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INTEGRATION OF FERROMAGNETIC SINGLE-ELECTRON TRANSISTORS USING ELECTROMIGRATION METHODS

Research Project

Project/Area Number 24360117
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypePartial Multi-year Fund
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionTokyo University of Agriculture and Technology

Principal Investigator

SHIRAKASHI JUN-ICHI  東京農工大学, 工学(系)研究科(研究院), 准教授 (00315657)

Project Period (FY) 2012-04-01 – 2015-03-31
Project Status Completed (Fiscal Year 2014)
Budget Amount *help
¥18,850,000 (Direct Cost: ¥14,500,000、Indirect Cost: ¥4,350,000)
Fiscal Year 2014: ¥5,200,000 (Direct Cost: ¥4,000,000、Indirect Cost: ¥1,200,000)
Fiscal Year 2013: ¥5,460,000 (Direct Cost: ¥4,200,000、Indirect Cost: ¥1,260,000)
Fiscal Year 2012: ¥8,190,000 (Direct Cost: ¥6,300,000、Indirect Cost: ¥1,890,000)
Keywords少数電子素子 / スピンエレクトロニクス / エレクトロマイグレーション / マイクロ・ナノデバイス / ナノギャップ / ナノ材料 / 単電子トランジスタ / 磁性
Outline of Final Research Achievements

We present a simple technique for simultaneous control of the electrical properties of multiple Ni nanogaps. This technique is based on electromigration induced by a field emission current and is called "activation". Simultaneous tuning of the tunnel resistance of multiple nanogaps was achieved by passing a Fowler-Nordheim (F-N) field emission current through an initial group of Ni nanogaps connected in series. Furthermore, Ni-based single-electron transistors (SETs) operating at room temperature were successfully fabricated and integrated using activation method. These results clearly imply that electromigration procedure allows us to easily and simply integrate Ni-based SETs.

Report

(4 results)
  • 2014 Annual Research Report   Final Research Report ( PDF )
  • 2013 Annual Research Report
  • 2012 Annual Research Report
  • Research Products

    (25 results)

All 2015 2014 2013 2012 Other

All Journal Article (11 results) (of which Peer Reviewed: 11 results,  Acknowledgement Compliant: 2 results) Presentation (10 results) (of which Invited: 2 results) Book (1 results) Remarks (3 results)

  • [Journal Article] Ultrafast Feedback-Controlled Electromigration Using a Field-Programmable Gate Array2015

    • Author(s)
      Y. Kanamaru, M. Ando and J. Shirakashi
    • Journal Title

      J. Vac. Sci. Technol. B

      Volume: 33 Issue: 2

    • DOI

      10.1116/1.4903929

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed
  • [Journal Article] A Fully Customized Hardware System for Ultra-Fast Feedback-Controlled Electromigration Using FPGA2014

    • Author(s)
      Y. Kanamaru, M. Ando, R. Suda and J. Shirakashi
    • Journal Title

      2014 IEEE 14th International Conference on Nanotechnology (IEEE-NANO)

      Volume: 14778995 Pages: 719-722

    • DOI

      10.1109/nano.2014.6968058

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Resistive Switching Effects in Electromigrated Ni Nanogaps2014

    • Author(s)
      K. Takikawa, R. Suda, M. Ito, T. Toyonaka and J. Shirakashi
    • Journal Title

      2014 IEEE 14th International Conference on Nanotechnology (IEEE-NANO)

      Volume: 14778966 Pages: 715-718

    • DOI

      10.1109/nano.2014.6968014

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Low-temperature deposition of thin Si, Ge, and SiGe films using reducing activity of ballistic hot electrons2014

    • Author(s)
      N. Koshida, R. Suda, M. Yagi, A. Kojima, R. Mentek, B. Gelloz, N. Mori, and J. Shirakashi
    • Journal Title

      ECS Trans.

      Volume: 64 Issue: 6 Pages: 405-410

    • DOI

      10.1149/06406.0405ecst

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] Ballistic hot electron effects in nanosilicon dots and their photonic applications (Invited)2014

    • Author(s)
      N. Koshida, N. Ikegami, A. Kojima, R. Mentek, R. Suda, M. Yagi, J. Shirakashi, B. Gelloz, and N. Mori
    • Journal Title

      ECS Trans.

      Volume: 61 Issue: 5 Pages: 47-54

    • DOI

      10.1149/06105.0047ecst

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] Electrical Properties of Nanogap-Based Single-Electron Transistors Fabricated by Field-Emission-Induced Electromigration2014

    • Author(s)
      R. Suda, S. Akimoto, K. Morihara and J. Shirakashi
    • Journal Title

      Proc. 13th IEEE Int. Conf. on Nanotechnology (IEEE-NANO)

      Volume: 13 Pages: 87-90

    • DOI

      10.1109/nano.2013.6720862

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Tuning of Resistance of Nanogaps Using Field-Emission-Induced Electromigration with Feedback Control Scheme2013

    • Author(s)
      M. Ando, S. Akimoto, R. Suda and J. Shirakashi
    • Journal Title

      Conference Proceedings, 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO)

      Volume: Year 2013 Pages: 1141-1144

    • DOI

      10.1109/nano.2013.6721060

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] In-Situ Observation of Temperature Distribution of Microheaters Using Near-Infrared Charge Coupled Device Imaging System2013

    • Author(s)
      T. Saito, W. Lin and J. Shirakashi
    • Journal Title

      Nanosci. Nanotechnol. Lett.

      Volume: 5 Issue: 10 Pages: 1076-1080

    • DOI

      10.1166/nnl.2013.1671

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Formation Scheme of Quantum Point Contacts Based on Nanogaps Using Field-Emission-Induced Electromigration2013

    • Author(s)
      R. Suda, M. Yagi, T. Watanabe and J. Shirakashi
    • Journal Title

      J. Nanosci. Nanotechnol.

      Volume: 13 Issue: 2 Pages: 883-887

    • DOI

      10.1166/jnn.2013.6072

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Control Parameters for Fabrication of Single-Electron Transistors Using Field-Emission-Induced Electromigration2013

    • Author(s)
      S. Akimoto, M. Ito, S. Ueno and J. Shirakashi
    • Journal Title

      J. Nanosci. Nanotechnol.

      Volume: 13 Issue: 2 Pages: 993-996

    • DOI

      10.1166/jnn.2013.6073

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Nanoscale Scratching of Platinum Thin Films Using Atomic Force Microscopy with DLC Tips2012

    • Author(s)
      X. Jiang, G Wu, Z. Du, K. J. Ma, J. Shirakashi and A. A. Tseng
    • Journal Title

      J. Vac. Sci. Technol.

      Volume: 30 Issue: 2

    • DOI

      10.1116/1.3694242

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Presentation] Structural Tuning of Nanogaps Using Field-Emission-Induced Electromigration with Bipolar Biasing2014

    • Author(s)
      M. Yagi, M. Ito and J. Shirakashi
    • Organizer
      4th International Conference on Manipulation, Manu-facturing and Measurement on the Nanoscale (3M-NANO 2014)
    • Place of Presentation
      Taipei, Taiwan.
    • Year and Date
      2014-10-27 – 2014-10-31
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] Simultaneous Fabrication of Nanogaps Using Field-Emission-Induced Electromigration2014

    • Author(s)
      M. Ito, M. Yagi, K. Morihara and J. Shirakashi
    • Organizer
      4th International Conference on Manipulation, Manu-facturing and Measurement on the Nanoscale (3M-NANO 2014)
    • Place of Presentation
      Taipei, Taiwan.
    • Year and Date
      2014-10-27 – 2014-10-31
    • Related Report
      2014 Annual Research Report
  • [Presentation] A Fully Customized Hardware System for Ultra-Fast Feedback-Controlled Electromigration Using FPGA2014

    • Author(s)
      Y. Kanamaru, M. Ando, R. Suda and J. Shirakashi
    • Organizer
      IEEE NANO 2014 (2014 IEEE International Conference on Nanotechnology)
    • Place of Presentation
      Toronto, ON, Canada.
    • Year and Date
      2014-08-18 – 2014-08-21
    • Related Report
      2014 Annual Research Report
  • [Presentation] Resistive Switching Effects in Electromigrated Ni Nanogaps2014

    • Author(s)
      K. Takikawa, R. Suda, M. Ito, T. Toyonaka and J. Shirakashi
    • Organizer
      IEEE NANO 2014 (2014 IEEE International Conference on Nanotechnology)
    • Place of Presentation
      Toronto, ON, Canada.
    • Year and Date
      2014-08-18 – 2014-08-21
    • Related Report
      2014 Annual Research Report
  • [Presentation] Nanoscale Mechanical Scratching of Graphene Using Scanning Probe Microscopy2013

    • Author(s)
      R. Suda, T. Saito, A. A. Tseng and J. Shirakashi
    • Organizer
      5th IEEE International Nanoelectronics Conference (INEC 2013)
    • Place of Presentation
      Sentosa Island, Singapore
    • Year and Date
      2013-01-03
    • Related Report
      2012 Annual Research Report
  • [Presentation] Electrical Properties of Nanogap-Based Single-Electron Transistors Fabricated by Field-Emission-Induced Electromigration2013

    • Author(s)
      R. Suda, S. Akimoto, K. Morihara and J. Shirakashi
    • Organizer
      IEEE NANO 2013 (2013 IEEE International Conference on Nanotechnology)
    • Place of Presentation
      Beijing, China
    • Related Report
      2013 Annual Research Report
  • [Presentation] Tuning of Resistance of Nanogaps Using Field-Emission-Induced Electromigration with Feedback Control Scheme2013

    • Author(s)
      M. Ando, S. Akimoto, R. Suda and J. Shirakashi
    • Organizer
      IEEE NANO 2013 (2013 IEEE International Conference on Nanotechnology)
    • Place of Presentation
      Beijing, China
    • Related Report
      2013 Annual Research Report
  • [Presentation] Electromigration-Based Fabrication Methods for Single-Electron Transistors2013

    • Author(s)
      J. Shirakashi
    • Organizer
      CMOS Emerging Technologies Research, 2013 Symposium
    • Place of Presentation
      Whistler, BC, Canada
    • Related Report
      2013 Annual Research Report
    • Invited
  • [Presentation] In-Situ Control of Quantum Point Contacts Using Scanning Probe Microscopy Scratch Lithography2012

    • Author(s)
      R. Suda, T. Ohyama, A. A. Tseng and J. Shirakashi
    • Organizer
      IEEE NANO 2012 (12th International Conference on Nanotechnology)
    • Place of Presentation
      Birmingham, UK.(招待講演)
    • Year and Date
      2012-08-23
    • Related Report
      2012 Annual Research Report
  • [Presentation] Investigation of Nanogap Formation Process Using Field-Emission-Induced Electromigration with Alternating Current Bias2012

    • Author(s)
      M. Yagi, S. Akimoto, M. Ito and J. Shirakashi
    • Organizer
      2012 International Conference on Nanoscience +Technology (ICN+T 2012)
    • Place of Presentation
      Paris, France.
    • Year and Date
      2012-07-25
    • Related Report
      2012 Annual Research Report
  • [Book] Nanoelectronic Device Applications Handbook, "Chapter 13: Simultaneously Controlled Tuning of Tunneling Properties of Integrated Nanogaps Using Field-Emission-Induced Electromigration"2013

    • Author(s)
      M. Ito, S. Akimoto, R. Suda and J. Shirakashi
    • Publisher
      CRC Press, Taylor and Francis Group, LLC
    • Related Report
      2013 Annual Research Report
  • [Remarks] 白樫研究室ホームページ

    • URL

      http://www.tuat.ac.jp/~nanotech/index.htm

    • Related Report
      2014 Annual Research Report
  • [Remarks] 白樫研究室ホームページ

    • URL

      http://www.tuat.ac.jp/~nanotech/index.htm

    • Related Report
      2013 Annual Research Report
  • [Remarks]

    • URL

      http://www.tuat.ac.jp/~nanotech/index.htm

    • Related Report
      2012 Annual Research Report

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Published: 2012-04-24   Modified: 2019-07-29  

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