| Project/Area Number |
12650654
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Physical properties of metals
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| Research Institution | Niigata University |
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Principal Investigator |
SAITO Masatoshi Faculty of Medicine, Niigata University, Associate Professor, 医学部, 助教授 (40241583)
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| Co-Investigator(Kenkyū-buntansha) |
SAKAMOTO Makoto NIIGATA UNIVERSITY, Faculty of Medicine, Professor, 医学部, 教授 (80215657)
TAKAHASHI Hideyuki TOHOKU UNIVERSITY, Institute for Materials, Research Assistant, 金属材料研究所, 助手 (90312652)
WASEDA Yoshio TOHOKU UNIVERSITY, Institute of Multi-disciplinary Research for Advanced Materials, Professor, 多元物質科学研究所, 教授 (00006058)
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| Project Period (FY) |
2000 – 2001
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| Project Status |
Completed (Fiscal Year 2001)
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| Budget Amount *help |
¥3,600,000 (Direct Cost: ¥3,600,000)
Fiscal Year 2001: ¥1,000,000 (Direct Cost: ¥1,000,000)
Fiscal Year 2000: ¥2,600,000 (Direct Cost: ¥2,600,000)
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| Keywords | Phase Change Recording Material / Anomalous X-ray Scattering / Amorphous / Total Reflection |
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| Research Abstract |
The purpose of this research is to analyze precisely the reversible structural change in phase change recording materials represented for CD-RW by the anomalous X-ray scattering (AXS) method under the grazing incidence condition. The phase change recording materials, using the variation of optical reflectivity between crystalline and non-crystalline phases, attract much attention as a storaging medium of digital information. These materials have already been commercialized and their upgrading such as capacity enlargement and high reliability will advance in future more and more. As showing this tendency to increase, it is anticipated that the structural control greatly influences their characteristics. Therefore, the structural analysis of phase change recording materials in the atomic level might be one of important subjects for developing steadily these fields. The AXS method by using the anomalous dispersion effect may be one of powerful tools for obtaining the structural informatio
… More
n in the atomic level.
In 2000, the local structural information of amorphous Ag-Br-Ge-O system has been estimated from the AXS measurements using Ge and Br K absorption edges. The resultant structural parameters suggest mat GeO_4 tetrahedral unit is the probable structural entity in this glass and the arrangement of Ag and Br ions is similar to that in crystalline AgBr. From these results, effectiveness of the AXS method for characterizing amorphous materials could be confirmed.
In 2001, the usefulness and validity of energy dispersive grazing incidence X-ray reflectometry have been demonstrated for characterizing the multilayer interfaces. The method appears to hold promise in reducing difficulty of conventional angular dispersive method due to absorption with an upper layer by enabling the use of high energy white X-ray radiation and obtaining much higher reflected intensity. Taken from all results in this research, it would be very interesting to extend the present method to other systems. Less
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