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Estimation Method of Unvertainty on Nanometer Three Dimensional Measurement

Research Project

Project/Area Number 22246016
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section一般
Research Field Production engineering/Processing studies
Research InstitutionThe University of Tokyo

Principal Investigator

TAKAMASU Kiyoshi  東京大学, 工学(系)研究科(研究院), 教授 (70154896)

Co-Investigator(Kenkyū-buntansha) TAKAHASHI Satoru  東京大学, 大学院工学系研究科, 教授 (30283724)
MATSUMOTO Hirokazu  東京大学, 大学院工学系研究科, 教授 (00358045)
Co-Investigator(Renkei-kenkyūsha) FURUTANI Ryoshu  東京電機大学, 工学部, 教授 (50219119)
MISUMI Ichiko  独立行政法人産業技術総合研究所, 計測標準研究部門, 主任研究員 (40358099)
SATO Osamu  独立行政法人産業技術総合研究所, 計測標準研究部門, 研究員 (60392619)
Project Period (FY) 2010-04-01 – 2015-03-31
Project Status Completed (Fiscal Year 2014)
Budget Amount *help
¥28,730,000 (Direct Cost: ¥22,100,000、Indirect Cost: ¥6,630,000)
Fiscal Year 2013: ¥6,630,000 (Direct Cost: ¥5,100,000、Indirect Cost: ¥1,530,000)
Fiscal Year 2012: ¥7,150,000 (Direct Cost: ¥5,500,000、Indirect Cost: ¥1,650,000)
Fiscal Year 2011: ¥6,890,000 (Direct Cost: ¥5,300,000、Indirect Cost: ¥1,590,000)
Fiscal Year 2010: ¥8,060,000 (Direct Cost: ¥6,200,000、Indirect Cost: ¥1,860,000)
Keywordsナノメートル計測 / 三次元計測 / 不確かさ推定 / 形状測定
Outline of Final Research Achievements

We conducted four research tasks shown below for uncertainty systematization of the nanometer three dimensional measurement in nanoscale production system, and systematized the uncertainty estimation technique.
(1) In the theory of the uncertainty of nanometer three dimensional measurement, we developed the software which estimates uncertainty by propagation from the kinematic errors of a measuring machine, and checked the validity of the estimation. (2) In optical nanometer three dimensional form measurement, we developed the aspheric surface measurement technique in which we used the angle sensor, and performed the uncertainty estimation. (3) In the standard development for nanoscale, we carried out three dimensional form measurement of the semiconductor structure of using Si lattice as a scale. (4) In the pulse interferometer by an optical comb, we built the pulse interferometer and performed accuracy evaluation of the coordinate measuring machine.

Report

(5 results)
  • 2014 Final Research Report ( PDF )
  • 2013 Annual Research Report
  • 2012 Annual Research Report
  • 2011 Annual Research Report
  • 2010 Annual Research Report

Research Products

(97 results)

All 2014 2013 2012 2011 2010 Other

All Journal Article (32 results) (of which Peer Reviewed: 32 results) Presentation (59 results) (of which Invited: 13 results) Book (2 results) Remarks (4 results)

  • [Journal Article] Study on Improvement Methods of CMM (Coordinate Measuring Machine) in Workshop Environment2013

    • Author(s)
      大西徹,中西正一,高増潔
    • Journal Title

      Journal of the Japan Society for Precision Engineering

      Volume: 79 Issue: 4 Pages: 338-343

    • DOI

      10.2493/jjspe.79.338

    • NAID

      130004513541

    • ISSN
      0912-0289, 1882-675X
    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Study on nano thickness inspection for residual layer of nanoimprint lithography using near-field optical enhancement of metal tip2013

    • Author(s)
      S. Takahashi, Y. Ikeda, K. Takamasu
    • Journal Title

      CIRP Annals

      Volume: 62 Pages: 527-530

    • DOI

      10.1016/j.cirp.2013.03.020

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Random error analysis of profile measurement of large aspheric optical surface using scanning deflectometry with rotation stage Original Research Article2013

    • Author(s)
      Muzheng Xiao, Tomohiko Takamura, Satoru Takahashi, Kiyoshi Takamasu
    • Journal Title

      Precision Engineering 37, No.3 (2013)

      Volume: 37 Pages: 599-605

    • DOI

      10.1016/j.precisioneng.2013.01.005

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Spatial positioning measurements up to 150 m using temporal coherence of optical frequency comb Original Research Article2013

    • Author(s)
      Xiaonan Wang, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Journal Title

      Precision Engineering

      Volume: 37 Pages: 635-639

    • DOI

      10.1016/j.precisioneng.2013.01.008

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] A study of the possibility of using an adjacent pulse repetition interval length as a scale using a Helium-Neon interferometer Original Research Article2013

    • Author(s)
      Dong Wei, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Journal Title

      Precision Engineering

      Volume: 37 Pages: 694-698

    • DOI

      10.1016/j.precisioneng.2013.02.001

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Temporal coherence shaping based on spectral-domain destructive interference of pulses with different self-phase modulations2013

    • Author(s)
      D. Wei, K. Takamasu, H. Matsumoto
    • Journal Title

      Journal of the European Optical Society

      Volume: 8 Pages: 130181-6

    • DOI

      10.2971/jeos.2013.13018

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Synthetic adjacent pulse repetition interval length method to solve integer ambiguity problem: theoretical analysis2013

    • Author(s)
      D. Wei, K. Takamasu, H. Matsumoto
    • Journal Title

      Journal of the European Optical Society

      Volume: 8 Pages: 130161-6

    • DOI

      10.2971/jeos.2013.13016

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Influence of standing wave phase error on super-resolution optical inspection for periodic microstructures2012

    • Author(s)
      R. Kudo, S. Usuki, S. Takahashi, K. Takamasu
    • Journal Title

      Meas. Sci. Technol

      Volume: 23 Pages: 0540071-13

    • DOI

      10.1088/0957-0233/23/5/054007

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Remote Internal Diameter Measurement of Ring Gauge based on a Low-coherence Tandem Scheme2012

    • Author(s)
      Dong Wei, Nan Wu, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Journal Title

      Key Engineering Materials

      Volume: 516 Pages: 533-538

    • DOI

      10.4028/www.scientific.net/kem.516.533

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Submicrometer thickness layer fabrication for layer-by-layer microstereolithography using evanescent light2012

    • Author(s)
      S. Takahashi, Y. Kajihara, K. Takamasu
    • Journal Title

      Annals of the CIRP

      Volume: 61 Pages: 219-222

    • DOI

      10.1016/j.cirp.2012.03.069

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Height measurement of single nanoparticles based on evanescent field modulation2012

    • Author(s)
      Takayuki Kurihara, Ryuichi Sugimoto, Ryota Kudo, S. Takahashi, K. Takamasu
    • Journal Title

      International Journal of Nanomanufacturing

      Volume: 8 Pages: 419-430

    • DOI

      10.1504/ijnm.2012.051105

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Absolute measurement of gauge block without wringing using tandem low-coherence interferometry2012

    • Author(s)
      AgustinusWinarno, Satoru Takahashi, AkikoHirai, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Journal Title

      Meas. Sci. Technol

      Volume: 23 Pages: 1250011-8

    • DOI

      10.1088/0957-0233/23/12/125001

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Fundamental study on nanoremoval processing method for microplastic structures using photocatalyzed oxidation2012

    • Author(s)
      Takahiro Sekino, Satoru Takahashi, Kiyoshi Takamasu
    • Journal Title

      Key Engineering Materials

      Volume: 523-524 Pages: 610-614

    • DOI

      10.4028/www.scientific.net/kem.523-524.610

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] New Non-contact Measurement of Small Inside-diameter Using Tandem Low-coherence Interferometer and Optical Fiber Devices2012

    • Author(s)
      Kenta Matsui, Hirokazu Matsumoto, Satoru Takahashi, Kiyoshi Takamasu
    • Journal Title

      Key Engineering Materials

      Volume: 523-524 Pages: 871-876

    • DOI

      10.4028/www.scientific.net/kem.523-524.871

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Development of a non-contact precision measurement technique using optical frequency combs2012

    • Author(s)
      Taro Onoe, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Journal Title

      Key Engineering Materials

      Volume: 523-524 Pages: 877-882

    • DOI

      10.4028/www.scientific.net/kem.523-524.877

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Sub-Nanometer Line Width and Line Profile Measurement Using STEM Images with Metal Coating2012

    • Author(s)
      Haruki Okito, Satoru Takahashi, Kiyoshi Takamasu
    • Journal Title

      Key Engineering Materials

      Volume: 523-524 Pages: 957-960

    • DOI

      10.4028/www.scientific.net/kem.523-524.957

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Space position measurement using long-path heterodyne interferometer with optical frequency comb2012

    • Author(s)
      Xiaonan Wang, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Journal Title

      Optics Express

      Volume: 20 Pages: 2725-2732

    • DOI

      10.1364/oe.20.002725

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Nanometer profile measurement of large aspheric optical surface by scanning deflectometry with rotatable devices: Uncertainty propagation analysis and experiments2012

    • Author(s)
      Muzheng Xiao, Satomi Jujo, Satoru Takahashi, Kiyoshi Takamasu
    • Journal Title

      Precision Engineering

      Volume: 36 Pages: 91-96

    • DOI

      10.1016/j.precisioneng.2011.07.012

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Absolute Measurement of Baselines up to 403 m Using Heterodyne Temporal Coherence Interferometer with Optical Frequency Comb2012

    • Author(s)
      Hirokazu Matsumoto, Xiaonan Wang, Kiyoshi Takamasu, Tomohiro Aoto
    • Journal Title

      Appl. Phys. Express

      Volume: 5 Issue: 4 Pages: 046601-046601

    • DOI

      10.1143/apex.5.046601

    • NAID

      210000015496

    • ISSN
      1882-0778, 1882-0786
    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Absolute Measurement of Baselines up to 403 m Using Heterodyne Temporal Coherence Interferometer with Optical Frequency Comb2012

    • Author(s)
      Narin Chanthawong ,Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Journal Title

      MEASUREMENT SCIENCE AND TECHNOLOGY

      Volume: 23 Pages: 0540031-6

    • DOI

      10.1088/0957-0233/23/5/054003

    • NAID

      10030593263

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Development of high-precision micro-coordinate measuring machine: Multi-probe measurement system for measuring yaw and straightness motion error of XY linear stage2011

    • Author(s)
      Ping Yang, Tomohiko Takamura, Satoru Takahashi, Kiyoshi Takamasu, Osamu Sato, Sonko Osawa, Toshiyuki Takatsuji
    • Journal Title

      Precision Engineering

      Volume: 35 Pages: 424-430

    • DOI

      10.1016/j.precisioneng.2011.01.004

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Super resolution optical measurements of nanodefects on Si wafer surface using infrared standing evanescent wave2011

    • Author(s)
      S. Takahashi, R. Kudo, S. Usuki, K. Takamasu
    • Journal Title

      CIRP Annals

      Volume: 60 Pages: 523-526

    • DOI

      10.1016/j.cirp.2011.03.053

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Multi-probe scanning system comprising three laser interferometers and one autocollimator for measuring flat bar mirror profile with nanometer accuracy2011

    • Author(s)
      Ping Yang, Tomohiko Takamura, Satoru Takahashi, Kiyoshi Takamasu, Osamu Sato, Sonko Osawa, Toshiyuki Takatsuji
    • Journal Title

      Precision Engineering

      Volume: 35 Pages: 686-692

    • DOI

      10.1016/j.precisioneng.2011.05.001

    • Related Report
      2011 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Simulation-Based Analysis of Influence of Error on Super-Resolution Optical Inspection2011

    • Author(s)
      Ryota Kudo, Shin Usuki, Satoru Takahashi, Kiyoshi Takamasu
    • Journal Title

      Int.J.of Automation Technology

      Volume: 5(2) Pages: 167-172

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Theoretical Analysis of Length Measurement Using Interference of Multiple Pulse Trains of a Femtosecond Optical Frequency Comb2011

    • Author(s)
      Dong Wei, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 50(2)

    • NAID

      40018283309

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Time-of-flight method using multiple pulse train interference as a time recorder2011

    • Author(s)
      Dong Wei, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Journal Title

      Optics Express

      Volume: 19(6) Pages: 4881-4889

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] 現場環境における三次元測定機の高度化に関する研究(第3報)-低熱膨張ブロックゲージを用いた温度補正の評価-2010

    • Author(s)
      大西徹, 高瀬省徳, 高増潔
    • Journal Title

      精密工学会誌

      Volume: 76(5) Pages: 541-545

    • NAID

      130000421822

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Uncertainty Estimation in Intelligent Coordinate and Profile Measurement2010

    • Author(s)
      Kiyoshi Takamasu, Satoru Takahashi, Xin Chen
    • Journal Title

      Key Engineering Materials

      Volume: 447-448 Pages: 564-568

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] A Multi-probe Measurement Method to Evaluate the Yaw and Straightness Errors of XY Stage on High Precision CMM2010

    • Author(s)
      Ping Yang, Shusaku Shibata, Satoru Takahashi, Kiyoshi Takamasu, Osamu Sato, Sonko Osawa, Toshiyuki Takatsuji
    • Journal Title

      Key Engineering Materials

      Volume: 447-448 Pages: 590-594

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Profile Measurement of Large Aspheric Optical Surface by Scanning Deflectometry with Rotatable Optical Devices-Error Analysis and Pre-experiment-2010

    • Author(s)
      Muzheng Xiao, Satomi Jujo, Satoru Takahashi, Kiyoshi Takamasu
    • Journal Title

      Key Engineering Materials

      Volume: 447-448 Pages: 604-608

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] A novel resist surface profilometer for next-generation photolithography using mechano-optical arrayed probe system2010

    • Author(s)
      S.Takahashi, K.Watanabe, K.Takamasu
    • Journal Title

      CIRP Annals-Manufacturing Technology

      Volume: 59 Pages: 521-524

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Development of In-process Visualization System for Laser-assisted Three-dimensional Microfabrication using Photocatalyst Nanoparticles2010

    • Author(s)
      Keisuke Matsuda, Satoru Takahashi, Kiyoshi Takamasu
    • Journal Title

      International Journal of Precision Engineering and Manufacturing

      Volume: 11(6) Pages: 811-815

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Presentation] Roughness and Line Profile Measurement of Photoresist and FinFET Features by Cross-Section STEM Image for Reference Metrology2014

    • Author(s)
      Kiyoshi Takamasu, Haruki Okitou, Satoru Takahashi, Mitsuru Konno, Osamu Inoue, Hiroki Kawada:
    • Organizer
      SPIE Advanced Lithography 2014, San Jose, USA, 2014年2月24日~27日
    • Place of Presentation
      San Jose, USA
    • Related Report
      2013 Annual Research Report
  • [Presentation] 三次元座標測定機の基礎2014

    • Author(s)
      高増潔
    • Organizer
      NMIJ計測クラブ CMMユーザーズクラブ講演会,東京大学
    • Place of Presentation
      東京大学,東京
    • Related Report
      2013 Annual Research Report
    • Invited
  • [Presentation] Experimental Analysis of Laser-Assisted Microfabrication Using TiO2 Nanoparticles2013

    • Author(s)
      H. Yoshigoe, S. Takahashi, K. Takamasu
    • Organizer
      Proceedings of the 13th euspen International Conference, Berlin, Germany, 2013年5月28日~30日
    • Place of Presentation
      Berlin, Germany
    • Related Report
      2013 Annual Research Report
  • [Presentation] Study on Lateral Resolution Improvement of Laser-Scanning Imaging for Nano Defects Inspection2013

    • Author(s)
      Hiroki Yokozeki, Ryota Kudo, Satoru Takahashi, Kiyoshi Takamasu
    • Organizer
      ISMTII2013, The 11thinternational Symposium of Measurement Technology and Intelligent Instruments, 2013年7月1日~5日,Aachen, Germany
    • Place of Presentation
      Aachen, Germany
    • Related Report
      2013 Annual Research Report
  • [Presentation] Nanometer Profile Measurement on Large Aspheric Optical Surface by Scanning Deflectometry with Rotatable Autocollimator -Error Analysis and Measurement Experiments by Using Autocollimator with Wide Measuring Range-2013

    • Author(s)
      Kyohei Ishikawa, Tomohiko Takamura, Muzheng Xiao, Satoru Takahashi, Kiyoshi Takamasu
    • Organizer
      ISMTII2013, The 11thinternational Symposium of Measurement Technology and Intelligent Instruments, 2013年7月1日~5日,Aachen, Germany
    • Place of Presentation
      Aachen, Germany
    • Related Report
      2013 Annual Research Report
  • [Presentation] System Using Evanescent Light and Propagating Light for High Throughput Fabrication,2013

    • Author(s)
      K. Miyakawa, R. Matsuzawa, S. Takahashi, K. Takamasu:
    • Organizer
      ASPE2013, St. Paul, Minnesota, USA, 2013,2013年10月20日~25日
    • Place of Presentation
      St. Paul, Minnesota, USA
    • Related Report
      2013 Annual Research Report
  • [Presentation] Non-contact precision distance measurement technique using two optical frequency combs2013

    • Author(s)
      Taro Onoe, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Organizer
      ASPEN2013, 5th International Conference of Asian Society for Precision Engineering and Nanotechnology, Taipei, Taiwan 2013年11月12日~15日
    • Place of Presentation
      Taipei, Taiwan
    • Related Report
      2013 Annual Research Report
  • [Presentation] High-accuracy calibration of CMM using temporal-coherence fiber interferometer with fast-repetition comb laser2013

    • Author(s)
      Narin Chanthawong, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Organizer
      ASPEN2013, 5th International Conference of Asian Society for Precision Engineering and Nanotechnology, Taipei, Taiwan 2013年11月12日~15日
    • Place of Presentation
      Taipei, Taiwan
    • Related Report
      2013 Annual Research Report
  • [Presentation] Study on Photocatalyzed Nano-removal Processing Tool for Microstereolithography2013

    • Author(s)
      Yuki Yamaguchi, Takahiro Sekino, Satoru Takahashi, Kiyoshi Takamasu
    • Organizer
      ASPEN2013, 5th International Conference of Asian Society for Precision Engineering and Nanotechnology, Taipei, Taiwan 2013年11月12日~15日
    • Place of Presentation
      Taipei, Taiwan
    • Related Report
      2013 Annual Research Report
  • [Presentation] Line Width and Line Profile Measurement of Photoresist Using STEM Images2013

    • Author(s)
      Haruki Okito, Satoru Takahashi, Kiyoshi Takamasu
    • Organizer
      ASPEN2013, 5th International Conference of Asian Society for Precision Engineering and Nanotechnology, Taipei, Taiwan 2013年11月12日~15日
    • Place of Presentation
      Taipei, Taiwan
    • Related Report
      2013 Annual Research Report
  • [Presentation] Length Traceability using Optical Frequency Comb2013

    • Author(s)
      Dong Wei1, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Organizer
      ASPEN2013, 5th International Conference of Asian Society for Precision Engineering and Nanotechnology, Taipei, Taiwan 2013年11月12日~15日
    • Place of Presentation
      Taipei, Taiwan
    • Related Report
      2013 Annual Research Report
  • [Presentation] Coherent Imaging Algorithm of Super-Resolution Optical Inspection with Structured Light Shift2013

    • Author(s)
      Ryota Kudo, Hiroki Yokozeki, Satoru Takahashi, Kiyoshi Takamasu:
    • Organizer
      LEM21, The 7th International Conference on Leading Edge Manufacturing in 21st CenturyMiyagi, Japan,2013年11月7日~8日
    • Place of Presentation
      ホテル松島大観荘,宮城
    • Related Report
      2013 Annual Research Report
  • [Presentation] 多点法による誤差分離手法と不確かさ推定2013

    • Author(s)
      高増潔
    • Organizer
      第14回高エネ研メカ・ワークショップ報告集,つくば
    • Place of Presentation
      高エネルギー加速器研究機構,茨城
    • Related Report
      2013 Annual Research Report
    • Invited
  • [Presentation] 三次元測定の現状と課題2013

    • Author(s)
      高増潔
    • Organizer
      カールツァイス東京ショールームオープンハウス,東京
    • Place of Presentation
      ホテルメトロポリタンエドモンド,東京
    • Related Report
      2013 Annual Research Report
    • Invited
  • [Presentation] フォトレジスト形状の断面STEM 画像からエッジを決定する方法2013

    • Author(s)
      沖藤春樹,高橋哲,高増潔
    • Organizer
      第3回ユーザーズミーティング プログラム パーク・システムズ・ジャパン,東京
    • Place of Presentation
      ベルサール神田,東京
    • Related Report
      2013 Annual Research Report
    • Invited
  • [Presentation] Edge Determination Methodology for Cross-Section STEM Image of Photoresist Feature Used for Reference Metrology2013

    • Author(s)
      Kiyoshi Takamasu, Haruki Okitou, Satoru Takahashi, Mitsuru Konno, Osamu Inoue, Hiroki Kawada
    • Organizer
      SPIE Advanced Lithography 2013
    • Place of Presentation
      San Jose, USA
    • Related Report
      2012 Annual Research Report
    • Invited
  • [Presentation] 三次元測定の現状と課題2013

    • Author(s)
      高増潔
    • Organizer
      機械振興協会 テクノフォーラム 製造現場を支える三次元測定
    • Place of Presentation
      機械振興会館ホール,東京
    • Related Report
      2012 Annual Research Report
    • Invited
  • [Presentation] Nanometer Profile Measurement of Large Aspheric Optical Surface by Scanning Deflectometry with Rotation Devices - Development of Three Dimensional Measuring Facility and Experiment -2012

    • Author(s)
      Muzheng Xiao, Satomi Jujo, Satom Takahashi, Kiyoshi Takamasu
    • Organizer
      12th euspen International Conference
    • Place of Presentation
      Stockholm, Sweden
    • Related Report
      2012 Annual Research Report
  • [Presentation] Super-heterodyne Interferometer for Length-Measurement Using the Beat Signal of Laser Diodes and the Optical Frequency Comb2012

    • Author(s)
      X. N. Wang, S. Takahashi, K. Takamasu, H. Matsumoto
    • Organizer
      12th euspen International Conference
    • Place of Presentation
      Stockholm, Sweden
    • Related Report
      2012 Annual Research Report
  • [Presentation] Length measurement based on Pulse repetition interval of a femtosecond optical frequency comb2012

    • Author(s)
      Dong Wei, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Organizer
      12th euspen International Conference
    • Place of Presentation
      Stockholm, Sweden
    • Related Report
      2012 Annual Research Report
  • [Presentation] Nanometer Profile Measurement of Large Aspheric Optical Surface with Improved Deflectometry Method - Principle Introduction and Experimental Verification -2012

    • Author(s)
      Muzheng Xiao, Tomohiko Takamura, Satoru Takahashi, Kiyoshi Takamasu
    • Organizer
      XX IMEKO World Congress
    • Place of Presentation
      Busan, Korea
    • Related Report
      2012 Annual Research Report
  • [Presentation] Absolute Measurement of Base Lines up to 400 m Using Temporal Coherence Heterodyne Interferometer of Optical Frequency Comb2012

    • Author(s)
      H. Matsumoto, X. Wang, K. Takamasu
    • Organizer
      XX IMEKO World Congress
    • Place of Presentation
      Busan, Korea
    • Related Report
      2012 Annual Research Report
  • [Presentation] Round Robin Tests of Uncertainty Estimation for Coordinate Metrology by Software Error Propagation2012

    • Author(s)
      K. Takamasu, S. Takahashi, R. Furutani, M. Abbe
    • Organizer
      XX IMEKO World Congress
    • Place of Presentation
      Busan, Korea
    • Related Report
      2012 Annual Research Report
  • [Presentation] Step Gauge Measurement Using High-Frequency Repetitions of a Mode-Locked Fiber Laser2012

    • Author(s)
      C. Narin, S. Takahashi, K. Takamasu, H. Matsumoto
    • Organizer
      XX IMEKO World Congress
    • Place of Presentation
      Busan, Korea
    • Related Report
      2012 Annual Research Report
  • [Presentation] Design Value Use Type Super-Resolution Optical Inspection for Microfabricated Structure Defects by Using Standing Wave Illumination Shift2012

    • Author(s)
      R. Kudo, S. Takahashi, K. Takamasu
    • Organizer
      XX IMEKO World Congress
    • Place of Presentation
      Busan, Korea
    • Related Report
      2012 Annual Research Report
  • [Presentation] Comparison Experiment for Pulse Repetition Interval Based Length Measurement Linked to a Femtosecond Optical Frequency Comb2012

    • Author(s)
      Dong Wei, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Organizer
      XX IMEKO World Congress
    • Place of Presentation
      Busan, Korea
    • Related Report
      2012 Annual Research Report
  • [Presentation] STEMを用いた半導体線幅測定および線形状測定のサブナノメートル校正2012

    • Author(s)
      高増潔
    • Organizer
      応用物理学会 次世代リソグラフィワークショップ(NGL2012)
    • Place of Presentation
      東京工業大学,東京
    • Related Report
      2012 Annual Research Report
    • Invited
  • [Presentation] 知的精密計測のものづくりへの展開 ートレーサビリティとナノメートル標準ー2012

    • Author(s)
      高増潔
    • Organizer
      日本機械学会 革新的工作機械技術に関する研究分科会
    • Place of Presentation
      東京大学,東京
    • Related Report
      2012 Annual Research Report
    • Invited
  • [Presentation] 光周波数コムを用いた絶対距離計測2012

    • Author(s)
      高増潔
    • Organizer
      精密工学会 大規模環境の3次元計測と認識・モデル化技術専門委員会
    • Place of Presentation
      東京大学,東京
    • Related Report
      2012 Annual Research Report
    • Invited
  • [Presentation] Sub-nanometer calibration of line width measurement and line edge detection by using STEM and sectional SEM2012

    • Author(s)
      Kiyoshi Takamasu, Haruki Okitou, Satoru Takahashi, Mitsuru Konno, Osamu Inoue, Hiroki Kawada
    • Organizer
      SPIE Advanced Lithography 2012
    • Place of Presentation
      San Jose, USA
    • Related Report
      2011 Annual Research Report
    • Invited
  • [Presentation] Sub-nanometer line width and line profile measurement for CD-SEM calibration by using STEM2011

    • Author(s)
      Kiyoshi Takamasu, Haruki Okitou, Satoru Takahashi, Mitsuru Konno, Osamu Inoue, Hiroki Kawada
    • Organizer
      Proc.SPIE AL 2011
    • Place of Presentation
      San Jose, USA
    • Year and Date
      2011-02-28
    • Related Report
      2010 Annual Research Report
  • [Presentation] Nanometer Profile Measurement of Large Aspheric Optical Surface by Scanning Deflectometry with Rotatable Devices - Error Analysis and Experiments -2011

    • Author(s)
      Muzheng Xiao, Satomi Jujo, Kiyoshi Takamasu, Satoru Takahashi
    • Organizer
      11th euspen International Conference
    • Place of Presentation
      Como, Italy
    • Related Report
      2011 Annual Research Report
  • [Presentation] A motion errors and profile measurement system using three laser interferometers and one autocollimator for a high-precision micro-coordinate measuring machine2011

    • Author(s)
      P. Yang, T. Takamura, S. Takahashi, K. Takamasu, O. Sato, S. Osawa, T. Takatsuji
    • Organizer
      11th euspen International Conference
    • Place of Presentation
      Como, Italy
    • Related Report
      2011 Annual Research Report
  • [Presentation] Experimental evaluation of long path heterodyne interferometers with optical-frequency comb and continuous-wave laser2011

    • Author(s)
      Xiaonan Wang, Satoru Takahashi , Kiyoshi Takamasu, Hirokazu Matsumoto
    • Organizer
      10th International Symposium of Measurement Technology and Intelligent Instruments
    • Place of Presentation
      Daejeon, Korea
    • Related Report
      2011 Annual Research Report
  • [Presentation] Experimental analysis of influence of error on super-resolution optical inspection using standing wave illumination2011

    • Author(s)
      Ryota Kudo, Shin Usuki, Satoru Takahashi, Kiyoshi Takamasu
    • Organizer
      10th International Symposium of Measurement Technology and Intelligent Instruments
    • Place of Presentation
      Daejeon, Korea
    • Related Report
      2011 Annual Research Report
  • [Presentation] On-machine profile measurement by multiple sensors scanning method with two kinds of algorithms2011

    • Author(s)
      Guoqing Ding, Xin Chen, Satoru Takahashi, Kiyoshi Takamasu
    • Organizer
      10th International Symposium of Measurement Technology and Intelligent Instruments
    • Place of Presentation
      Daejeon, Korea
    • Related Report
      2011 Annual Research Report
  • [Presentation] Development of high precision Coordinate Measuring Machine - Uncertainty analysis of multi-probe method2011

    • Author(s)
      Tomohiko Takamura, Ping Yang, Satoru Takahashi, Kiyoshi Takamasu, Osamu Sato, Sonko Osawa, Toshiyuki Takatsuji
    • Organizer
      10th International Symposium of Measurement Technology and Intelligent Instruments
    • Place of Presentation
      Daejeon, Korea
    • Related Report
      2011 Annual Research Report
  • [Presentation] Self-calibration for two-dimensional stage using least squares solution2011

    • Author(s)
      Xin Chen, Guoqing Ding, Satoru Takahashi, Kiyoshi Takamasu
    • Organizer
      10th International Symposium of Measurement Technology and Intelligent Instruments
    • Place of Presentation
      Daejeon, Korea
    • Related Report
      2011 Annual Research Report
  • [Presentation] Nanometer Profile Measurement of Large Aspheric Optical Surface by Scanning Deflectometry with Rotatable Devices2011

    • Author(s)
      Muzheng Xiao, Satomi Jujo, Satoru Takahashi, Kiyoshi Takamasu
    • Organizer
      SPIE Optics+Photonics
    • Place of Presentation
      San Diego, USA
    • Related Report
      2011 Annual Research Report
  • [Presentation] Multi-probe system comprising three laser interferometers and one autocollimator for measuring flat bar mirror profile with nanometer accuracy on a high-precision micro-coordinate measuring machine2011

    • Author(s)
      Ping Yang, Tomohiko Takamura, Satoru Takahashi, Kiyoshi Takamasu, Osamu Sato, Sonko Osawa, Toshiyuki Takatsuji
    • Organizer
      SPIE Optics+Photonics
    • Place of Presentation
      San Diego, USA
    • Related Report
      2011 Annual Research Report
  • [Presentation] Absolute Distance Measurement Using Long-Path Heterodyne Interferometer with Optical Frequency Comb2011

    • Author(s)
      Xiaonan Wang, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Organizer
      FIO/LS Technical Digest, OSA
    • Place of Presentation
      San Jose, USA
    • Related Report
      2011 Annual Research Report
  • [Presentation] Interferometric Estimation of the Offset-Frequency of Optical Frequency Comb2011

    • Author(s)
      Hirokazu Matsumoto, Xiaonan Wang, Dong Wei, Satoshi Takahashi, Kiyoshi Takamasu
    • Organizer
      FIO/LS Technical Digest, OSA
    • Place of Presentation
      San Jose, USA
    • Related Report
      2011 Annual Research Report
  • [Presentation] Pulse repetition interval-based excess fraction method2011

    • Author(s)
      Dong WEI, Kiyoshi TAKAMASU, Hirokazu MATSUMOTO
    • Organizer
      FIO/LS Technical Digest, OSA
    • Place of Presentation
      San Jose, USA
    • Related Report
      2011 Annual Research Report
  • [Presentation] Remote internal diameter measurement of ring gauge based on a low-coherence tandem scheme2011

    • Author(s)
      D. Wei, N. Wu, K. Takamasu and H. Matsumoto
    • Organizer
      ASPEN201
    • Place of Presentation
      Hong Kong
    • Related Report
      2011 Annual Research Report
  • [Presentation] A Novel Exposure Method Based on Dissolved Oxygen Control for Nano-Stereolithography Using Evanescent Light2010

    • Author(s)
      Satoru Takahashi, Toshimune Nagano, Yusuke Kajihara, Kiyoshi Takamasu
    • Organizer
      Proc.ASPE2010
    • Place of Presentation
      Atlanta, USA
    • Year and Date
      2010-11-01
    • Related Report
      2010 Annual Research Report
  • [Presentation] A novel length measurement interferometer based on a femtosecond optical frequency comb introduced multi-pulse trains' interference2010

    • Author(s)
      Dong Wei, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Organizer
      Proc.EOS 2010
    • Place of Presentation
      Paris, France
    • Year and Date
      2010-10-26
    • Related Report
      2010 Annual Research Report
  • [Presentation] Super-Heterodyne Interferometric Length Measurement Using the Repetition Frequency of an Optical Frequencies Comb2010

    • Author(s)
      Hirokazu Matsumoto, Satoru Takahashi, Kiyoshi Takamasu
    • Organizer
      Proc.10th ISMQC
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2010-09-07
    • Related Report
      2010 Annual Research Report
  • [Presentation] A Three Laser Interferometers and One Autocollimator System for Measuring the Yaw and Straightness Errors of a X-Y Stage on High Precision CMM2010

    • Author(s)
      Ping Yang, Shusaku Shibata, Tomohiko Takamura, Satoru Takahashi, Kiyoshi Takamasu, Osamu Sato, Sonko Osawa, Toshiyuki Takatsuji
    • Organizer
      Proc.10th ISMQC
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2010-09-07
    • Related Report
      2010 Annual Research Report
  • [Presentation] Height Measurement of a Particle in Evanescent Field Controlling Penetration Depth2010

    • Author(s)
      Takayuki Kurihara, Ryuichi Sugimoto, Ryota Kudo, Satoru Takahashi, Kiyoshi Takamasu
    • Organizer
      Proc.10th ISMQC
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2010-09-07
    • Related Report
      2010 Annual Research Report
  • [Presentation] Uncertainty Estimation for Profile Measurement by Multi-Sensors Method2010

    • Author(s)
      Kiyoshi Takamasu
    • Organizer
      Proc.10th ISMQC
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2010-09-07
    • Related Report
      2010 Annual Research Report
  • [Presentation] Profile Measurement of Large Aspheric Optical Surface by Scanning Deflectometry with Rotatable Mirror-Enlarging Measuring Range of Autocollimator-2010

    • Author(s)
      Muzheng Xiao, Satomi Jujo, Satoru Takahashi, Kiyoshi Takamasu
    • Organizer
      Proc.10th ISMQC
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2010-09-06
    • Related Report
      2010 Annual Research Report
  • [Presentation] Resolution Characteristics of Super-Resolution Optical Inspection Using Standing Wave Illumination2010

    • Author(s)
      Ryota Kudo, Shin Usuki, Satoru Takahashi, Kiyoshi Takamasu
    • Organizer
      Proc.10th ISMQC
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2010-09-06
    • Related Report
      2010 Annual Research Report
  • [Presentation] Advanced Absolute Length Metrology Based On Pulse Trains' Constructive Interference-Towards Measurements of Meter Order with an Accuracy of Nano Order-2010

    • Author(s)
      Dong Wei, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Organizer
      Proc.10th ISMQC
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2010-09-06
    • Related Report
      2010 Annual Research Report
  • [Presentation] New Optical Distance Measurement Without a Prism Refractor Using an Optical Frequency Comb Laser2010

    • Author(s)
      Kazumasa Isaka, Satoru Takahashi, Kiyoshi Takamasu, Hirokazu Matsumoto
    • Organizer
      Proc.10th ISMQC
    • Place of Presentation
      Osaka, Japan
    • Year and Date
      2010-09-06
    • Related Report
      2010 Annual Research Report
  • [Presentation] Sub-nanometer Uncertainty Evaluation of Line Width Measurement by Si Lattice Structures of STEM Image2010

    • Author(s)
      K.Takamasu, K.Kuwabara, S.Takahashi, T.Mizuno, H.Kawada
    • Organizer
      Proc.of the euspen International Conference
    • Place of Presentation
      Delft, Netherlands
    • Year and Date
      2010-06-02
    • Related Report
      2010 Annual Research Report
  • [Presentation] Improvement of Gauge Block Measurement Without Wringing Using Tandem Low-coherence Interferometer2010

    • Author(s)
      W.Agustinus, A.Hirai, S.Takahashi, K.Takamasu, H.Matsumoto
    • Organizer
      Proc.of the euspen International Conference
    • Place of Presentation
      Delft, Netherlands
    • Year and Date
      2010-06-02
    • Related Report
      2010 Annual Research Report
  • [Presentation] 三次元測定機の課題

    • Author(s)
      高増潔
    • Organizer
      CMM技術交流会:TTDC
    • Place of Presentation
      豊田,愛知
    • Related Report
      2011 Annual Research Report
    • Invited
  • [Presentation] 不確かさ算出持ち回り測定:ソフトウェアの誤差伝播による不確かさ解析

    • Author(s)
      高増潔
    • Organizer
      CMM公開講座
    • Place of Presentation
      東京電機大学,東京
    • Related Report
      2011 Annual Research Report
    • Invited
  • [Presentation] GPS規格の概要 -高精度の形状・大きさ・寸法を実現するためのGPS規格-

    • Author(s)
      高増潔
    • Organizer
      2012年度精密工学会春季大会シンポジウム
    • Place of Presentation
      首都大学東京,東京
    • Related Report
      2011 Annual Research Report
    • Invited
  • [Book] ナノ・マイクロスケール機械工学2014

    • Author(s)
      石原直,加藤千幸,光石衛,渡邉聡編,高増潔,高橋哲他
    • Total Pages
      266
    • Publisher
      東京大学出版
    • Related Report
      2013 Annual Research Report
  • [Book] 震災後の工学は何をめざすのか2012

    • Author(s)
      東京大学大学院工学系研究科編
    • Total Pages
      361
    • Publisher
      内田老鶴圃
    • Related Report
      2012 Annual Research Report
  • [Remarks] Takamasu - Takahashi Lab

    • URL

      http://www.nanolab.t.u-tokyo.ac.jp

    • Related Report
      2013 Annual Research Report
  • [Remarks] Takamasu - Takahashi Lab

    • URL

      http://www.nanolab.t.u-tokyo.ac.jp

    • Related Report
      2012 Annual Research Report
  • [Remarks] Takamasu - Takahashi Lab

    • URL

      http://www.nanolab.t.u-tokyo.ac.jp

    • Related Report
      2011 Annual Research Report
  • [Remarks]

    • URL

      http://www.nanolab.t.u-tokyo.ac.jp

    • Related Report
      2010 Annual Research Report

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Published: 2010-08-22   Modified: 2019-07-29  

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