|Budget Amount *help
¥44,980,000 (Direct Cost: ¥34,600,000、Indirect Cost: ¥10,380,000)
Fiscal Year 2015: ¥8,320,000 (Direct Cost: ¥6,400,000、Indirect Cost: ¥1,920,000)
Fiscal Year 2014: ¥8,580,000 (Direct Cost: ¥6,600,000、Indirect Cost: ¥1,980,000)
Fiscal Year 2013: ¥12,090,000 (Direct Cost: ¥9,300,000、Indirect Cost: ¥2,790,000)
Fiscal Year 2012: ¥15,990,000 (Direct Cost: ¥12,300,000、Indirect Cost: ¥3,690,000)
|Outline of Final Research Achievements
We extended the performance of scanning probe microscopy (SPM) techniques developed with our bases, such as the combined instrument of SPM and scanning electron microscopy(SEM), and bias non-contact atomic force microscopy (nc-AFM). We carried out the followings: fabrication of SPM probes of WOx nanorods on W tips by bringing the tips closer to the source of WO3 powers supported on a W filament heated by use of the SEM-SPM setup; development of retuned two-prong quartz tuning forks for a high sensitivity force sensor; measurements of energy dissipation through the interaction between a tip and a sample; nanoscale electric measurements such as electric capacitance, contact potential difference, and charge transfer using a charge sensitive amplifier installed in the nc-AFM setup. We contributed to a scientific and technological field of surfaces and interfaces on atomic scale by applying them to π-conjugated molecules, and to the films and surfaces of oxides.