A study of mechanical property of clean metal atomic contacts by UHV-TEM-AFM method
Project/Area Number |
15H03522
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Research Category |
Grant-in-Aid for Scientific Research (B)
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Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Nanostructural physics
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Research Institution | Japan Advanced Institute of Science and Technology |
Principal Investigator |
Oshima Yoshifumi 北陸先端科学技術大学院大学, 先端科学技術研究科, 准教授 (80272699)
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Research Collaborator |
Tomitori Masahiko 北陸先端科学技術大学院大学, 先端科学技術研究科, 教授
Arai Toyoko 金沢大学, 数物科学系, 教授
Ishizuka Keisuke 北陸先端科学技術大学院大学, 先端科学技術研究科
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Project Period (FY) |
2015-04-01 – 2018-03-31
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Project Status |
Completed (Fiscal Year 2017)
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Budget Amount *help |
¥17,160,000 (Direct Cost: ¥13,200,000、Indirect Cost: ¥3,960,000)
Fiscal Year 2017: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Fiscal Year 2016: ¥5,720,000 (Direct Cost: ¥4,400,000、Indirect Cost: ¥1,320,000)
Fiscal Year 2015: ¥9,490,000 (Direct Cost: ¥7,300,000、Indirect Cost: ¥2,190,000)
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Keywords | 透過型電子顕微鏡 / 水晶振動子 / 金属ナノ接点 / 力学的性質 / 周波数変調 / ナノ接点 / ナノコンタクト / 電子顕微鏡 / 機械材料・材料力学 / 原子間力顕微鏡 / 力計測 |
Outline of Final Research Achievements |
We designed and developed TEM-AFM holder, which can measure atomic-scale force using resonance frequency shift of quartz crystal resonator in order to clarify the dependence on Young's modulus of gold nano-contact. In this force measurement method, by utilizing the high resonance frequency and the high spring constant of the quartz resonator, it is possible to measure the atomic scale force gradient even with extremely small amplitude of the resonator. By reducing signal noise, it is possible to measure the force gradient (that is, the equivalent spring constant) with a resolution of about 6 N/m. In addition, since the amplitude of the oscillator is as small as about 80 pm, it is possible to acquire atomic resolution image simultaneously with force measurement. From the analysis, it is possible to quantitatively clarify that the Young's modulus of the gold nano-contact gradually decreases as the diameter becomes 10 nm or less.
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Report
(4 results)
Research Products
(28 results)
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[Journal Article] In situ Scanning Electron Microscope Observation of Silicon Anode Reactions in Lithium-Ion Battery during Charge-Discharge Processes2016
Author(s)
Chen, C.-Y.; Sano, T.; Tsuda, T.; Ui, K.; Oshima, Y.; Yamagata, M.; Ishikawa, M.; Haruta, M.; Doi, T.; Inaba, M.; Kuwabata, S.
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Journal Title
Scientific Reports
Volume: 6
Issue: 1
Pages: 36153-36153
DOI
Related Report
Peer Reviewed / Open Access / Acknowledgement Compliant
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