| Budget Amount *help |
¥4,810,000 (Direct Cost: ¥3,700,000、Indirect Cost: ¥1,110,000)
Fiscal Year 2018: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2017: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2016: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
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| Outline of Final Research Achievements |
Partial coherence laser interferometry is proposed as a new non-contact direct measurement method of the behavior of thin liquid film that governs the phase change characteristics of gas-liquid two-phase flow and phase change characteristics. Verification of the mechanism and the applicability to thin liquid film measurement was confirmed. The proposed method uses the phase discontinuity of the actual semiconductor laser to identify the relationship between the intensity of the interference fringes after passing through the thin film and the optical path length difference. Using this relationship, it is possible to extract not only the spatial distribution of the liquid film but also information on the absolute thickness of the liquid film. In addition, it was confirmed that non-contact measurement of liquid film behavior in high time and spatial resolution becomes possible by measurement using a high-speed camera.
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