In-situ observation and analysis of nano contacts and junctions formation at high temperatures by a combined microscope of SEM and SPM
| Project/Area Number |
22656012
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Single-year Grants |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Japan Advanced Institute of Science and Technology |
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Principal Investigator |
TOMITORI Masahiko 北陸先端科学技術大学院大学, マテリアルサイエンス研究科, 教授 (10188790)
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| Project Period (FY) |
2010 – 2012
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| Project Status |
Completed (Fiscal Year 2012)
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| Budget Amount *help |
¥3,770,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥570,000)
Fiscal Year 2012: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2011: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2010: ¥1,300,000 (Direct Cost: ¥1,300,000)
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| Keywords | ナノコンタクト / 表面・界面物性 / 走査プローブ顕微鏡 / 走査電子顕微鏡 / 物性実験 |
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| Research Abstract |
The purpose of this study is to observe and analyze nano contacts and junctions, which are fabricated by bringing two small pieces of materials in proximity or in touch at high temperatures using scanning probe microscopy (SPM) techniques; the techniques can control the separation between them on a nano scale. We successfully demonstrated the approaching, contacting and welding between the two pieces, observed by an ultra-high resolution field-emission scanning electron microscope combined with a home-made pencil-type SPM.
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Report
(4 results)
Research Products
(22 results)
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[Journal Article] Akira Sasahara and Masahiko Tomitori2012
Author(s)
Yonkil Jeong, Masato Hirade, Ryohei Kokawa, Hirofumi Yamada, Kei Kobayashi, Noriaki Oyabu, Toyoko Arai
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Journal Title
Local interaction imaging by SiGe quantum dot probe, Current Appl
Volume: 12
Pages: 581-584
Related Report
Peer Reviewed
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