Development of 3DXRF instrument and application to forensic science
| Project/Area Number |
23350034
|
|---|
| Research Category |
Grant-in-Aid for Scientific Research (B)
|
| Allocation Type | Single-year Grants |
|---|
| Section | 一般 |
|---|
| Research Field |
Analytical chemistry
|
|---|
| Research Institution | Osaka City University |
|---|
Principal Investigator |
TSUJI Kouichi 大阪市立大学, 工学(系)研究科(研究院), 教授 (30241566)
|
|---|
| Project Period (FY) |
2011-04-01 – 2014-03-31
|
| Project Status |
Completed (Fiscal Year 2013)
|
| Budget Amount *help |
¥19,500,000 (Direct Cost: ¥15,000,000、Indirect Cost: ¥4,500,000)
Fiscal Year 2013: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
Fiscal Year 2012: ¥5,590,000 (Direct Cost: ¥4,300,000、Indirect Cost: ¥1,290,000)
Fiscal Year 2011: ¥11,180,000 (Direct Cost: ¥8,600,000、Indirect Cost: ¥2,580,000)
|
|---|
| Keywords | 放射線、Ｘ線、粒子線 / 解析・評価 / 可視化 / 鑑識科学 / 蛍光Ｘ線分析 / 非破壊分析 / 共焦点顕微鏡 / 深さ方向分析 / 放射線、X線、粒子線 / 蛍光X線分析 |
|---|
| Research Abstract |
We successfully developed a desk-top 3D-XRF instrument with a vacuum chamber. We also developed a set of standard thin layers for evaluating the spatial resolution. It was about 11 micro meters at Au L line, which is a top level in the world. One of the advantages of this instrument is a non-destructive elemental imaging of inside of the solid sample. We applied this technique for some layered materials of forensic field, such as car paint chip. It was demonstrated that depth profiling and depth imaging were possible for forensic samples.
|
Report
(4 results)
Research Products
(118 results)
