• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

The high sensitivity tilt measurement using the optical distribution at the vicinity of critical angle

Research Project

Project/Area Number 23560256
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeMulti-year Fund
Section一般
Research Field Dynamics/Control
Research InstitutionUniversity of Toyama

Principal Investigator

TASHIRO Hatsuzo  富山大学, 大学院理工学研究部(工学), 准教授 (80179689)

Project Period (FY) 2011 – 2013
Project Status Completed (Fiscal Year 2013)
Budget Amount *help
¥5,330,000 (Direct Cost: ¥4,100,000、Indirect Cost: ¥1,230,000)
Fiscal Year 2013: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2012: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2011: ¥3,510,000 (Direct Cost: ¥2,700,000、Indirect Cost: ¥810,000)
Keywords微小角度変位計測 / 光計測 / 臨界角 / ナノラジアン / 角度センサ / 計測工学 / 微小角度変位 / 画像処理
Research Abstract

When a light is emitted into the air through a prism, the intensity of transmitted light and reflected light slightly changes according to the angle of incidence. The purpose of this study, therefore, is to measure the minute changes of the angle using the intensity of these lights as well as the intensity of the distribution.
In the process of our study, we considered the difference between the actual light and the reflected light as transmitted light. We also used natural light instead of laser beams in order to avoid unnecessary noise such as interference fringes, which could be produced by laser beams. Meanwhile, we developed a measurement device not by using intensity distribution, but by using intensity, based on the principle mentioned above.
As a result, we succeeded in measuring such minute changes of the angle as 50 nanoradians.

Report

(4 results)
  • 2013 Annual Research Report   Final Research Report ( PDF )
  • 2012 Research-status Report
  • 2011 Research-status Report
  • Research Products

    (10 results)

All 2014 2012 2011 Other

All Presentation (8 results) Patent(Industrial Property Rights) (2 results) (of which Overseas: 1 results)

  • [Presentation] 臨界角での光強度を用いた微小角変位の測定2014

    • Author(s)
      田代発造、三原毅、柴田幹、松本宗宏
    • Organizer
      2013年度精密工学会春季大会
    • Place of Presentation
      東京大学
    • Year and Date
      2014-03-19
    • Related Report
      2013 Final Research Report
  • [Presentation] 臨界角での光強度を用いた微小角変位の測定2014

    • Author(s)
      田代発造,三原毅,柴田幹,松本宗宏
    • Organizer
      2014年度精密工学会春季大会
    • Place of Presentation
      東京大学
    • Related Report
      2013 Annual Research Report
  • [Presentation] 臨界角における光強度分布を用いた傾きの測定2012

    • Author(s)
      田代発造、江本寛之、三原毅
    • Organizer
      2012年度精密工学会秋季大会
    • Place of Presentation
      九州工業大学
    • Year and Date
      2012-09-16
    • Related Report
      2013 Final Research Report
  • [Presentation] 臨界角付近を使った微小角変位測定装置の精度向上に関する研究2012

    • Author(s)
      江本寛之、田代発造、三原毅
    • Organizer
      平成24年度電気関係学会北陸支部連合大会
    • Place of Presentation
      富山県立大学
    • Year and Date
      2012-09-01
    • Related Report
      2013 Final Research Report
  • [Presentation] 臨界角付近を使った微小角変位測定装置の精度向上に関する研究2011

    • Author(s)
      江本寛之、田代発造、三原毅、吉田洋樹
    • Organizer
      平成23年度電気関係学会北陸支部連合大会
    • Place of Presentation
      福井大学
    • Year and Date
      2011-09-17
    • Related Report
      2013 Final Research Report
  • [Presentation] 臨界角付近を使った微小角変位測定装置の精度向上に関する研究

    • Author(s)
      江本寛之,田代発造,三原毅
    • Organizer
      平成24年度電気関係学会北陸支部連合大会
    • Place of Presentation
      富山県立大学
    • Related Report
      2012 Research-status Report
  • [Presentation] 臨界角における光強度分布を用いた傾きの測定

    • Author(s)
      田代発造,江本寛之,三原毅
    • Organizer
      2012年度精密工学会秋季大会
    • Place of Presentation
      九州工業大学
    • Related Report
      2012 Research-status Report
  • [Presentation] 臨界角付近を使った微小角変位測定装置の精度向上に関する研究

    • Author(s)
      江本寛之 田代発造 三原毅 吉田洋樹
    • Organizer
      平成23年度電気関係学会北陸支部連合大会
    • Place of Presentation
      福井大学(福井県)
    • Related Report
      2011 Research-status Report
  • [Patent(Industrial Property Rights)] 微小角変位測定方法と装置2012

    • Inventor(s)
      田代発造
    • Industrial Property Rights Holder
      国立大学法人富山大学
    • Industrial Property Rights Type
      特許
    • Filing Date
      2012-02-10
    • Related Report
      2013 Final Research Report
    • Overseas
  • [Patent(Industrial Property Rights)] 微小角変位測定方法と装置2012

    • Inventor(s)
      田代 発造
    • Industrial Property Rights Holder
      国立大学法人富山大学
    • Industrial Property Number
      2012-026902
    • Filing Date
      2012
    • Related Report
      2011 Research-status Report

URL: 

Published: 2011-08-05   Modified: 2019-07-29  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi