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Research for High-Speed Wareform Measurement Algorithms

Research Project

Project/Area Number 11650415
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Measurement engineering
Research InstitutionGunma University

Principal Investigator

KOBAYASHI Haruo  Gunma University, Faculty of Engineering (Electronic Engineering Dat.) Associate Professor, 工学部, 助教授 (20292625)

Project Period (FY) 1999 – 2000
Project Status Completed (Fiscal Year 2000)
Budget Amount *help
¥3,500,000 (Direct Cost: ¥3,500,000)
Fiscal Year 2000: ¥1,700,000 (Direct Cost: ¥1,700,000)
Fiscal Year 1999: ¥1,800,000 (Direct Cost: ¥1,800,000)
KeywordsWaveform Measurement / Algorithm / jitter / Sampling / AD Converter / DA Converter / Track / Hold Circuit
Research Abstract

We have performed the research for ultra-high-speed waveform measurement algorithms which are especially used for waveform sampling technology, and these algorithms will be required in next generation waveform measurement instruments for high-speed and high-frequency information and communication systems. We have obtained the following results :
(1) We have derived explicit formulas for finite aperture time effects in waveform sampling systems. In waveform sampling systems, ideally the sampling should be performed instantaneously, however it takes some time (which is called "aperture time") and this finite aperture time degrades the waveform sampling accuracy. We have derived the relationship between finite aperture time and sampling accuracy, and we have confirmed this result by numerical simulation.
(2) We have derived explicit formulas for aperture jitter effects in waveform sampling systems. In actual waveform sampling systems, the rising edge of the sampling clock fluctuates, which is called "aperture jitter", and this aperture jitter degrades the waveform sampling accuracy. We have derived the relationship between aperture jitter and sampling accuracy, and we have confirmed this result by numerical simulation as well as experiments.
(3) We have derived new algorithms to evaluate the performance of the sampling circuits.
(4) We have derived explicit formulas for dynamic power dissipation of track/hold circuits.
(5) We have derived explicit formulas for channel mismatch effects (such as offset, gain, timing, bandwidth, linearity) in time-interleaved AD converter systems.
(6) We have derived explicit formulas for the sampling jitter effects in DA converters which are used in measurement instruments to generate various waveforms.

Report

(3 results)
  • 2000 Annual Research Report   Final Research Report Summary
  • 1999 Annual Research Report
  • Research Products

    (31 results)

All Other

All Publications (31 results)

  • [Publications] H.Kobayashi et.al.: "High-Speed CMOS Track/Hold Design"Analog Integrated Circuits and Signal Processing. (in press). (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.Kimura et.al.: "A New Coherent Sampling System with a Triggered Time Interpolation"IEICE Trans.on Fundamentals. (in press). (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] N.Kurosawa et.al.,: "Explicit Analysis of Channel Mismatch Effects in Time-Interleared ADC Systems"IEEE Trans.on Circuits and Systems I. (in press). (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] N.Kurosawa, et.al.,: "Sampling clock Jitter Effects in Digital-to-Analog Converters"Measurement. (in press). (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Kobayashi et.al.: "ADC Standard and Testing in Japanese Industry"Computer Standards & Interfaces. (in press). (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Kobayashi, et.al.: "High-Speed ADC Systems with HBTs for Measuring Instrument Applications"Computer Standards & Interfaces. Vol.22,No.2. 121-140 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Kobayashi, et.al.: "A High-Speed CMOS Track/Hold Circuit"Analog Integrated Circuits and Signal Processing. Kluwer Academic Publishers (in press).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.Kimura, et.al.: "A New Coherent Sampling System with a Triggered Time Interpolation"IEICE Trans.on Fundamentals. vol.E84-A, no.3 (March 2001). (in press).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] N.Kurosawa, et.al.: "Explicit Analysis of Channel Mismatch Effects in Time-Interleaved ADC Systems"IEEE Trans.on Circuits and Systems I. (in press).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] N.Kurosawa, et.al.: "Sampling Clock Jitter Effects in Digital-to-Analog Converters"MEASUREMENT, Journal of the International Measurement Confederation IMEKO. (in press).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Kobayashi, K.Kobayashi, H.Sakayori and Y.Kimura: "ADC Standard and Testing in Japanese Industry"Computer Standards & Interfaces, Elsevier Publishers. (in press).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Kobayashi, et.al.: "High-Speed ADC Systems with HBTs for Measuring Instrument Applications"Computer Standards & Interfaces, Elsevier Publishers. vol.22, no.2, June.. 121-140 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Sato et.al.: "Dynamic Power Dissipation of Track/Hold Circuit"IEICE Trans.on Fundamentals. vol.83, No.8, Aug.. 1728-1731 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] N.Kurosawa, et.al.: "Channel Linearity Mismatch Effects in Time-Interleaved ADC Systems"International Symposium on Circuits and Systems. Sydney, Australia (May, 2001) (accepted).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Kobayashi, et.al.: "Finite Aperture Time and Sampling Jitter Effects in Wideband Data Acquisition Systems"Automatic RF Techniques Group56th Measurement Conference - Metrology and Test for RF Telecommunications. Boulder, Dec.. 115-121 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] K.Kobayashi, et.al.: "A Quasi-Coherent Sampling Method for Wideband Data Acquisition"Automatic RF Techniques Group 56th Measurement Conference, - Metrology and Test for RF Telecommunications. Boulder, Dec.. 25-31 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Sugawara, et.al.: "Some Thoughts on Sine Wave ADC Testing"IEEE Instrumentation and Measurement Technology Conference. Baltimore, USA May. 125-131 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Sato et.al.: "Dynamic Power Dissipation of Track/Hold Circuit"IEEE Instrumentation and Measurement Technology Conference. Baltimore, USA May. 425-430 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] N.Kurosawa, et.al.: "Explicit Formula for Channel Mismatch Effects in Time-Interleaved ADC Systems"IEEE Instrumentation and Measurement Technology Conference. Baltimore, USA May. 763-769 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Kobayashi et al.: "High-Speed CMOS Track/Hold Design"Analog Integrated Circuits and Signal Processing . (in press). (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Kimura et.al.H.Kobayashi: "A New Coherent Sampling System with a Triggered Time Interpolation "IEICE Trans.on Fundamentals. (in press). (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] N.Kurosawa et.al.,H.Kobayashi: "Explicit Analysis of Channel Mismatch Effects in Time-Interleared ADC Systems"IEEE Trans.on Circuits and Systems I. (in press). (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] N.Kurosawa et al.,H.Kobayashi: "Sampling clock Jitter Effects in Digital-to-Analog Converters"Measurement . (in press). (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] H.Kobayashi et.al.: "ADC Standard and Testing in Japanese Industry"Computer Standards & Interfaces. (in press). (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] H.Kobayashi, et.al.: "High-Speed ADC Systems with HBTs for Measuring Instrument Applications"Computer Standards & Interfaces. Vol.22,No.2. 121-140 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] H.Kobayashi,M.Morimura,K.Kobayashi,Y.Ohara: "Aperture Jitter Effects in Wideband Sampling Systems"Proc. Of IMTC99. 880-885 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] M.A.Mohamed Zin,H,Kobayashi etal: "A High-Speed CMOS Track/Hold Circuit"Proc. Of IMTCS99. 1709-1712 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] H.Kobayashi,M.Morimura K.Kobayashi,Y.Onaya: "Aperture Jitter Effects in Wideband ADC Systems"Proc. Of IMTCS99. 1705-1708

    • Related Report
      1999 Annual Research Report
  • [Publications] H.Sato,H.Kobayashi: "Dynamic Power Dissipation of Track/Hold Circuit"Proc. Of IMTC2000. (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] N.Kurosawa,K.Maruyama,H,kobayashi et al.: "Explicit formula for channel Mismatch Effects in Time-Interleaved ADC Systems"Proc. Of IMTC2000. (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] H.Sugawara,H.Kobayashi,P.Arpain: "Some thoughts on Sine Wave ADC Testing"Proc. Of IMTC2000. (2000)

    • Related Report
      1999 Annual Research Report

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Published: 1999-04-01   Modified: 2016-04-21  

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