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Object shape separation recognition technology based on codebook pattern processing

Research Project

Project/Area Number 19700081
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeSingle-year Grants
Research Field Media informatics/Database
Research InstitutionTohoku University

Principal Investigator

KONDA Masahiro  Tohoku University, 未来科学技術共同研究センター, 助教 (80361202)

Project Period (FY) 2007 – 2008
Project Status Completed (Fiscal Year 2008)
Budget Amount *help
¥2,470,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥270,000)
Fiscal Year 2008: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2007: ¥1,300,000 (Direct Cost: ¥1,300,000)
Keywordsベクトル量子化 / アルゴリズム / 形状認識
Research Abstract

本研究は、画像から形状の特徴を抽出する技術及びその特徴を用いた認識技術の確立を目指して実施された。例として、原子オーダで平坦化されたシリコン表面を原子間力顕微鏡で測定した画像から原子ステップとテラスを形状認識し分離するアルゴリズムについて検討した。"方向"・"大きさ"などの特徴に注目し、候補間で相関をとることが認識するには有効であることが分かった。その結果、測定された画像から原子ステップとテラスを形状認識するため基本技術が確立した。

Report

(3 results)
  • 2008 Annual Research Report   Final Research Report ( PDF )
  • 2007 Annual Research Report
  • Research Products

    (6 results)

All 2009 2008 2007

All Journal Article (2 results) (of which Peer Reviewed: 2 results) Presentation (4 results)

  • [Journal Article] Data analysis technique of atomic force microscopy for atomically flat silicon surfaces2009

    • Author(s)
      Masahiro Konda, Akinobu Teramoto, Tomoyuki Suwa, Rihito Kuroda, and Tadahiro Ohmi
    • Journal Title

      IEICE Transaction on Electronics Vol. E92-C, No.5 (to be published)

    • NAID

      10026822002

    • Related Report
      2008 Final Research Report
    • Peer Reviewed
  • [Journal Article] Data analysis technique of atomic force microscopy for atomically flat silicon surfaces2009

    • Author(s)
      譽田正宏
    • Journal Title

      IEICE Transaction on Electronics E92-C, No.5(印刷中)

    • NAID

      10026822002

    • Related Report
      2008 Annual Research Report
    • Peer Reviewed
  • [Presentation] The data analysis technique of the atomic force microscopy for the atomically flat silicon surface2008

    • Author(s)
      Masahiro Konda, Akinobu Teramoto, Tomoyuki Suwa, Rihito Kuroda and Tadahiro Ohmi
    • Organizer
      2008 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices(AWAD 2008)
    • Place of Presentation
      Sapporo
    • Year and Date
      2008-07-11
    • Related Report
      2008 Final Research Report
  • [Presentation] The data analysis technique of the atomic force microscopy for the atomically flat silicon surface2008

    • Author(s)
      譽田正宏
    • Organizer
      2008 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices
    • Place of Presentation
      札幌
    • Year and Date
      2008-07-11
    • Related Report
      2008 Annual Research Report
  • [Presentation] A Balanced Vector-Quantization Processor Eliminating Redundant Calculation for Real - Time Motion Picture Compression2007

    • Author(s)
      Masahiro Konda, Takahiro Nakayama, Naoto Miyamoto and Tadahiro Ohmi
    • Organizer
      International Conference on Field-Programmable Technology
    • Place of Presentation
      Kitakyushu
    • Year and Date
      2007-12-14
    • Related Report
      2008 Final Research Report
  • [Presentation] A Balanced Vector-Quantization Processor Eliminating Redundant Caculation for Real-Time Motion Picture Compression2007

    • Author(s)
      譽田正宏
    • Organizer
      International Conference on Field-Programmable Technology 2007
    • Place of Presentation
      北九州市(北九国際会議場)
    • Year and Date
      2007-12-13
    • Related Report
      2007 Annual Research Report

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Published: 2007-04-01   Modified: 2016-04-21  

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