| Budget Amount *help |
¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Fiscal Year 2016: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2015: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
Fiscal Year 2014: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
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| Outline of Final Research Achievements |
An X-ray area detector is needed for an X-ray stress measurement of coarse-grained materials, because the X-ray diffraction pattern of coarse grains becomes spotted. In this study, I proposed the “direct-method” using the area detector and the normal incident X-ray to determine the optimum values of stresses. The direct-method uses the simplex method which is a kind of linear programing. The error of the diffraction angles for spotted pattern is caused by the difference between the center of the irradiated area and the center of the grains. As the measure against the problems of the coarse-grained materials, the π-method and the double exposure method were examined. In addition, it is clarified that the divergence of the X-ray beam causes the error of the diffraction angle.
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