Muon-induced soft error evaluation platform: future prediction based on measurement and simulation

• Project/Area Number: 19H05664
• Research Category: Grant-in-Aid for Scientific Research (S)
• Allocation Type: Single-year Grants
• Review Section: Broad Section J
• Research Institution: Kyoto University
• Principal Investigator: 橋本 昌宜 京都大学, 情報学研究科, 教授 (80335207)
• Co-Investigator(Kenkyū-buntansha): 安部 晋一郎 国立研究開発法人日本原子力研究開発機構, 原子力科学研究部門 原子力科学研究所 原子力基礎工学研究センター, 研究職 (00727373) ; 川瀬 頌一郎 九州大学, 総合理工学研究院, 助教 (10817133) ; 渡辺 幸信 九州大学, 総合理工学研究院, 教授 (30210959) ; 佐藤 朗 大阪大学, 大学院理学研究科, 助教 (40362610) ; 新倉 潤 国立研究開発法人理化学研究所, 仁科加速器科学研究センター, 協力研究員 (50644720) ; 鎌倉 良成 大阪工業大学, 情報科学部, 教授 (70294022)
• Project Period (FY): 2019-06-26 – 2024-03-31
• Project Status: Completed (Fiscal Year 2023)
• Budget Amount: ¥203,190,000 (Direct Cost: ¥156,300,000、Indirect Cost: ¥46,890,000); Fiscal Year 2023: ¥7,020,000 (Direct Cost: ¥5,400,000、Indirect Cost: ¥1,620,000); Fiscal Year 2022: ¥9,750,000 (Direct Cost: ¥7,500,000、Indirect Cost: ¥2,250,000); Fiscal Year 2021: ¥39,390,000 (Direct Cost: ¥30,300,000、Indirect Cost: ¥9,090,000); Fiscal Year 2020: ¥66,040,000 (Direct Cost: ¥50,800,000、Indirect Cost: ¥15,240,000); Fiscal Year 2019: ¥80,990,000 (Direct Cost: ¥62,300,000、Indirect Cost: ¥18,690,000)
• Keywords: ソフトエラー / ミューオン / 集積システム / VLSI / 信頼性

Outline of Research at the Start

地上に降り注ぐ二次宇宙線粒子によって生じる一過性の誤動作 (ソフトエラー)が集積システムの信頼性を決める最大要因となっている。デバイスの微細化により、ミューオンが中性子に変わってソフトエラーの主要因となるパラダイムシフトが起こり、急速にエラー率が増加する可能性がある。本研究では、集積システムの信頼性確保に向けて、ミューオン起因のソフトエラーを正しく理解・評価する技術を世界に先駆けて確立し、将来デバイスの信頼性動向を明らかにする。基礎物理現象の把握と実測結果の再現性検証によりシミュレーション技術の精度を格段に高め、将来の集積システムの信頼性確保に貢献する。

Outline of Annual Research Achievements

課題1-1では前年度までに開発した宇宙線ミューオン計測システムを用いて収集したデータに、独自に開発した運動量推定アルゴリズムを適用して、電荷別運動量分布を導出した。課題1-2では、RAL-ISIS施設において、負ミューオン捕獲反応からの粒子放出確率を測定することに成功した。ソフトエラーに影響の大きい荷電粒子の放出確率については、PHITSは実験結果を良く再現することを確認した。ミューオン原子核捕獲反応から放出される荷電粒子のエネルギー分布測定をRAL-ISIS施設で実施した。放出される荷電粒子の識別およびエネルギー測定に成功し、既存データより広いエネルギー範囲で主要な放出荷電粒子のエネルギースペクトルを取得し、解析を進めた。
課題2-1では、前年度までに開発したビット反転イベントを正確に測定する観測システムの照射実験結果の解析を進めた。これまで認識できなかったMCUパターンの観察に成功した。課題2-2では、前年度までに取得した測定結果を再現するシミュレーション体系の構築をすすめ、PHITSを用いて測定結果が良く再現できることを確認した。また、AIアクセラレータチップの信頼評価を行い、今後の高信頼設計に有益な指針を得た。
課題3では、実測物理データを用いたPHITSシミュレータの高度化を実施した。軽複合粒子生成の過小評価の改善を目的として、表面合体モデルを導入し、Meson Exchange Current（MEC）の影響を取り入れる改良を行った。
課題4では、CFETを対象に、放射線入射に起因したビット反転をシミュレーション解析し、留意すべき特徴を明らかにした。また、高エネルギーミューオンを含めた地上環境のエラーレートを求めるシミュレーションを実施した。これまでに実験してきたエネルギー範囲よりも高いエネルギーのミューオンの寄与度が大きいことを示唆する結果を得た。

Research Progress Status

令和5年度が最終年度であるため、記入しない。

Strategy for Future Research Activity

令和5年度が最終年度であるため、記入しない。

Assessment Rating

Interim Assessment Comments (Rating)

A: In light of the aim of introducing the research area into the research categories, the expected progress has been made in research.

Research Products

• [Journal Article] Impact of Irradiation Side on Muon-Induced Single-Event Upsets in 65-nm Bulk SRAMs (2024)
  • Author(s): Deng Yifan、Watanabe Yukinobu、Manabe Seiya、Liao Wang、Hashimoto Masanori、Abe Shin-Ichiro、Tampo Motonobu、Miyake Yasuhiro
  • Journal Title: IEEE Transactions on Nuclear Science Volume: 71 Issue: 4 Pages: 912-920
  • DOI: 10.1109/tns.2024.3378216
  • Peer Reviewed
• [Journal Article] Development of a Measuring Method of Cosmic-Ray Muon Momentum Distribution Using Drift Chambers (2024)
  • Author(s): Nakagami Naoto、Kamei Satoko、Kawase Shoichiro、Sato Akira、Watanabe Yukinobu
  • Journal Title: Journal of Radiation Protection and Research Volume: -
  • DOI: 10.14407/jrpr.2023.00423
  • Peer Reviewed
• [Journal Article] Effect of large-angle incidence on particle identification performance for light-charged (Z<=2) particles by pulse shape analysis with a pad-type nTD silicon detector (2024)
  • Author(s): Kawase Shoichiro、Murota Takuya、Fukuda Hiroya、Oishi Masaya、Kawata Teppei、Kitafuji Kentaro、Manabe Seiya、Watanabe Yukinobu、Nishibata Hiroki、Go Shintaro、Kai Tamito、Nagata Yuto、Muto Taiga、Ishibashi Yuichi、Niikura Megumi、Suzuki Daisuke、Matsuzaki Teiichiro、Ishida Katsuhiko、Mizuno Rurie、Kitamura Noritaka
  • Journal Title: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Volume: 1059 Pages: 168984-168984
  • DOI: 10.1016/j.nima.2023.168984
  • Peer Reviewed
• [Journal Article] How Accurately Can Soft Error Impact Be Estimated in Black-Box/White-Box Cases? -- a Case Study with an Edge AI SoC -- (2024)
  • Author(s): Q. Cheng, Q. Li, L. Lin, W. Liao, L. Dai, H. Yu, and M. Hashimoto
  • Journal Title: Proc. Design Automation Conference (DAC) Volume: -
  • Peer Reviewed / Int'l Joint Research
• [Journal Article] Stuck Errors in Bits and Blocks in GDDR6 under High-Energy Neutron Irradiation (2024)
  • Author(s): M. Yoshida, R. Iwamoto, M. Itoh, and M. Hashimoto
  • Journal Title: Proc. European Conference on Radiation and Its Effects on Components and Systems (RADECS) Volume: -
  • Peer Reviewed
• [Journal Article] Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs (2024)
  • Author(s): Y. Gomi, K. Takami, R. Mizuno, M. Niikura, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, I. Umegaki, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto
  • Journal Title: Proc. European Conference on Radiation and Its Effects on Components and Systems (RADECS) Volume: -
  • Peer Reviewed
• [Journal Article] Vulnerability Estimation of DNN Model Parameters with Few Fault Injections (2023)
  • Author(s): ZHANG Yangchao、ITSUJI Hiroaki、UEZONO Takumi、TOBA Tadanobu、HASHIMOTO Masanori
  • Journal Title: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences Volume: E106.A Issue: 3 Pages: 523-531
  • DOI: 10.1587/transfun.2022VLP0004
  • ISSN: 0916-8508, 1745-1337
  • Year and Date: 2023-03-01
  • Peer Reviewed
• [Journal Article] Reliability Exploration of System-on-Chip With Multi-Bit-Width Accelerator for Multi-Precision Deep Neural Networks (2023)
  • Author(s): Cheng Quan、Huang Mingqiang、Man Changhai、Shen Ao、Dai Liuyao、Yu Hao、Hashimoto Masanori
  • Journal Title: IEEE Transactions on Circuits and Systems I: Regular Papers Volume: 70 Issue: 10 Pages: 3978-3991
  • DOI: 10.1109/tcsi.2023.3300899
  • Peer Reviewed
• [Journal Article] Avoiding Soft Error-Induced Illegal Memory Accesses in GPU with Inter-Thread Communication (2023)
  • Author(s): R. Iwamoto and M. Hashimoto
  • Journal Title: Proc. International Symposium on On-Line Testing and Robust System Design (IOLTS) Volume: -
  • Peer Reviewed
• [Journal Article] Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons (2023)
  • Author(s): Takami Kazusa、Gomi Yuibi、Abe Shin-Ichiro、Liao Wang、Manabe Seiya、Matsumoto Tetsuro、Hashimoto Masanori
  • Journal Title: Proceedings of International Symposium on Reliability Physics (IRPS) Volume: - Pages: 1-6
  • DOI: 10.1109/irps48203.2023.10118134
  • Peer Reviewed
• [Journal Article] Emissions of Hydrogen Isotopes from the Nuclear Muon Capture Reaction in ^natSi (2023)
  • Author(s): Manabe Seiya、Watanabe Yukinobu、Niikura Megumi、Nakano Keita、Nakano Keita、Saito Takeshi Y.、Suzuki Daisuke、Kawashima Yoshitaka、Tomono Dai、Sato Akira、Harano Hideki
  • Journal Title: EPJ Web of Conferences Volume: 284 Pages: 01029-01029
  • DOI: 10.1051/epjconf/202328401029
  • Peer Reviewed
• [Journal Article] Development of a counter telescope for light charged particles emitted from muon capture reaction in Si (2022)
  • Author(s): H. Fukuda, S. Kawase, Y. Watanabe, M. OISHI, T. KAWATA, H. NISHIBATA, S. GO, M. NIIKURA, D. SUZUKI, and S. MANABE
  • Journal Title: Proceedings of the 2021 Symposium on Nuclear Data Volume: -
  • Peer Reviewed
• [Journal Article] Constructing Application-level GPU Error Rate Model with Neutron Irradiation Experiment (2022)
  • Author(s): Ito Kojiro、Itsuji Hiroaki、Uezono Takumi、Toba Tadanobu、Itoh Masatoshi、Hashimoto Masanori
  • Journal Title: Proc. European Conference on Radiation and Its Effects on Components and Systems (RADECS) Volume: -
  • DOI: 10.1109/radecs55911.2022.10412577
  • Peer Reviewed
• [Journal Article] Neutron-Induced Stuck Error Bits and Their Recovery in DRAMs on GPU Cards (2022)
  • Author(s): M. Hashimoto,Y. Zhang,K. Ito
  • Journal Title: Proceedings of International Conference on Solid State Devices and Materials (SSDM) Volume: -
  • Peer Reviewed
• [Journal Article] Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: From Bit Upset to SEFI and Erroneous Behavior (2022)
  • Author(s): Tanaka Tomonari、Liao Wang、Hashimoto Masanori、Mitsuyama Yukio
  • Journal Title: IEEE Transactions on Nuclear Science Volume: 69 Issue: 1 Pages: 35-42
  • DOI: 10.1109/tns.2021.3131346
  • Peer Reviewed
• [Journal Article] Estimating Vulnerability of All Model Parameters in DNN with a Small Number of Fault Injections (2022)
  • Author(s): Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto
  • Journal Title: Proceedings of Design, Automation and Test in Europe Conference (DATE) Volume: - Pages: 60-63
  • DOI: 10.23919/date54114.2022.9774569
  • Peer Reviewed
• [Journal Article] Analyzing DUE Errors on GPUs With Neutron Irradiation Test and Fault Injection to Control Flow (2021)
  • Author(s): Ito Kojiro、Zhang Yangchao、Itsuji Hiroaki、Uezono Takumi、Toba Tadanobu、Hashimoto Masanori
  • Journal Title: IEEE Transactions on Nuclear Science Volume: 68 Issue: 8 Pages: 1668-1674
  • DOI: 10.1109/tns.2021.3098845
• [Journal Article] Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles (2021)
  • Author(s): T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake
  • Journal Title: IEEE Transactions on Nuclear Science Volume: 68 Issue: 7 Pages: 1436-1444
  • DOI: 10.1109/tns.2021.3082559
  • Peer Reviewed / Open Access
• [Journal Article] Processor SER Estimation with ACE Bit Analysis (2021)
  • Author(s): T. Hsu, D. Yang, W. Liao, M. Itoh, M. Hashimoto, and J. Liou
  • Journal Title: Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) Volume: - Pages: 1-5
  • DOI: 10.1109/radecs53308.2021.9954474
  • Peer Reviewed / Int'l Joint Research
• [Journal Article] Irradiation Test of 65-nm Bulk SRAMs With DC Muon Beam at RCNP-MuSIC Facility (2020)
  • Author(s): Mahara Takumi、Manabe Seiya、Watanabe Yukinobu、Liao Wang、Hashimoto Masanori、Saito Takeshi Y.、Niikura Megumi、Ninomiya Kazuhiko、Tomono Dai、Sato Akira
  • Journal Title: IEEE Transactions on Nuclear Science Volume: 67 Issue: 7 Pages: 1555-1559
  • DOI: 10.1109/tns.2020.2972022
  • Peer Reviewed
• [Journal Article] Impact of the Angle of Incidence on Negative Muon-Induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMs (2020)
  • Author(s): Liao Wang、Hashimoto Masanori、Manabe Seiya、Watanabe Yukinobu、Abe Shin-ichiro、Tampo Motonobu、Takeshita Soshi、Miyake Yasuhiro
  • Journal Title: IEEE Transactions on Nuclear Science Volume: 67 Issue: 7 Pages: 1566-1572
  • DOI: 10.1109/tns.2020.2976125
  • Peer Reviewed / Open Access
• [Journal Article] Measurement of Single-Event Upsets in 65-nm SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF (2020)
  • Author(s): J. Kuroda, S. Manabe, Y. Watanabe, K. Ito, W. Liao, M. Hashimoto, S. Abe, M. Harada, K. Oikawa, and Y. Miyake
  • Journal Title: IEEE Transactions on Nuclear Science Volume: 67 Pages: 1599-1605
  • DOI: 10.1109/tns.2020.2978257
  • Peer Reviewed
• [Journal Article] Concurrent Detection of Failures in GPU Control Logic for Reliable Parallel Computing (2020)
  • Author(s): H. Itsuji, T. Uezono, T. Toba, K. Ito, and M. Hashimoto
  • Journal Title: Proceedings of International Test Conference (ITC) Volume: - Pages: 1-5
  • DOI: 10.1109/itc44778.2020.9325216
  • Peer Reviewed
• [Journal Article] Fault Mode Analysis of Neural Network-Based Object Detection on GPUs with Neutron Irradiation Test (2020)
  • Author(s): Y. Zhang, K. Ito, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto
  • Journal Title: Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) Volume: - Pages: 1-3
  • DOI: 10.1109/radecs50773.2020.9857684
  • Peer Reviewed
• [Journal Article] Development of A Measurement System for Low Energy Cosmic Muon with Charge Identification Feature (2020)
  • Author(s): Satoko Kamei, Akira Sato, Shoichiro Kawase, Tadahiro Kin, Misaki Saitsu, Ryohei Takahashi, and Yukinobu Watanabe
  • Journal Title: Proceedings of 22nd Cross Straits Symposium on Energy and Environmental Science and Technology Volume: -
• [Journal Article] Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets (2020)
  • Author(s): S. Abe, T. Sato, J. Kuroda, S. Manabe, Y. Watanabe, W. Liao, K. Ito, M. Hashimoto, M. Harada, K. Oikawa, and Y. Miyake
  • Journal Title: Proceedings of International Symposium on Reliability Physics (IRPS) Volume: - Pages: 1-7
  • DOI: 10.1109/irps45951.2020.9128951
  • Peer Reviewed
• [Journal Article] Characterizing Energetic Dependence of Low-Energy Neutron-Induced MCUs in 65 nm Bulk SRAMs (2020)
  • Author(s): W. Liao, K. Ito, Y. Mitsuyama, and M. Hashimoto
  • Journal Title: Proceedings of International Reliability Physics Symposium (IRPS) Volume: - Pages: 1-5
  • DOI: 10.1109/irps45951.2020.9129621
  • Peer Reviewed
• [Journal Article] Soft Error and Its Countermeasures in Terrestrial Environment (2020)
  • Author(s): Hashimoto Masanori、Liao Wang
  • Journal Title: Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC) Volume: - Pages: 617-622
  • DOI: 10.1109/asp-dac47756.2020.9045161
• [Journal Article] When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies (2020)
  • Author(s): Yan Zheyu、Shi Yiyu、Liao Wang、Hashimoto Masanori、Zhou Xichuan、Zhuo Cheng
  • Journal Title: Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC) Volume: - Pages: 163-168
  • DOI: 10.1109/asp-dac47756.2020.9045134
  • Peer Reviewed
• [Presentation] In-beam activation measurement of muon nuclear capture reaction on Si isotopes (2024)
  • Author(s): R. Mizuno
  • Organizer: Workshop on frontier nuclear studies with gamma-ray spectrometer arrays (gamma24)
  • Int'l Joint Research
• [Presentation] Toward Robust Neural Network Computation on Emerging Crossbar-based Hardware and Digital Systems (2024)
  • Author(s): M. Hashimoto
  • Organizer: ASP-DAC
  • Int'l Joint Research / Invited
• [Presentation] Muon nuclear capture reaction on 28,29,30Si (2023)
  • Author(s): R. Mizuno
  • Organizer: Fall meeting of APS DNP and JPS
  • Int'l Joint Research
• [Presentation] TCAD Simulation Study of Sigle-Event Transient in CFET Latch Circuit (2023)
  • Author(s): T. Matsui
  • Organizer: International Meeting for Future of Electron Devices, Kansai (IMFEDK)
  • Int'l Joint Research
• [Presentation] Nuclear physics for muon-induced soft error (2023)
  • Author(s): M. Niikura
  • Organizer: Workshop for Computational Technique for Negative Muon Spectroscopy and Elemental Analysis
  • Int'l Joint Research
• [Presentation] Development of a measuring method of cosmic-ray muon momentum distribution using drift chambers (2023)
  • Author(s): N. Nakagami
  • Organizer: International Symposium on Radiation Safety and Detection Technology (ISORD-11)
  • Int'l Joint Research
• [Presentation] Study of muon capture reaction on Si via in-beam muon activation (2023)
  • Author(s): R. Mizuno
  • Organizer: Advances in Radioactive Isotope Science (ARIS)
  • Int'l Joint Research
• [Presentation] Measurement of nuclear transmutation via muon capture rection for Si isotopes (2023)
  • Author(s): R. Mizuno
  • Organizer: Topical Workshops on Modern Aspects of Nuclear Structure
  • Int'l Joint Research
• [Presentation] Estimation of SPICE Parameters for MOSFETs with CNN Regression (2022)
  • Author(s): K. Akazawa
  • Organizer: International Meeting for Future of Electron Devices, Kansai
  • Int'l Joint Research
• [Presentation] Measurement of muon-induced nuclear transmutation for Si isotopes (2022)
  • Author(s): R. Mizuno
  • Organizer: Trans-scale Quantum Science Institute
  • Int'l Joint Research
• [Presentation] Terrestrial Cosmic-Ray SEE testing (2022)
  • Author(s): M. Hashimoto
  • Organizer: RADNEXT facility webinar
  • Int'l Joint Research / Invited
• [Presentation] ミュオン起因半導体ソフトエラーの評価と課題 (2022)
  • Author(s): 橋本昌宜
  • Organizer: 中間子科学の将来討論会
  • Invited
• [Presentation] ミュオン起因ソフトエラーの測定と課題 (2022)
  • Author(s): 橋本昌宜
  • Organizer: 原子力学会
  • Invited
• [Presentation] Toward Correct Understanding and Characterization of Cosmic Ray-induced Soft Errors (2022)
  • Author(s): M. Hashimoto
  • Organizer: International Test Conference in Asia (ITC-Asia)
  • Int'l Joint Research / Invited
• [Presentation] ミューオン起因半導体ソフトエラーの測定と課題 (2022)
  • Author(s): 橋本昌宜
  • Organizer: RCNP研究会
  • Invited
• [Presentation] RISC-Vプロセッサに対するフォールトインジェクション実験の結果分析 (2021)
  • Author(s): 田上凱斗, 橋本昌宜
  • Organizer: 情報処理学会DAシンポジウム
• [Presentation] Applications outside particle physics (soft error) (2021)
  • Author(s): M. Hashimoto
  • Organizer: ILC Workshop on Potential ILC Experiments (ILCX)
  • Int'l Joint Research / Invited
• [Presentation] 負ミューオンを用いた原子核構造研究 (2021)
  • Author(s): 新倉潤
  • Organizer: RCNPでの次期計画検討会
  • Invited
• [Presentation] 電荷識別型低エネルギー宇宙線ミュオン計測システムの開発 (2021)
  • Author(s): 亀井 智子，川瀬 頌一郎，佐藤 朗，田中裕貴，中上直人，金 政浩，渡辺 幸信
  • Organizer: 第82回応用物理学会秋季学術講演会
• [Presentation] 宇宙線ミュオン起因半導体ソフトエラー率の評価に向けた取り組み (2021)
  • Author(s): 渡辺 幸信
  • Organizer: 令和3年度J-PARC MLF産業利用報告会
  • Invited
• [Presentation] 半導体デバイスの宇宙線起因ソフトエラー解析 (2021)
  • Author(s): 渡辺幸信
  • Organizer: 耐放射線デバイス研究会
  • Invited
• [Presentation] 半導体デバイスに対する宇宙線起因ソフトエラー研究の現状と展望 (2021)
  • Author(s): 渡辺 幸信
  • Organizer: 12回半導体材料・デバイスフォーラム
  • Invited
• [Presentation] 半導体デバイスにおける宇宙線ミュオン起因ソフトエラー発生率評価に向けたミュオン原子核捕獲反応 測定計画 (1) 概要 (2021)
  • Author(s): 川瀬頌一郎、福田宏哉、渡辺幸信、新倉潤、橋本昌宜
  • Organizer: 日本原子力学会2021年秋の大会
• [Presentation] 半導体デバイスにおける宇宙線ミュオン起因ソフトエラー発生率評価に向けたミュオン原子核捕獲反応 測定計画 (2) 荷電粒子計測システムの開発 (2021)
  • Author(s): 福田宏哉、川瀬頌一郎、渡辺幸信、大石将也、川田哲平、郷慎太郎、西畑洸希、新倉潤、鈴木大介、真鍋征也
  • Organizer: 日本原子力学会2021年秋の大会
• [Presentation] Development of counter telescopes for light charged particles emitted from muon nuclear reaction on Si (2021)
  • Author(s): Hiroya Fukuda, Shoichiro Kawase, Yukinobu Watanabe, Masaya Oishi, Teppei Kawata, Shintaro Go, Hiroki Nisibata, Megumi Niikura, Daisuke Suzuki, Seiya Manabe
  • Organizer: 2021年核データ研究会
• [Presentation] Siミューオン原子核反応の測定計画 (2021)
  • Author(s): 川瀬頌一郎
  • Organizer: RCNP研究会
• [Presentation] 機械学習を用いた極微細MOSFETの電気特性およびパラメータの推定 (2021)
  • Author(s): 赤澤 光平，仲西唯吾，鈴木悠平，鎌倉良成
  • Organizer: 電子情報通信学会SDM研究会
• [Presentation] Analyzing DUE Errors with Neutron Irradiation Test and Fault Injection to Control Flow (2020)
  • Author(s): K. Ito, Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto
  • Organizer: European Conference on Radiation and Its Effects on Components and Systems (RADECS)
  • Int'l Joint Research
• [Presentation] Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha-Particles (2020)
  • Author(s): T. Kato, M. Tampo, S. Takeshita, Y. Miyake, H Tanaka, and M. Hashimoto
  • Organizer: Nuclear and Space Radiation Effects Conference (NSREC)
  • Int'l Joint Research
• [Presentation] ntD-Si検出器を用いた波形解析による荷電粒子計測システムの開発 (2020)
  • Author(s): 室田 拓哉，川瀬 頌一郎 、真鍋 征也、渡辺 幸信、福田 宏哉、田村 幸大、 新倉 潤 、郷 慎太郎
  • Organizer: 日本原子力学会2020年秋の大会学生ポスターセッション
• [Presentation] nTD-Si検出器を用いた波形解析による粒子弁別可能な荷電粒子計測システムの開発 (2020)
  • Author(s): 室田 拓哉, 川瀬 頌一郎, 渡辺 幸信, 真鍋 征也, 福田 宏哉, 西津 美咲, 田中 裕貴, 田村 幸大, 郷 慎太郎, 甲斐 民人, 永田 優斗, 新倉 潤, 北村 徳隆, 水野 るり恵
  • Organizer: 日本原子力学会九州支部第40回研究発表講演会
• [Presentation] Soft Error and Its Countermeasures in Terrestrial Environment (2020)
  • Author(s): 橋本昌宜
  • Organizer: Asia and South Pacific Design Automation Conference (ASP-DAC)
  • Int'l Joint Research / Invited
• [Presentation] ミュオン起因半導体ソフトエラーの測定と分析 (2019)
  • Author(s): 橋本昌宜
  • Organizer: J-PARC MLF 産業利用報告会
  • Invited
• [Presentation] 宇宙線起因ソフトエラーの測定と解析 (2019)
  • Author(s): 橋本昌宜
  • Organizer: 応用物理学会シリコンテクノロジー分科会
  • Invited