Development of new X-ray direct conversion films for high-sensitive flat-panel detectors

2015 Fiscal Year Final Research Report

• Project/Area Number: 26670296
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Multi-year Fund
• Research Field: Medical Physics and Radiological Technology
• Research Institution: Tohoku University
• Principal Investigator: HITOMI Keitaro 東北大学, 工学(系)研究科(研究院), 准教授 (60382660)
• Co-Investigator(Renkei-kenkyūsha): KIM Seong-Yun 東北大学, 大学院工学研究科, 准教授 (50574357) ; ONODERA Toshiyuki 東北工業大学, 工学部, 講師 (10620916)
• Project Period (FY): 2014-04-01 – 2016-03-31
• Keywords: 臭化タリウム / フラットパネル検出器 / X線 / 放射線

Outline of Final Research Achievements

Development of X-ray detectors using a compound semiconductor, thallium bromide (TlBr), was performed for realizing high-sensitive flat-panel detectors. High-pure TlBr was obtained by the horizontal zone purification method. Small pixel electrodes were formed successfully on TlBr single crystals. Thin-film detectors were fabricated from TlBr thin films deposited on ITO glass substrates by the vacuum evaporation method. The fabricated thin films exhibited high resistivity at room temperature.

Free Research Field

放射線計測学