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Investigation of Au Atomic Junctions Using Ultrafast Electromigration Controlled by a Field-Programmable Gate Array

Research Project

Project/Area Number 15H03970
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionTokyo University of Agriculture and Technology

Principal Investigator

SHIRAKASHI JUN-ICHI  東京農工大学, 工学(系)研究科(研究院), 教授 (00315657)

Project Period (FY) 2015-04-01 – 2018-03-31
Project Status Completed (Fiscal Year 2017)
Budget Amount *help
¥16,640,000 (Direct Cost: ¥12,800,000、Indirect Cost: ¥3,840,000)
Fiscal Year 2017: ¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2016: ¥5,330,000 (Direct Cost: ¥4,100,000、Indirect Cost: ¥1,230,000)
Fiscal Year 2015: ¥7,280,000 (Direct Cost: ¥5,600,000、Indirect Cost: ¥1,680,000)
Keywordsマイクロ・ナノデバイス / FPGA / エレクトロマイグレーション / 単原子トランジスタ / 原子接合 / 原子ギャップ
Outline of Final Research Achievements

A field-programmable gate array (FPGA) contains a matrix of reconfigurable gate array logic circuitry. FPGA-based systems can thus perform deterministic closed-loop control tasks at extremely fast loop rates. In this study, we presented the design of a new feedback-controlled electromigration (FCE) system using an FPGA. In addition, we applied the system for fabrication of Au atomic junctions and atomic gaps. Single-electron transistors (SETs) arrays operating at room temperature were also fabricated using the method. These results clearly imply that FPGA-based electromigration procedure is suitable for formation of Au atomic junctions, atomic gaps and SET arrays.

Report

(4 results)
  • 2017 Annual Research Report   Final Research Report ( PDF )
  • 2016 Annual Research Report
  • 2015 Annual Research Report
  • Research Products

    (17 results)

All 2017 2016 2015 Other

All Journal Article (9 results) (of which Peer Reviewed: 8 results) Presentation (7 results) (of which Int'l Joint Research: 7 results,  Invited: 2 results) Remarks (1 results)

  • [Journal Article] Evolution of local temperature in Au nanowires during feedback-controlled electromigration observed by atomic force microscopy2017

    • Author(s)
      Yagi Mamiko、Shirakashi Jun-ichi
    • Journal Title

      Applied Physics Letters

      Volume: 110 Issue: 20 Pages: 203105-203105

    • DOI

      10.1063/1.4984024

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Investigation of electromigration induced by field emission current flowing through Au nanogaps in ambient air2017

    • Author(s)
      Inoue Kazuki、Yagi Mamiko、Ito Mitsuki、Ito Tomoyuki、Shirakashi Jun-ichi
    • Journal Title

      Journal of Applied Physics

      Volume: 122 Issue: 8 Pages: 084303-084303

    • DOI

      10.1063/1.4999831

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Wearable strain sensors based on thin graphite films for human activity monitoring2017

    • Author(s)
      Saito Takanari、Kihara Yusuke、Shirakashi Jun-ichi
    • Journal Title

      Journal of Physics: Conference Series

      Volume: 939 Pages: 012006-012006

    • DOI

      10.1088/1742-6596/939/1/012006

    • Related Report
      2017 Annual Research Report
    • Peer Reviewed
  • [Journal Article] 自然収束動作を利用したイジングコンピューティング技術の開発とFPGAへの実装2017

    • Author(s)
      木原裕介、伊藤光樹、齋藤孝成、塩村真幸、酒井正太郎、白樫淳一
    • Journal Title

      電子情報通信学会技術研究報告

      Volume: 116 Pages: 23-28

    • Related Report
      2016 Annual Research Report
  • [Journal Article] Reductive Deposition of Thin Cu Films Using Ballistic Hot Electrons as a Printing Beam2016

    • Author(s)
      R. Suda, M. Yagi, A. kojima, N. Mori, J. Shirakashi, and N. Koshida
    • Journal Title

      J. Electrochem. Soc.

      Volume: 163 Issue: 6 Pages: E162-E165

    • DOI

      10.1149/2.0921606jes

    • Related Report
      2016 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Field-Emission-Induced Electromigration Method for Precise Tuning of Electrical Properties of Ni-Based Single-Electron Transistors2015

    • Author(s)
      M. Kase, K. Okada M. Ito and J. Shirakashi
    • Journal Title

      Conference Proceedings, 2015 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

      Volume: Year 2015 Pages: 202-205

    • DOI

      10.1109/3m-nano.2015.7425487

    • Related Report
      2016 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Simultaneous Fabrication of Nanogap Electrodes Using Field-Emission-Induced Electromigration2015

    • Author(s)
      M. Ito, M. Yagi, K. Morihara and J. Shirakashi
    • Journal Title

      J. Appl. Phys.

      Volume: 118 Issue: 1 Pages: 014301-014301

    • DOI

      10.1063/1.4923411

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed
  • [Journal Article] High-Throughput Nanogap Formation by Field-Emission-Induced Electromigration2015

    • Author(s)
      M. Ito, K. Morihara, T. Toyonaka, K. Takikawa and J. Shirakashi
    • Journal Title

      J. Vac. Sci. Technol. B

      Volume: 33 Issue: 5 Pages: 051801-051801

    • DOI

      10.1116/1.4927443

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Tuning of Channel Conductance of Au Nanowires Using Ultrafast Electromigration Controlled by a Field-Programmable Gate Array2015

    • Author(s)
      Y. Katogi, Y. Kanamaru, S. Sato, T. Saito and J. Shirakashi
    • Journal Title

      Conference Proceedings, 2015 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

      Volume: Year 2015 Pages: 198-201

    • DOI

      10.1109/3m-nano.2015.7425485

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed
  • [Presentation] Local Joule Heating in Electromigrated Au Nanowires Imaged by In Situ Atomic Force Microscopy2017

    • Author(s)
      M. Yagi and J. Shirakashi
    • Organizer
      12th IEEE Nanotechnology Materials and Devices Conference (NMDC 2017), October 2-4, 2017, Singapore.
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Optimization of Experimental Parameters for Fabrication of Atomic Junctions Using Ground-State Searches of Ising Spin Computing2017

    • Author(s)
      S. Sakai, Y. Iwata, Y. Katogi, M. Shiomura, Y. Kihara, M. Ito and J. Shirakashi
    • Organizer
      17th IEEE International Conference on Nanotechnology (IEEE NANO 2017), July 25-28, 2017, Pittsburgh, PA, USA.
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Single-Electron Transistors with Electromigrated Au Nanogaps2017

    • Author(s)
      S. Tani, M. Ito, K. Minami and J. Shirakashi
    • Organizer
      2nd International Conference on Applied Surface Science (ICASS 2017), June 12-15, 2017, Dalian, China.
    • Related Report
      2017 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Feedback-Controlled Electromigration (FCE) Method with Automatically Optimized Parameters2016

    • Author(s)
      N. Numakura, Y. Iwata and J. Shirakashi
    • Organizer
      Pacific Rim Symposium on Surfaces, Coatings and Interfaces (PacSurf 2016)
    • Place of Presentation
      Hawaii, USA.
    • Year and Date
      2016-12-11
    • Related Report
      2016 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Controlled Electromigration Method for the Fabrication of Nanoscale Junction Devices2016

    • Author(s)
      J. Shirakashi
    • Organizer
      Emerging Technologies 2016
    • Place of Presentation
      Montreal, QC, Canada.
    • Year and Date
      2016-05-25
    • Related Report
      2016 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Tuning of Channel Conductance of Au Nanowires Using Ultrafast Electromigration Controlled by a Field-Programmable Gate Array2015

    • Author(s)
      Y. Katogi, Y. Kanamaru, S. Sato, T. Saito and J. Shirakashi
    • Organizer
      5th International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO 2015)
    • Place of Presentation
      Changchun, China.
    • Year and Date
      2015-10-05
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Channel Conductance of Au Nanowires Tuned by Ultrafast Electromigration Using a Field-Programmable Gate Array2015

    • Author(s)
      Y. Katogi, Y. Kanamaru, S. Sato and J. Shirakashi
    • Organizer
      10th International Conference on Surfaces, Coatings and Nanostructured Materials (NANOSMAT 2015)
    • Place of Presentation
      Manchester, UK.
    • Year and Date
      2015-09-13
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Remarks] 白樫研究室HP

    • URL

      http://web.tuat.ac.jp/~nanotech/index.htm

    • Related Report
      2017 Annual Research Report 2016 Annual Research Report 2015 Annual Research Report

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Published: 2015-04-16   Modified: 2019-03-29  

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