Investigation of surface phonon and local surface proiperties at atomic scale with atomic force microscopy

2016 Fiscal Year Final Research Report

• Project/Area Number: 26286007
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Partial Multi-year Fund
• Section: 一般
• Research Field: Nanostructural physics
• Research Institution: Osaka University
• Principal Investigator: Naitoh Yoshitaka 大阪大学, 工学(系)研究科(研究院), 助教 (90362665)
• Research Collaborator: SUGAWARA Yasuhiro 大阪大学, 大学院工学研究科, 教授 (40206404) ; Štich Ivan Slovakia Academy of Science, Professor
• Project Period (FY): 2014-04-01 – 2017-03-31
• Keywords: 原子間力顕微鏡 / 表面物性 / ナノコンタクト / フォノン

Outline of Final Research Achievements

In order to investigate surface elastic and electronic properties on nanoscale, I invented new physical property detection techniques using atomic force microscopy (AFM) and kelvin prove force microscopy (KPFM). Here I propose a three force component detection method on sub-atomic scale and apply it to Ge(001)-c(4×2) surface using a bimodal AFM. I expressed them as a three-dimensional force vector distribution for the first time. The technique and result are highly evaluated and published in Nature Physics. In addition, I developed 3w-KPFM method to probe electronic distribution on a surface and its changes. I realized simultaneous observation of surface elasticity and surface electronic distribution on a surface at the atomic scale.

Free Research Field

表面ナノ物性