Measurement conditions of atomic-resolution optical imaging in near-field scanning optical microscopy using the force detection

2015 Fiscal Year Final Research Report

• Project/Area Number: 26600013
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Multi-year Fund
• Research Field: Nanostructural physics
• Research Institution: Osaka University
• Principal Investigator: SUGAWARA YASUHIRO 大阪大学, 工学(系)研究科(研究院), 教授 (40206404)
• Project Period (FY): 2014-04-01 – 2016-03-31
• Keywords: ナノプローブ / 走査プローブ顕微鏡

Outline of Final Research Achievements

Atomic-resolution optical imaging that overcomes the diffraction limit of light is a challenging task. However, atomic-resolution imaging of the optical field has not yet been achieved. Recently, we investigate the high-resolution imaging of the optical near-field on a surface using the force detection.In this method, the surface photovoltage of the silicon tip apex induced by the optical near-field on the surface is measured by the force between the tip and the surface. Here, we clarified the measurement conditions for the atomic-resolution optical imaging.

Free Research Field

ナノ構造科学