Real-time observation of carrier dynamics at oxide semiconductor and metal interfaces
Project/Area Number |
25870193
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Research Category |
Grant-in-Aid for Young Scientists (B)
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Allocation Type | Multi-year Fund |
Research Field |
Quantum beam science
Thin film/Surface and interfacial physical properties
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Research Institution | The University of Tokyo |
Principal Investigator |
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Project Period (FY) |
2013-04-01 – 2016-03-31
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Project Status |
Completed (Fiscal Year 2015)
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Budget Amount *help |
¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2015: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2014: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2013: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
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Keywords | 時間分解 / 光電子分光 / 放射光 / キャリアダイナミクス / 酸化物半導体 / 光触媒 / 時間分解光電子分光 |
Outline of Final Research Achievements |
This study aimed to investigate site-specific carrier dynamics at oxide semiconductor and metal interfaces using time-resolved soft X-ray photoelectron spectroscopy. The relaxation time of photo-excited carriers at oxide surfaces were obtained by monitoring in real time the peak shift of core-level spectra due to a surface photovoltage effect. The relaxation time of photo-excited carriers on the clean ZnO(0001) surface was about a few 10s ns, and decreased largely to below 1 ns on the Pt-deposited ZnO(0001) surface. The origin of shorter lifetime of photo-excited carriers could be the increase of the carrier recombination centers on the oxide surface by Pt deposition.
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Report
(4 results)
Research Products
(20 results)
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[Journal Article] Electron-hole recombination on ZnO(0001) single-crystal surface studied by time-resolved soft X-ray photoelectron spectroscopy2014
Author(s)
R. Yukawa, S. Yamamoto, K. Ozawa, M. Emori, M. Ogawa, Sh. Yamamoto, K. Fujikawa, R. Hobara, S. Kitagawa, H. Daimon, H. Sakama, I. Matsuda,
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Journal Title
Applied Physics Letters
Volume: 105
Issue: 15
Pages: 151602-151602
DOI
Related Report
Peer Reviewed / Open Access / Acknowledgement Compliant
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[Presentation] Carrier dynamics on oxide surfaces studied by time-resolved soft x-ray photoelectron spectroscopy2014
Author(s)
S. Yamamoto, R. Yukawa, M. Emori, K. Ozawa, M. Ogawa, K. Fujikawa, Sh. Yamamoto, R. Hobara, S. Kitagawa, H. Daimon, I. Matsuda,
Organizer
The 7th International Symposium on Surface Science (ISSS-7)
Place of Presentation
くにびきメッセ(島根県松江市)
Year and Date
2014-11-04
Related Report
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[Presentation] Relaxation processes of photo-excited carriers on the atomically-controlled semiconductor surfaces studied by time-resolved soft x-ray photoelectron spectroscopy2014
Author(s)
S. Yamamoto, M. Ogawa, K. Fujikawa, R. Hobara, R. Yukawa, Sh. Yamamoto, S. Kitagawa, D. Pierucci, M.G. Silly, C.-H. Lin, R.-Y. Liu, H. Daimon, F. Sirotti, S.-J. Tang, I. Matsuda,
Organizer
30th European Conference on Surface Science (ECOSS-30)
Place of Presentation
Antalya (Turkey)
Year and Date
2014-09-02
Related Report
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[Presentation] Carrier dynamics on oxide surfaces studied by time-resolved soft x-ray photoelectron spectroscopy2013
Author(s)
S. Yamamoto, R. Yukawa, M. Emori, K. Ozawa, M. Ogawa, K. Fujikawa, Sh. Yamamoto, R. Hobara, I. Matsuda
Organizer
American Vacuum Society 60th International Symposium
Place of Presentation
Long Beach, California, US
Related Report
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