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Elemental Identification of the dopant on the semiconductor surface by synchrotron-radiation-based scanning tunneling microscopy.

Research Project

Project/Area Number 19760028
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeSingle-year Grants
Research Field Thin film/Surface and interfacial physical properties
Research InstitutionInstitute for Molecular Science

Principal Investigator

TAKAGI Yasumasa  Institute for Molecular Science, 物質分子科学研究領域, 助教 (30442982)

Project Period (FY) 2007 – 2009
Project Status Completed (Fiscal Year 2009)
Budget Amount *help
¥3,770,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥570,000)
Fiscal Year 2009: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000)
Fiscal Year 2008: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2007: ¥1,300,000 (Direct Cost: ¥1,300,000)
Keywords半導体表面 / ドーパント / 元素識別 / 走査トンネル顕微鏡 / 放射光
Research Abstract

I have measured the Cu nanodomains on a Ge(111) c(2x8) surface by scanning tunneling microscopy (STM) combined with synchrotron radiation. I have gotten the atomic resolution image of the surface by STM under x-ray radiation. The signal intensity and its difference between the Cu and Ge areas increase in proportion to the induced x-ray intensity. Meanwhile, the Ge atoms move about the surface in the clean Ge(111) area under hard x-ray radiation and the c(2x8) structure on the surface breaks quickly.

Report

(4 results)
  • 2009 Annual Research Report   Final Research Report ( PDF )
  • 2008 Annual Research Report
  • 2007 Annual Research Report

Research Products

(10 results)

All 2010 2009 2008

All Journal Article (2 results) (of which Peer Reviewed: 2 results) Presentation (8 results)

  • [Journal Article] Nanoscale Elemental Identification by Synchrotron-Radiation based Scanning Tunneling Microscopy.2008

    • Author(s)
      Akira Saito、Yasumasa Takagi、Koji Takahashi、Hiromasa Hosokawa、Kazuhisa Hanai、Takehiro Tanaka、Megumi Akai-kasaya、Yoshihito Tanaka、Shik Shin、Tetsuya Ishikawa、Yuji Kuwahara、Masakazu Aono
    • Journal Title

      Surface and Interface Analysis Vol.40

      Pages: 1033-1036

    • Related Report
      2009 Final Research Report
    • Peer Reviewed
  • [Journal Article] Nanoscale Elemental Identification by Synchrotron-Radiation based Scanning Tunneling Microscopy2008

    • Author(s)
      Akira Saito
    • Journal Title

      Surface and Interface Analysis 40

      Pages: 1033-1036

    • Related Report
      2008 Annual Research Report
    • Peer Reviewed
  • [Presentation] 放射光STMによるナノスケール元素分析-元素コントラストの特性評価-2010

    • Author(s)
      野津浩史
    • Organizer
      第57回応用物理学関係連合講演会
    • Place of Presentation
      東海大学湘南キャンパス
    • Year and Date
      2010-03-17
    • Related Report
      2009 Final Research Report
  • [Presentation] 放射光STMによるナノスケール元素分析-元素コントラストの特性評価-2010

    • Author(s)
      野津浩史
    • Organizer
      第57回応用物理学関係連合講演会
    • Place of Presentation
      神奈川県平塚市 東海大学 湘南キャンパス
    • Year and Date
      2010-03-17
    • Related Report
      2009 Annual Research Report
  • [Presentation] 高輝度硬x線による固体表面の原子移動-放射光STMによる原子スケール直接観察-2010

    • Author(s)
      齋藤彰
    • Organizer
      第23回放射光学会
    • Place of Presentation
      兵庫県姫路市イーグレひめじ
    • Year and Date
      2010-01-08
    • Related Report
      2009 Final Research Report
  • [Presentation] 高輝度硬X線による固体表面の原子移動-放射光STMによる原子スケール直接観察-2010

    • Author(s)
      齋藤彰
    • Organizer
      第23回放射光学会
    • Place of Presentation
      兵庫県姫路市 イーグレひめじ
    • Year and Date
      2010-01-08
    • Related Report
      2009 Annual Research Report
  • [Presentation] 放射光STMによるナノスケール表面分析-金属-半導体界面における元素コントラストの評価-2009

    • Author(s)
      齋藤彰
    • Organizer
      第21回放射光学会
    • Place of Presentation
      東京大学本郷キャンパス
    • Year and Date
      2009-01-12
    • Related Report
      2009 Final Research Report
  • [Presentation] 放射光STMによるナノスケール表面分析-金属・半導体界面における元素コントラストの評価-2009

    • Author(s)
      齋藤彰
    • Organizer
      第21回放射光学会
    • Place of Presentation
      東京大学本郷キャンパス
    • Year and Date
      2009-01-12
    • Related Report
      2008 Annual Research Report
  • [Presentation] 放射光STMを用いたナノスケール表面分析~複数の系への適用と、諸特性の評価~2008

    • Author(s)
      齋藤彰
    • Organizer
      第21回放射光学会
    • Place of Presentation
      立命館大学びわこ草津キャンパス
    • Year and Date
      2008-01-13
    • Related Report
      2009 Final Research Report
  • [Presentation] 放射光STMを用いたナノスケール表面分析 〜複数の系への適用と、諸特性の評価〜2008

    • Author(s)
      齋藤彰
    • Organizer
      第21回放射光学会
    • Place of Presentation
      立命館大学びわこ草津キャンパス
    • Year and Date
      2008-01-13
    • Related Report
      2007 Annual Research Report

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Published: 2007-03-31   Modified: 2016-04-21  

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