| Budget Amount *help |
¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2016: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2015: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000)
Fiscal Year 2014: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2013: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
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| Outline of Final Research Achievements |
We have developed a phase retrieval algorithm for Reflection High-Energy Electron Diffraction (RHEED), which enables in-situ observation of surface morphology during growth such as molecular beam epitaxial growth. We have adopted the oversampling method used for X-ray diffraction and modified it for solving some difficulties peculiar to RHEED. The resultant algorithm makes it possible to recover surface morphology within 0.1s from RHEED intensity distributions and provide morphological information of growth islands such as the size, the shape and the distribution of islands on the surface.
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