| Project/Area Number |
07555024
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| Research Category |
Grant-in-Aid for Scientific Research (A)
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| Allocation Type | Single-year Grants |
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| Section | 試験 |
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| Research Field |
Applied physics, general
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| Research Institution | Osaka University |
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Principal Investigator |
SHIMIZU Ryuichi Osaka University, Dep.of Appl.Phys., Professor, 工学部, 教授 (40029046)
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| Co-Investigator(Kenkyū-buntansha) |
TSUNO Katushige JEOL Ltd., Electro-Optics Division, Senior Researcher, 電子光学本部, 室長(研究職)
IKUTA Takashi Osaka Electro-Commu.Univ., Dep.of Appl.Electronics, Professor, 工学部, 教授 (20103343)
KIMURA Yoshihide Osaka University, Dep.of Appl.Phys., Assistant Professor, 工学部, 助手 (70221215)
TAKAI Yoshizo Osaka University, Dep.of Appl.Phys., Associate Professor, 工学部, 助教授 (30236179)
市橋 幹雄 日立製作所, 計測器事業部, 主任技師
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| Project Period (FY) |
1995 – 1996
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| Project Status |
Completed (Fiscal Year 1996)
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| Budget Amount *help |
¥17,000,000 (Direct Cost: ¥17,000,000)
Fiscal Year 1996: ¥2,800,000 (Direct Cost: ¥2,800,000)
Fiscal Year 1995: ¥14,200,000 (Direct Cost: ¥14,200,000)
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| Keywords | Active Modulation Processing / Accelerating voltage Modulation / Real-time Processing / Spherical-Aberration-Free Observation / High-Resolution Electron Microscopy / 無収差電子顕微鏡法 / 実時間変調処理法 / 位相像分解観察 / 実時間画像処理 / 位相コントラスト / 高圧変調 / 電子顕微鏡 |
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| Research Abstract |
The results obtained through the present research project are as follows :
(1) Accelerating voltage modulation system for real-time active modulation processing has been successfully constructed.
(2) Modulation signals which has been derived from the characteristics of electron optical system was transformed through optical fiber to the modulation system installed in high voltage tank.
(3) The deformation of modulation signals due to the response of feedback system of accelerating voltage power supply was successfully compensated by overlapping the correction signals onto the modulation signals.
(4) We have been involved in observing unstained biological samples under the real-time active modulation electron microscope and high contrast image have been observed so far.
However, the stability of the entire electron microscope has been gradually deteriorating and this limited the high-resolution observation.
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