takahashi
    • Organizer
      ISMTII 2017, 13th International Symposium on Measurement Technology and Intelligent Instruments, Xi'an, China
    • Int'l Joint Research
  • [Presentation] Coordinate measuring machine verification using an optical comb probe with ball-lens targets2017

    • Author(s)
      Shohei Hara, Winarno Agustinus, Satoru Takahashi, Hirokazu Matsumoto, Kiyoshi Takamasu
    • Organizer
      ISMTII 2017, 13th International Symposium on Measurement Technology and Intelligent Instruments, Xi'an, China
    • Int'l Joint Research
  • [Presentation] In-process measurement on the thickness of photosensitive resin in evanescent wave-based nano-stereolithography2017

    • Author(s)
      Deqing Kong, Masaki Michihata, Kiyoshi Takamasu, Satoru Takahashi
    • Organizer
      ISMTII 2017, 13th International Symposium on Measurement Technology and Intelligent Instruments, Xi'an, China
    • Int'l Joint Research
  • [Presentation] Non-contact method of an absolute length measurement between two ball-lenses using a tandem low-coherence interferometer2017

    • Author(s)
      Winarno Agustinus, Shusei Masuda, Satoru Takahashi, Hirokazu Matsumoto, Kiyoshi Takamasu
    • Organizer
      ISMTII 2017, 13th International Symposium on Measurement Technology and Intelligent Instruments, Xi'an, China
    • Int'l Joint Research
  • [Presentation] Numerical investigation on refractive index compensation performance of three-color method2017

    • Author(s)
      Dong Wei, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Organizer
      ISMTII 2017, 13th International Symposium on Measurement Technology and Intelligent Instruments, Xi'an, China
    • Int'l Joint Research
  • [Presentation] High sensitive and super resolution optical inspection of nanodefects on Si wafer surface using infrared standing evanescent wave2017

    • Author(s)
      Satoru Takahashi
    • Organizer
      ISMTII 2017, 13th International Symposium on Measurement Technology and Intelligent Instruments, Xi'an, China
    • Int'l Joint Research / Invited
  • [Presentation] New Developments for Next-generation Precision Engineering Opened with Localized Light Energy Control2017

    • Author(s)
      Satoru Takahashi
    • Organizer
      ASPEN2017, 7th International Conference of Asian Society for Precision Engineering and Nanotechnology Program, Seoul, Korea
    • Int'l Joint Research / Invited
  • [Presentation] Nanometer Profile Measurement on Large Aspheric Optical Surface2017

    • Author(s)
      Xiang Guo, Satoru Takahashi, Yohan Kondo, Youichi Bitou, Kiyoshi Takamasu
    • Organizer
      ASPEN2017, 7th International Conference of Asian Society for Precision Engineering and Nanotechnology Program, Seoul, Korea
    • Int'l Joint Research
  • [Presentation] The Development of an Absolute Internal Distance Measurement Between Two Ball Lenses Within Sub-Micro Accuracy2017

    • Author(s)
      Agustinus Winarno, Shusei Masuda, Satoru Takahashi, Hirokazu Matsumoto, Kiyoshi Takamasu
    • Organizer
      ASPEN2017, 7th International Conference of Asian Society for Precision Engineering and Nanotechnology Program, Seoul, Korea
    • Int'l Joint Research
  • [Presentation] Accuracy Evaluation of Optical Comb Probe for Coordinate Measuring Machines Verification2017

    • Author(s)
      Shohei Hara, Winarno Agustinus, Satoru Takahashi, Hirokazu Matsumoto, Kiyoshi Takamasu
    • Organizer
      ASPEN2017, 7th International Conference of Asian Society for Precision Engineering and Nanotechnology Program, Seoul, Korea
    • Int'l Joint Research
  • [Presentation] Monitor Resin Curing Degree for In-process Measurement in Micro-stereolithography2017

    • Author(s)
      Deqing Kong, Masaki Michihata, Kiyoshi Takamasu, Satoru Takahashi
    • Organizer
      ASPEN2017, 7th International Conference of Asian Society for Precision Engineering and Nanotechnology Program, Seoul, Korea
    • Int'l Joint Research
  • [Presentation] Precision Profile Measurement for Small Aspheric Optical Surface by an Multi-beam Angle Sensor2017

    • Author(s)
      Jumpei Miyachi, Kiyoshi Takamasu, Satoru Takahashi
    • Organizer
      ASPEN2017, 7th International Conference of Asian Society for Precision Engineering and Nanotechnology Program, Seoul, Korea
    • Int'l Joint Research
  • [Presentation] Thoretical Analysis of Multi-Beam Interference Lithography Combining Evanescent and Propagation Light2017

    • Author(s)
      Shuzo Masui, Yuki Suzuki, Masaki Michihata, Kiyoshi Takamasu, Satoru Takahashi
    • Organizer
      ASPEN2017, 7th International Conference of Asian Society for Precision Engineering and Nanotechnology Program, Seoul, Korea
    • Int'l Joint Research
  • [Presentation] Double Imaging Micro-Stereolithography for One-Shot Curing of Surface Micro-Structure Unit2017

    • Author(s)
      Yuki Matsumoto, Yuki Suzuki, Masaki Michihata, Kiyoshi Takamasu, Satoru Takahashi
    • Organizer
      ASPEN2017, 7th International Conference of Asian Society for Precision Engineering and Nanotechnology Program, Seoul, Korea
    • Int'l Joint Research
  • [Remarks] Takamasu - Takahashi Lab.

    • URL

      www.nanolab.t.u-tokyo.ac.jp/

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Published: 2019-12-27  

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