PREPARATION OF ULTRA LOW-K MATERIAL BY CHEMICAL VAPOR DEPOSITION METHOD.
| Project/Area Number |
12650022
|
|---|
| Research Category |
Grant-in-Aid for Scientific Research (C)
|
| Allocation Type | Single-year Grants |
|---|
| Section | 一般 |
|---|
| Research Field |
Applied materials science/Crystal engineering
|
|---|
| Research Institution | TEIKYO UNIVERSITY OF SClENCE AND TECHNOLOOY |
|---|
Principal Investigator |
UCHIDA Yasutaka TEIKYO UNIVESITY OF SCIENCE AND TECHNOLOGY, DEPARTMENT OF MEDIA SCIENCE, ASSOCIATE PROFESSOR, 理工学部, 助教授 (80134823)
|
|---|
| Project Period (FY) |
2000 – 2001
|
| Project Status |
Completed (Fiscal Year 2001)
|
| Budget Amount *help |
¥3,600,000 (Direct Cost: ¥3,600,000)
Fiscal Year 2001: ¥1,200,000 (Direct Cost: ¥1,200,000)
Fiscal Year 2000: ¥2,400,000 (Direct Cost: ¥2,400,000)
|
|---|
| Keywords | low-k / porous silica / CVD / 2-Methylpentane-2,4-diol / X-ray total reflectance / porosity / GIXA / 多孔質 / FTIR / ポーラスシリカ膜 / TICS / TMA / 層間絶縁膜 |
|---|
| Research Abstract |
Porous silica films with a low dielectric constant, k, have been prepared from the gas phase using a mixture of Si(NCO)_4, N(CH_3)_3 and (C_6H_5)_2Si(N(CH_3)_2)_2. After desorption of phenyl groups chemically bonded with Si in the as-deposited film, the film showed a porosity of 48%, and k as low as 2.5. Low-field resistivity and break down field strength were about 10^<15> Ωcm, and 1.3MV/cm due to pinhals, respectively.
Based on these results, importance of an Alkylene incorporated porous silica film I have been pointed out and demonstrated the film prepared by using hydrolysis and condensation of BIS(Triethoxysilyl)Ethelene (BTE). BTE and H_2O contained with HCl as a catalyst were mixture with organic solvent, 2-Methylpentane-2,4-diol (MPD). FT-IR peaks due to MPD were not observed but Si-C_2H_4-Si related peaks were still observed in the film even after 450℃ vacuum annealing. Electric characteristics were evaluated with an MOS structure. K value was not depended on the annealing temperature below 400℃, however, it was reduced down to 1.9 at 450℃. In order to confirm the density of the film X-ray total reflectance and GIXA measurement have applied to the films. The density of the film after vacuum annealing at 450℃ was 1.2g/cm^3 and porosity was 52%. The low-k film have inter mediate layers at surface the film and interface between low-k film and substrate.
I have also tried to form new structure films incorporated with CF bonds which have good thermal and plasma tolerance. In order to form CF incorporated film, following things became clear. Bis(trichlorosilyl)acetylene [BTA] should be react with methyl groups and then hydrolysis and condensation applied to the BTA.
|
Report
(3 results)
Research Products
(13 results)
