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Development of non-destructive elemental-analysis technique for biological samples

Research Project

Project/Area Number 18H03471
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Review Section Basic Section 80040:Quantum beam science-related
Research InstitutionOsaka University

Principal Investigator

Abo Satoshi  大阪大学, 基礎工学研究科, 助教 (60379310)

Co-Investigator(Kenkyū-buntansha) 若家 冨士男  大阪大学, 基礎工学研究科, 准教授 (60240454)
Project Period (FY) 2018-04-01 – 2022-03-31
Project Status Completed (Fiscal Year 2021)
Budget Amount *help
¥17,420,000 (Direct Cost: ¥13,400,000、Indirect Cost: ¥4,020,000)
Fiscal Year 2021: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2020: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
Fiscal Year 2019: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2018: ¥12,220,000 (Direct Cost: ¥9,400,000、Indirect Cost: ¥2,820,000)
Keywords元素分析 / 非破壊計測 / イオンビーム分析 / 生体試料
Outline of Final Research Achievements

A non-destructive elemental-analysis technique for three-dimensional structures in biological samples with nanometer resolution has been developed. Elastic recoil detection (ERD) and Rutherford backscattering (RBS) were used simultaneously for the measurement. ERD and RBS are sensitive to light and heavy elements, respectively. Therefore, both major light elements and trace amounts of heavy elements in biological samples can be detected high sensitivity. To obtain high depth resolution, time-of-flight was used to measure the energy of scattered ions. The elemental distribution can be measured non-destructively in a short measurement time of approximately one hour by using multiple detectors.

Academic Significance and Societal Importance of the Research Achievements

イオンビームを用いた計測技術は、これまで主として半導体材料の評価に用いられてきた。本研究は、この計測技術を汎用化し、生体試料の計測を可能にすることを目的として研究を行った。構成されている元素の種類が非常に少なく、特定の元素のみを高感度に計測する半導体とは異なり、様々な元素で構成されている生体試料では軽元素から重元素までを同時に計測する必要がある。また、計測により試料構造が容易に変化する生体試料を非破壊で計測することも非常に重要である。本研究では、これらが実現可能な計測技術を開発した。

Report

(5 results)
  • 2021 Annual Research Report   Final Research Report ( PDF )
  • 2020 Annual Research Report
  • 2019 Annual Research Report
  • 2018 Annual Research Report
  • Research Products

    (14 results)

All 2020 2019 2018 Other

All Int'l Joint Research (2 results) Journal Article (3 results) (of which Int'l Joint Research: 2 results,  Peer Reviewed: 3 results) Presentation (9 results) (of which Int'l Joint Research: 5 results,  Invited: 3 results)

  • [Int'l Joint Research] マクテブルグステンダル応用科学大学(ドイツ)

    • Related Report
      2019 Annual Research Report
  • [Int'l Joint Research] マクデブルグステンダル応用科学大学(ドイツ)

    • Related Report
      2018 Annual Research Report
  • [Journal Article] Tertiary electrons in single-event time-of-flight Rutherford backscattering spectrometr2019

    • Author(s)
      S. Abo, A. Seidl, F. Wakaya, M. Takai
    • Journal Title

      Nucl. Instr. & Methods in Phys. Res. B

      Volume: 456 Pages: 12-15

    • DOI

      10.1016/j.nimb.2019.06.042

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed / Int'l Joint Research
  • [Journal Article] Simulation of fine focus time-of-flight Rutherford backscattering spectrometry using TRIM backscattering data2019

    • Author(s)
      Seidl Albert、Abo Satoshi、Takai Mikio
    • Journal Title

      Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

      Volume: 450 Pages: 163-167

    • DOI

      10.1016/j.nimb.2018.06.022

    • Related Report
      2019 Annual Research Report
    • Peer Reviewed / Int'l Joint Research
  • [Journal Article] Measurement of the Lateral Charge Distribution in Silicon Generated by High-Emergy Ion Incidence2019

    • Author(s)
      Satoshi Abo, Kenichi Tani, Fujio Wakaya, Shinobu Onoda, Yuji Miyato, Hayato Yamashita, Masayuki Abe
    • Journal Title

      Proceedings of 22nd International Conference on Ion Implantation Technology

      Volume: 印刷中

    • Related Report
      2018 Annual Research Report
    • Peer Reviewed
  • [Presentation] Lateral Charge Distribution in Si by High-Energy Ion Incidence2020

    • Author(s)
      Satoshi Abo, Kenichi Tani, Fujio Wakaya, Shinobu Onoda
    • Organizer
      30th Annual Meeting of MRS-J
    • Related Report
      2020 Annual Research Report
    • Int'l Joint Research
  • [Presentation] イオン散乱法を用いた非破壊三次元元素分析技術2020

    • Author(s)
      阿保 智, 若家 冨士男, 高井 幹夫
    • Organizer
      日本学術振興会 第158委員会 第131回研究会
    • Related Report
      2019 Annual Research Report
    • Invited
  • [Presentation] Development of ToF-RBS and -ERDA simultaneous measurements with 150 kV FIB2019

    • Author(s)
      Satoshi Abo, Takuya Fujimoto, Fujio Wakaya
    • Organizer
      24th International Conference on Ion Beam Analysis (IBA2019)
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 集束イオンビーム装置でのToF-RBSとERDAの同時計測法の開発2019

    • Author(s)
      阿保智, 藤元拓哉, 若家冨士男
    • Organizer
      第80回応用物理学会秋季学術講演会
    • Related Report
      2019 Annual Research Report
  • [Presentation] Nondestructive analysis technique by ion scattering spectroscopy using 150 kV FIB2019

    • Author(s)
      Satoshi Abo, Albert Seidl, Fujio Wakaya
    • Organizer
      29th Annual Meeting of MRS-J
    • Related Report
      2019 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] 高エネルギーイオン入射によるSiでの生成電荷分布計測(II)2019

    • Author(s)
      阿保 智、谷 憲一、若家 冨士男、小野田 忍、山下 隼人、宮戸 祐治、阿部 真之
    • Organizer
      第66回応用物理学会春季学術講演会
    • Related Report
      2018 Annual Research Report
  • [Presentation] Tertiary electrons in single-event time-of-flight Rutherford backscattering spectrometry2018

    • Author(s)
      Satoshi Abo, Albert Seidl, Fujio Wakaya, Mikio Takai
    • Organizer
      16th International Conference on Nuclear Microprobe Technology and Applications
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Measurement of charge distribution in silicon generated by high energy ion incidence2018

    • Author(s)
      Satoshi Abo, Kenichi Tani, Fujio Wakaya, Shinobu Onoda, Yuji Miyato, Hayato Yamashita, Masayuki Abe
    • Organizer
      22nd International Conference on Ion Implantation Technology
    • Related Report
      2018 Annual Research Report
    • Int'l Joint Research
  • [Presentation] シングルイベント飛行時間型ラザフォード後方散乱法による非破壊三時現元素分析技術の開発2018

    • Author(s)
      阿保 智
    • Organizer
      日本学術振興会 第132委員会 第233回研究会
    • Related Report
      2018 Annual Research Report
    • Invited

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Published: 2018-04-23   Modified: 2023-01-30  

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