Design of dependable Analog Mixed signal LSI with intermittent operatable BIST system
| Project/Area Number |
26330070
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Computer system
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| Research Institution | Kochi University of Technology |
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Principal Investigator |
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| Project Period (FY) |
2014-04-01 – 2017-03-31
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| Project Status |
Completed (Fiscal Year 2016)
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| Budget Amount *help |
¥4,680,000 (Direct Cost: ¥3,600,000、Indirect Cost: ¥1,080,000)
Fiscal Year 2016: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2015: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2014: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
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| Keywords | Analog-Mixed Signal / Built-In Self Test / Chaotic Oscillator / Impulse Response / パラメータ故障 / カタストロフィック故障 / デペンダブルコンピューティング / デパンダブルコンピューティング / ディペンダブルコンピューティング |
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| Outline of Final Research Achievements |
We propose fault-based BIST(Built-In Self Test) schemes for Analog part of AMS (Analog Mixed-Signal) system LSI. The BIST systems can be used throughout life time of LSIs, from fabrication process to the system's operation. Motif circuits of analog system to design BIST systems are Voltage/Current reference generator and delta-sigma modulator.
The BIST systems are based on transient response of circuits and fault coverage of Catastrophic faults, such like open/short fault of circuit elements, are about 85% to 96% with reasonable area overhead. We also find the BIST systems based on Chaotic oscillation can cover Parametric
faults.
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Report
(4 results)
Research Products
(7 results)
