Investigation of Au Atomic Junctions Using Ultrafast Electromigration Controlled by a Field-Programmable Gate Array

• Project/Area Number: 15H03970
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Electronic materials/Electric materials
• Research Institution: Tokyo University of Agriculture and Technology
• Principal Investigator: SHIRAKASHI JUN-ICHI 東京農工大学, 工学(系)研究科(研究院), 教授 (00315657)
• Project Period (FY): 2015-04-01 – 2018-03-31
• Project Status: Completed (Fiscal Year 2017)
• Budget Amount: ¥16,640,000 (Direct Cost: ¥12,800,000、Indirect Cost: ¥3,840,000); Fiscal Year 2017: ¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000); Fiscal Year 2016: ¥5,330,000 (Direct Cost: ¥4,100,000、Indirect Cost: ¥1,230,000); Fiscal Year 2015: ¥7,280,000 (Direct Cost: ¥5,600,000、Indirect Cost: ¥1,680,000)
• Keywords: マイクロ・ナノデバイス / FPGA / エレクトロマイグレーション / 単原子トランジスタ / 原子接合 / 原子ギャップ

Outline of Final Research Achievements

A field-programmable gate array (FPGA) contains a matrix of reconfigurable gate array logic circuitry. FPGA-based systems can thus perform deterministic closed-loop control tasks at extremely fast loop rates. In this study, we presented the design of a new feedback-controlled electromigration (FCE) system using an FPGA. In addition, we applied the system for fabrication of Au atomic junctions and atomic gaps. Single-electron transistors (SETs) arrays operating at room temperature were also fabricated using the method. These results clearly imply that FPGA-based electromigration procedure is suitable for formation of Au atomic junctions, atomic gaps and SET arrays.

Research Products

• [Journal Article] Evolution of local temperature in Au nanowires during feedback-controlled electromigration observed by atomic force microscopy (2017)
  • Author(s): Yagi Mamiko、Shirakashi Jun-ichi
  • Journal Title: Applied Physics Letters Volume: 110 Issue: 20 Pages: 203105-203105
  • DOI: 10.1063/1.4984024
  • Peer Reviewed
• [Journal Article] Investigation of electromigration induced by field emission current flowing through Au nanogaps in ambient air (2017)
  • Author(s): Inoue Kazuki、Yagi Mamiko、Ito Mitsuki、Ito Tomoyuki、Shirakashi Jun-ichi
  • Journal Title: Journal of Applied Physics Volume: 122 Issue: 8 Pages: 084303-084303
  • DOI: 10.1063/1.4999831
  • Peer Reviewed
• [Journal Article] Wearable strain sensors based on thin graphite films for human activity monitoring (2017)
  • Author(s): Saito Takanari、Kihara Yusuke、Shirakashi Jun-ichi
  • Journal Title: Journal of Physics: Conference Series Volume: 939 Pages: 012006-012006
  • DOI: 10.1088/1742-6596/939/1/012006
  • Peer Reviewed
• [Journal Article] 自然収束動作を利用したイジングコンピューティング技術の開発とFPGAへの実装 (2017)
  • Author(s): 木原裕介、伊藤光樹、齋藤孝成、塩村真幸、酒井正太郎、白樫淳一
  • Journal Title: 電子情報通信学会技術研究報告 Volume: 116 Pages: 23-28
• [Journal Article] Reductive Deposition of Thin Cu Films Using Ballistic Hot Electrons as a Printing Beam (2016)
  • Author(s): R. Suda, M. Yagi, A. kojima, N. Mori, J. Shirakashi, and N. Koshida
  • Journal Title: J. Electrochem. Soc. Volume: 163 Issue: 6 Pages: E162-E165
  • DOI: 10.1149/2.0921606jes
  • Peer Reviewed
• [Journal Article] Field-Emission-Induced Electromigration Method for Precise Tuning of Electrical Properties of Ni-Based Single-Electron Transistors (2015)
  • Author(s): M. Kase, K. Okada M. Ito and J. Shirakashi
  • Journal Title: Conference Proceedings, 2015 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Volume: Year 2015 Pages: 202-205
  • DOI: 10.1109/3m-nano.2015.7425487
  • Peer Reviewed
• [Journal Article] Simultaneous Fabrication of Nanogap Electrodes Using Field-Emission-Induced Electromigration (2015)
  • Author(s): M. Ito, M. Yagi, K. Morihara and J. Shirakashi
  • Journal Title: J. Appl. Phys. Volume: 118 Issue: 1 Pages: 014301-014301
  • DOI: 10.1063/1.4923411
  • Peer Reviewed
• [Journal Article] High-Throughput Nanogap Formation by Field-Emission-Induced Electromigration (2015)
  • Author(s): M. Ito, K. Morihara, T. Toyonaka, K. Takikawa and J. Shirakashi
  • Journal Title: J. Vac. Sci. Technol. B Volume: 33 Issue: 5 Pages: 051801-051801
  • DOI: 10.1116/1.4927443
  • Peer Reviewed
• [Journal Article] Tuning of Channel Conductance of Au Nanowires Using Ultrafast Electromigration Controlled by a Field-Programmable Gate Array (2015)
  • Author(s): Y. Katogi, Y. Kanamaru, S. Sato, T. Saito and J. Shirakashi
  • Journal Title: Conference Proceedings, 2015 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Volume: Year 2015 Pages: 198-201
  • DOI: 10.1109/3m-nano.2015.7425485
  • Peer Reviewed
• [Presentation] Local Joule Heating in Electromigrated Au Nanowires Imaged by In Situ Atomic Force Microscopy (2017)
  • Author(s): M. Yagi and J. Shirakashi
  • Organizer: 12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), October 2-4, 2017, Singapore.
  • Int'l Joint Research
• [Presentation] Optimization of Experimental Parameters for Fabrication of Atomic Junctions Using Ground-State Searches of Ising Spin Computing (2017)
  • Author(s): S. Sakai, Y. Iwata, Y. Katogi, M. Shiomura, Y. Kihara, M. Ito and J. Shirakashi
  • Organizer: 17th IEEE International Conference on Nanotechnology (IEEE NANO 2017), July 25-28, 2017, Pittsburgh, PA, USA.
  • Int'l Joint Research / Invited
• [Presentation] Single-Electron Transistors with Electromigrated Au Nanogaps (2017)
  • Author(s): S. Tani, M. Ito, K. Minami and J. Shirakashi
  • Organizer: 2nd International Conference on Applied Surface Science (ICASS 2017), June 12-15, 2017, Dalian, China.
  • Int'l Joint Research
• [Presentation] Feedback-Controlled Electromigration (FCE) Method with Automatically Optimized Parameters (2016)
  • Author(s): N. Numakura, Y. Iwata and J. Shirakashi
  • Organizer: Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2016)
  • Place of Presentation: Hawaii, USA.
  • Year and Date: 2016-12-11
  • Int'l Joint Research
• [Presentation] Controlled Electromigration Method for the Fabrication of Nanoscale Junction Devices (2016)
  • Author(s): J. Shirakashi
  • Organizer: Emerging Technologies 2016
  • Place of Presentation: Montreal, QC, Canada.
  • Year and Date: 2016-05-25
  • Int'l Joint Research / Invited
• [Presentation] Tuning of Channel Conductance of Au Nanowires Using Ultrafast Electromigration Controlled by a Field-Programmable Gate Array (2015)
  • Author(s): Y. Katogi, Y. Kanamaru, S. Sato, T. Saito and J. Shirakashi
  • Organizer: 5th International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO 2015)
  • Place of Presentation: Changchun, China.
  • Year and Date: 2015-10-05
  • Int'l Joint Research
• [Presentation] Channel Conductance of Au Nanowires Tuned by Ultrafast Electromigration Using a Field-Programmable Gate Array (2015)
  • Author(s): Y. Katogi, Y. Kanamaru, S. Sato and J. Shirakashi
  • Organizer: 10th International Conference on Surfaces, Coatings and Nanostructured Materials (NANOSMAT 2015)
  • Place of Presentation: Manchester, UK.
  • Year and Date: 2015-09-13
  • Int'l Joint Research
• [Remarks] 白樫研究室HP
  • URL: http://web.tuat.ac.jp/~nanotech/index.htm