Determination of internal quantum efficiency in GaInN-based light-emitting diode under electrical injection: carrier recombination dynamics analysis
Journal
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- Applied Physics Express
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Applied Physics Express 12 (3), 032006-, 2019-02-14
IOP Publishing
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Details
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- CRID
- 1360003449883124480
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- NII Article ID
- 210000135589
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- ISSN
- 18820786
- 18820778
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- Data Source
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- Crossref
- CiNii Articles
- KAKEN