Ultrasonic testing by multi-probe atomic force microscopy
Project/Area Number |
22656013
|
Research Category |
Grant-in-Aid for Challenging Exploratory Research
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Allocation Type | Single-year Grants |
Research Field |
Thin film/Surface and interfacial physical properties
|
Research Institution | Kyoto University |
Principal Investigator |
KOBAYASHI Kei 京都大学, 産官学連携本部, 助教 (40335211)
|
Project Period (FY) |
2010 – 2011
|
Project Status |
Completed (Fiscal Year 2011)
|
Budget Amount *help |
¥3,330,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥330,000)
Fiscal Year 2011: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2010: ¥1,900,000 (Direct Cost: ¥1,900,000)
|
Keywords | 走査型プローブ顕微鏡 / 多探針 / 超音波 |
Research Abstract |
We demonstrated imaging of nanometer-scale subsurface features, Au nanoparticles buried in a polymer matrix. The particles were successfully visualized by scanning near-field ultrasound holography(SNFUH) and ultrasonic atomic force microscopy(UAFM), even if the depth of the particles from the surface was approximately 1 micrometer. It is suggested that the optimum cantilever depends on the elasticity of the polymer matrix. We also developed a dual-probe AFM system which can be operated in various environments for ultrasonic imaging of subsurface features.
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Report
(3 results)
Research Products
(11 results)