Multiplication process of dislocations at a crack tip revealed by using HVEM tomography.
Project/Area Number |
15H04147
|
Research Category |
Grant-in-Aid for Scientific Research (B)
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Allocation Type | Single-year Grants |
Section | 一般 |
Research Field |
Structural/Functional materials
|
Research Institution | Kyushu University |
Principal Investigator |
Tanaka Masaki 九州大学, 工学研究院, 准教授 (40452809)
|
Co-Investigator(Kenkyū-buntansha) |
森川 龍哉 九州大学, 工学研究院, 助教 (00274506)
東田 賢二 九州大学, 工学研究院, 教授 (70156561)
|
Project Period (FY) |
2015-04-01 – 2018-03-31
|
Project Status |
Completed (Fiscal Year 2017)
|
Budget Amount *help |
¥16,770,000 (Direct Cost: ¥12,900,000、Indirect Cost: ¥3,870,000)
Fiscal Year 2017: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
Fiscal Year 2016: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
Fiscal Year 2015: ¥11,310,000 (Direct Cost: ¥8,700,000、Indirect Cost: ¥2,610,000)
|
Keywords | 転位 / 破壊 / 亀裂 / 超高圧電子顕微鏡法 / 透過電子顕微鏡 / 力学特性 / 構造・機能材料 / 格子欠陥 |
Outline of Final Research Achievements |
The structure of crack tip dislocations in a micro-cantilever specimen were investigated after bending tests. The micro-cantilever was machined in a grain which is in a fully annealed high nitrogen austenitic stainless steel. A notch was introduced at the root of the cantilever by using focused ion beam, then bending load was applied at the edge of the cantilever using s nano-indenter. The state of stress at the notch tip was investigated using finite element method. High-voltage electron microscopy observation revealed dislocation arrays on the slip plane on which the resolved shear stress is the highest, and cross slip of dislocations.
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Report
(4 results)
Research Products
(9 results)