Development of Scanning Electronic-Magnetic Effect Microscopy (SEMEM) for electric-field-induced localized spin detection

2015 Fiscal Year Final Research Report

• Project/Area Number: 26600009
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Multi-year Fund
• Research Field: Nanostructural physics
• Research Institution: Chiba University
• Principal Investigator: Aoki Nobuyuki 千葉大学, 融合科学研究科(研究院), 准教授 (60312930)
• Co-Investigator(Kenkyū-buntansha): OCHIAI Yuichi 千葉大学, 大学院融合科学研究科, 名誉教授 (60111366)
• Project Period (FY): 2014-04-01 – 2016-03-31
• Keywords: 走査ゲート顕微法（SGM） / 磁気力顕微法（MFM） / 走査電気磁気効果複合顕微法（SEMEM） / 局在スピン / 走査ゲートスペクトロスコピー（SGS）

Outline of Final Research Achievements

A new scanning probe technique, Scanning Electronic-Magnetic Effect Microscopy (SEMEM), has been studied by combining both scanning probe techniques such as Scanning Gate Microscopy (SGM) and Magnetic Force Microscopy (MFM) in order to detect a localized spin induced by electric field. By sweeping the probe voltage or the source-drain voltage with fixing the tip position on the sample surface, a new probing technique namely a Scanning Gate Spectroscopy (SGS) has been realized in this study. In addition, using a ferromagnetic tip, the technique can be expected to detect a localized spin moment.

Free Research Field

半導体物性