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1988 Fiscal Year Final Research Report Summary

Development of Zr/W - Gun for nano-meter Auger Electron Microprobe

Research Project

Project/Area Number 61850013
Research Category

Grant-in-Aid for Developmental Scientific Research

Allocation TypeSingle-year Grants
Research Field 応用物理学一般(含航海学)
Research InstitutionOsaka University

Principal Investigator

SHIMIZU Ryuichi  Osaka University Faculty of Engineering, professor, 工学部, 教授 (40029046)

Co-Investigator(Kenkyū-buntansha) 田村 伸昭  日本電子株式会社, EOD本部, 係長
TAMURA Nobuaki  Japan Electron Optics Laboratories Inc., chief, EM-Group
Project Period (FY) 1986 – 1987
KeywordsHigh Brightness Emitter / T.F. Emission / ジルコニウム被覆タングステン
Research Abstract

A new type high brightness electron gun was designed for developing a nano-meter Auger electron microprobe. This gun was equiped with a Zr/W - tip consisting of a (100) - oriented tungusten emitter with an overlayer of zirconium. The emission properties was investigated to find that the work function of the Zr/W - tip operatinf in extended Schottky emission region was coarsely estimated to be 3.2eV. The emission properties of the Zr/W - tip has been turned to be excellent as a stable and high brightness emitter, most suitable for the present purpose. This electron gun system was mounted on a commercial type scanning electron microscope, JSEM-840. The net performance as a nano-meter Auger electron microprobe has been under examination. The assessment will be published shortly.

  • Research Products

    (6 results)

All Other

All Publications (6 results)

  • [Publications] R.Shimizu.: in Proc.XIth Int.Cong.on Electron Microscopy. 215-219 (1986)

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] K.Harada;H.Endoh;R.Shimizu.: J.Electron Microscopy,Japan.

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] Z.J.Ding;R.Shimizu.: J.Electron Microscopy.

    • Description
      「研究成果報告書概要(和文)」より
  • [Publications] R. Shimizu.: "Work Function Measurement of Zr/W(100) Field Emitter" in Proc. XIth Int. Cong. on Electron Microscopy (Kyoto, 1986). 215-219 (1986)

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] K. Harada,; H. Endoh; R. Shimizu.: "Anti-contamination Electron Biprism for Electron Holography" J. Electron Microscopy, Japan.

    • Description
      「研究成果報告書概要(欧文)」より
  • [Publications] Z. J. Ding; R. Shimizu.: "Theoretical Study of the Ultimate Resolution of Scanning Electron Microscopy" J. Electron Microscopy.

    • Description
      「研究成果報告書概要(欧文)」より

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Published: 1990-03-20  

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