Development of a double-modulation terahertz ellipsometer and analysis of the synthesized polarized light

2016 Fiscal Year Final Research Report

• Project/Area Number: 26289066
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Partial Multi-year Fund
• Section: 一般
• Research Field: Intelligent mechanics/Mechanical systems
• Research Institution: The University of Tokushima
• Principal Investigator: Iwata Tetsuo 徳島大学, 大学院理工学研究部, 教授 (50304548)
• Co-Investigator(Kenkyū-buntansha): 安井 武史 徳島大学, ソシオテクノサイエンス研究部, 教授 (70314408) ; 水谷 康弘 大阪大学, 工学(系)研究科(研究院), 准教授 (40374152)
• Project Period (FY): 2014-04-01 – 2017-03-31
• Keywords: テラヘルツ / エリプソメエータ / 薄膜計測 / 光計測 / 分光計測 / 幾何学的位相

Outline of Final Research Achievements

We constructed a double-modulation, reflection-type terahertz (THz) ellipsometer for precise measurement of the thickness of a paint film that was coated on a metal surface, which was not transparent to the visible and the mid-infrared light. The double-modulation technique enabled us to obtain two ellipsometric parameters directly as a function of angular frequency with a single measurement, while reducing flicker noise due to a pump laser. In the THz frequency region, we carried out direct measurement of the geometric phase. We also proposed a high-sensitive measurement method of optical rotatory dispersion (ORD) of optically active samples by taking advantage of a nonlinear behavior of the geometric phase.

Free Research Field

光応用計測