|Budget Amount *help
¥46,540,000 (Direct Cost : ¥35,800,000、Indirect Cost : ¥10,740,000)
Fiscal Year 2013 : ¥7,800,000 (Direct Cost : ¥6,000,000、Indirect Cost : ¥1,800,000)
Fiscal Year 2012 : ¥9,490,000 (Direct Cost : ¥7,300,000、Indirect Cost : ¥2,190,000)
Fiscal Year 2011 : ¥11,570,000 (Direct Cost : ¥8,900,000、Indirect Cost : ¥2,670,000)
Fiscal Year 2010 : ¥11,050,000 (Direct Cost : ¥8,500,000、Indirect Cost : ¥2,550,000)
Fiscal Year 2009 : ¥6,630,000 (Direct Cost : ¥5,100,000、Indirect Cost : ¥1,530,000)
High-speed time-resolved measurement systems of (1) grazing-incidence small-angle and wide-angle X-ray scattering (GISWAXS) to evaluate domain/molecular-scale surface /thin-film structure, (2) microbeam X-ray diffraction and scattering to evaluate local structure / layer structure in the thickness direction, and (3) anomalous small-angle X-ray scattering (TRASAXS) to evaluate meso-scale stucture utilizing the X-ray absorption edge of specific heavy elements were successfully established using synchrotron radiation at undulator-type SAXS BLs in SPring-8 for organic polymer thin films under external stimulation.