| Project/Area Number |
17360028
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Applied optics/Quantum optical engineering
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| Research Institution | Shizuoka University |
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Principal Investigator |
KAWATA Yoshimasa Shizuoka University, Faculty of Engineering, Professor, 工学部, 教授 (70221900)
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| Co-Investigator(Kenkyū-buntansha) |
EGAMI Chikara Shizuoka University, Faculty of Engineering, Associate Professor, 工学部, 助教授 (70262798)
KANEKO Toru Shizuoka University, Faculty of Engineering, Professor, 工学部, 教授 (50293600)
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| Project Period (FY) |
2005 – 2006
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| Project Status |
Completed (Fiscal Year 2006)
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| Budget Amount *help |
¥15,600,000 (Direct Cost: ¥15,600,000)
Fiscal Year 2006: ¥4,700,000 (Direct Cost: ¥4,700,000)
Fiscal Year 2005: ¥10,900,000 (Direct Cost: ¥10,900,000)
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| Keywords | Near-field optical scanning microscope / Electron microscope / Photo-electric effect / Diffraction limit / Portein / Cell analysis / Single molecular imaging / Optical control |
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| Research Abstract |
Optical Microscopes are widely used for observing living biological specimens, since light does not damage specimens and evapolation of metal film on specimens is not required. The demand for high resolution imaging technique in optical microscopes is growing in the field of nano-biotechnology, but the resolution of conventional optical microscopes is limited by the diffraction of light.
Near-field microscope is promising technique, because it can achieve resolution higher than the diffraction limit of conventional microscopes. The small aperture is scanned near the sample surface with NSOM. The aperture is usually fabricated at the apex of a metal-coated fiber tip. The diameter of the aperture determines the resolution of the NSOM.
We have developed a near-field optical microscope (NFOM) using a near-field recording technique. In this system, the optical field distribution localized near a specimen is recorded as the topographic distribution of a photosensitive film surface. The topographical distribution is measured by high-resolution microscope such as an atomic force microscope (AFM), scanning tunneling microscope (STM), and scanning electron microscope (SEM). Using a short pulse laser as a light source, it is possible to get a snapshot of a moving specimens or sequential motions with multiple exposures.
In this research, we have developed a new type near-field microscope combined with electron microscope imaging system. In this system we used photo-electric material instead of photosensitive film. The optical field distribution localized near a specimen is converted photo-electron by the film and the photo-electron distribution is imaged with electron microscope system. As a preliminary experiment, we excited photo-electrons with evanescent wave and detected with ZnO fluorescent film. The photo-electrons emitted from photo-electric materials were accelerated wih high voltage and illuminated to ZnO fluorescent film. The fluorescent was detected.
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