Dynamic Supply Current Test Method with Built-in IDDT Appearance Time Sensor

• Project/Area Number: 24650021
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Single-year Grants
• Research Field: Computer system/Network
• Research Institution: The University of Tokushima
• Principal Investigator: HASHIZUME Masaki 徳島大学, ソシオテクノサイエンス研究部, 教授 (40164777)
• Project Period (FY): 2012-04-01 – 2014-03-31
• Project Status: Completed (Fiscal Year 2013)
• Budget Amount: ¥2,860,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥660,000); Fiscal Year 2013: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000); Fiscal Year 2012: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
• Keywords: 断線 / 電流テスト / IC / IDDTテスト / 電流センサ回路 / 遅延故障 / CMOS / 動的電源電流 / 動的電源電圧変動 / 短絡 / CMOS IC

Research Abstract

A built-in test circuit is proposed to detect an open defect in a CMOS IC by means of appearance time of dynamic supply current of the IC. Also, a test method based on the dynamic supply current with on the test circuit is proposed. A layout of an IC embedding the test circuit has been designed and an IC has been prototyped. It is shown by Spice simulation and some experiments that an open defect in the IC can be detected by the test method.

Research Products

• [Journal Article] A Built-in Test Circuit for Detecting Open Defects by IDDT Appearance Time in CMOS ICs (2014)
  • Author(s): Masaki Hashizume, Shohei Suenaga and Hiroyuki Yotsuyanagi
  • Journal Title: Proc. of International Conference on Design & Concurrent Engineering 2014 Volume: (to appear)
  • Peer Reviewed
• [Journal Article] Built-in IDDT Appearance Time Sensor for Detecting Open Faults in 3D IC (2013)
  • Author(s): Shohei Suenaga, Masaki Hashizume, Hiroyuki Yotsuyanagi, Tetsuo Tada and Shyue-Kung Lu
  • Journal Title: Proc. of IEEE CPMT Symposium Japan(ICSJ2013) Pages: 247-250
  • Peer Reviewed
• [Journal Article] A Built-in Sensor for IDDT Testing of CMOS ICs (2012)
  • Author(s): Shohei Suenaga, Hiroyuki Yotsuyanagi and Masaki Hashizume
  • Journal Title: Proc. of 2012 International Technical Conference on Circuits/Systems, Computers and Communications
  • Peer Reviewed
• [Journal Article] A Built-in Sensor for IDDT Testing of CMOS ICs (2012)
  • Author(s): Shohei Suenaga, et al.
  • Journal Title: Proc. of 2012 International Technical Conference on Circuits/Systems, Computers and Communications Volume: E
  • Peer Reviewed
• [Presentation] 組込み型IDDT出現時間検出回路の実験による評価用設計 (2013)
  • Author(s): 末永翔平, 四柳浩之, 橋爪正樹
  • Organizer: 電気関係学会四国支部連合大会講演論文集
  • Place of Presentation: 徳島大学, 徳島県
  • Year and Date: 2013-09-21
• [Presentation] 組込み型IDDT出現時間検出回路の実験による評価用設計 (2013)
  • Author(s): 末永 翔平, 四柳 浩之, 橋爪 正樹
  • Organizer: 電気関係学会四国支部連合大会
  • Place of Presentation: 徳島大学（徳島大学）
• [Presentation] 組込み型IDDT出現時間検出回路による断線故障の検出のための必要条件 (2012)
  • Author(s): 末永翔平, 四柳浩之, 橋爪正樹
  • Organizer: 電気関係学会四国支部連合大会講演論文集
  • Place of Presentation: 四国電力株式会社総合研修所, 香川県
  • Year and Date: 2012-09-29
• [Presentation] 組込み型IDDT出現時間検出回路による断線故障の検出のための必要条件
  • Author(s): 末永 翔平他
  • Organizer: 電気関係学会四国支部連合大会
  • Place of Presentation: 四国電力総合研修所（香川県）