| Budget Amount *help |
¥18,980,000 (Direct Cost: ¥14,600,000、Indirect Cost: ¥4,380,000)
Fiscal Year 2015: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
Fiscal Year 2014: ¥3,510,000 (Direct Cost: ¥2,700,000、Indirect Cost: ¥810,000)
Fiscal Year 2013: ¥7,150,000 (Direct Cost: ¥5,500,000、Indirect Cost: ¥1,650,000)
Fiscal Year 2012: ¥5,980,000 (Direct Cost: ¥4,600,000、Indirect Cost: ¥1,380,000)
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| Outline of Final Research Achievements |
In the present study, site selective XAFS measurement method using X-ray excited optical luminescence has been developed and applied to measure XAFS spectra of defect and/or emission site structures in solid materials. In addition, a sophisticated combination of XAFS and EELS, particularly introducing modern mathematical treatments to the EELS and EFTEM spectrum imaging (EFTEM-SI) allowed us quantitative analysis and visualization of the different chemical states in a solid catalyst. We applied this method to the study on the generation mechanism of the visible light response in nitrogen doped TiO2 catalysts.
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