Local potential structure characterization of polar oxide interfaces by atomic-resolution electric field imaging STEM

2016 Fiscal Year Final Research Report

• Project/Area Number: 26289234
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Partial Multi-year Fund
• Section: 一般
• Research Field: Inorganic materials/Physical properties
• Research Institution: The University of Tokyo
• Principal Investigator: Shibata Naoya 東京大学, 工学(系)研究科(研究院), 准教授 (10376501)
• Project Period (FY): 2014-04-01 – 2017-03-31
• Keywords: STEM / セラミックス / 電場 / 極性結晶 / 界面

Outline of Final Research Achievements

In this study, we tried to directly observe electric field structures at ceramic interfaces by atomic-resolution differential phase contrast scanning transmission electron microscopy (DPC STEM) to understand the fundamental mechanisms of interface properties in polar ceramic materials. First, we developed theory and experimental setups for quantitative DPC STEM. Then, we applied this new technique to various applications. We obtained the following main results. 1. We could directly observe local electric field variation at polar crystal interfaces related to their local potential structures. 2. We could directly observe pn junction in semiconductor materials in real space as an electric field variation. 3. We could observe atomic electric field within gold single atoms.

Free Research Field

電子顕微鏡材料学